Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

Cuillermo H. Kaufmann is professor of Applied Optics at the National University of Rosario, Argentina, and chief scientist at the Physics Institute of Rosario which is linked both to the university and to the National Council of Scientific and Technological Research. He is also the director of the French-Argentine International Centre for Information and Systems Sciences. He has worked as a visiting researcher at various universities abroad, among them the National Physical Laboratory, UK, the University of Michigan and Loughborough University. Professor Kaufmann has co-authored more than 170 papers published in international journals and conference proceedings and several book chapters. He is a fellow member of both SPiE and the Optical Society of America. In 2003 the Secretary of Science and Technology of Argentina awarded him the Bernardo Houssay Prize for his contributions to the field of optical engineering.

Preface	p. XIII
List of Contributors	p. XVII
Radial Speckle Interferometry and Applications	p. 1
Introduction	p. 1
Out-of-Plane Radial Measurement	p. 2
Radial Deformation Measurement of Short Internal Cylinders	p. 3
Radial Deformation Measurement of Long Internal Cylinders	p. 7
Radial Deformation Measurement of External Cylinders	p. 11
In-Plane Measurement	p. 13
Configuration Using Conical Mirrors	p. 17
Configuration Using a Diffractive Optical Element	p. 19
Applications	p. 24
Translation and Mechanical Stress Measurements	p. 24
Residual Stress Measurement	p. 27
Conclusions	p. 33
	p. 34
Depth-Resolved Displacement Field Measurement	p. 37
Introduction	p. 37
Low-Coherence Electronic Spedde Pattern Interferometry	p. 39
Wavelength Scanning Interferometry	p. 43
WSI with a Single Scattering Surface	p. 44
Fourier Transform for Measurement of Optical Path Length	p. 46
Fourier Transform for Calculation of Interference Phase	p. 47
Range and Resolution of Optical Path Difference Measurement	p. 48
Determination of Scattering Point Location	p. 49
Gauge Volume and Displacement Sensitivity	p. 52
WSI with Volume Scatterers	p. 54
Proof-of-Prindple Experiments: Two Scattering Layers	p. 57
Comparison of WSI with LCSI	p. 59
Spectral Optical Coherence Tomography	p. 60
Phase Contrast SOCT for 2D Out-of-Plane Displacement Field Measurement	p. 61
PC-SOCT for 2D In-Plane and Out-of-Plane Displacement Field Measurement	p. 66
Hyperspectral Interferometry for 3D Surface Pronlometry	p. 69
Tilt Scanning Interferometry	p. 71
Depth-Dependent Phase Shift Introduced hy a Tilting Wavefront	p. 72
Extraction of the Scattered Amplitude Distribution	p. 75
Depth-Resolved Displacements	p. 77
Gauge Volume, Depth Range, and Displacement Sensitivity	p. 79
Experimental Implementation	p. 80
Depth-Resolved Techniques Viewed as Linear Filtering Operations	p. 83
Methods Viewed as Linear Filtering Operations	p. 84
Relationship Between W(K) and Spatial Resolution	p. 85
Relationship Between W(K) and Displacement Sensitivity	p. 86
Ewald Sphere for a Wavelength Scanning Interferometer	p. 87
Ewald Sphere for a Tilt Scanning Interferometer	p. 89
Comparison of Spatial Resolution for WSI and TSI	p. 89
Phase Unwrapping in Three Dimensions	p. 91
Phase Singularities in Two-Dimensional Phase Data	p. 91
Phase Singularity Loops in Three-Dimensional Phase Data	p. 93
3D Phase Unwrapping Algorithm	p. 95
Remaining Ambiguities	p. 96
Example: Dynamic Deformation of Carbon-Fiber Composite Panel	p. 96
Concluding Remarks	p. 98
References	p. 99
Single-Image Interferogram Demodulation	p. 105
Introduction	p. 105
Spatial Carrier Frequency Techniques	p. 105
Spatial Demodulation Without Carrier	p. 106
The Fourier Spatial Demodulating Method	p. 106
Linear Spatial Phase Shifting	p. 109
Nonlinear Spatial Phase Shifting	p. 113
Regularized Phase Tracking	p. 115
Local Adaptive Robust Quadrature Filters	p. 118
Single Interferogram Demodulation Using Fringe Orientation	p. 122
Orientation in Interferogram Processing	p. 122
Fringe Orientation and Fringe Direction	p. 124
Orientation Computation	p. 126
Gradient-Based Orientation Computation	p. 127
Plane Fit Orientation Calculation	p. 129
Minimum Directional Derivative	p. 131
Direction Computation	p. 132
Regularized Phase Tracking Direction Estimation	p. 132
Vector Field-Regularized Direction Estimation	p. 134
Quadrature Operators	p. 135
Phase Demodulation of ID Interferograms	p. 135
Phase Demodulation from a Single Interferogram: the Vortex Transform	p. 136
Vortex Transform-Based Orientation Computation	p. 138
The General n-Dimensional Quadrature Transform	p. 139
2D Steering of ID Phase Shifting Algorithms	p. 142
Conclusions	p. 143
References	p. 144
Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods	p. 147
Introduction	p. 147
The Temporal Speckle Pattern Interferometry Signal	p. 148
The Temporal Fourier Transform Method	p. 151
Time-Frequency Representations of the TSPI Signals	p. 153
Preliminaries	p. 154
The Asymptotic Signal and the Exponential Model	p. 154
Fidelity Measures	p. 155
The Windowed Fourier Transform	p. 156
The Wavelet Transform	p. 160
Evaluation of the Ridge of a Wavelet Transform	p. 163
Applications of the Morlet Transform Analysis in TSPI and Other Related Techniques	p. 166
The Chirped Wavelet Transform	p. 168
Other Wavelet Transforms	p. 171
The Quadratic Time-Frequency Distribution	p. 172
The Empirical Mode Decomposition and the Hilbert Transform	p. 176
The Empirical Mode Decomposition Method	p. 178
The Hilbert Transform	p. 179
The Generalized S-Transform	p. 182
Two and Three Dimensional Approaches	p. 188
The Windowed Fourier Transform Method	p. 189
Wavelet Transform Methods	p. 190
Concluding Remarks	p. 199
References	p. 200
Optical Vortex Metrology	p. 207
Introduction	p. 207
Speckle and Optical Vortices	p. 207
Core Structure of Optical Vortices	p. 209
Principle of Optical Vortex Metrology	p. 211
Complex Signal Representation of a Speckle-like Pattern	p. 211
Principle of Optical Vortex Metrology	p. 213
Some Applications	p. 214
Nanometric Displacement Measurement	p. 214
Linear and Angular Encoder	p. 217
Fluid Mechanical Analysis	p. 224
Biological Kinematic Analysis	p. 230
Conclusion	p. 235
References	p. 236
Speckle Coding for Optical and Digital Data Security Applications	p. 239
Introduction	p. 239
Double Random Fourier Plane Encoding	p. 242
Influence of Coded Image Perturbations, Noise Robustness, and SNR	p. 245
Variants of the DRPE and Various Other Encryption Techniques	p. 245
Fresnel and Fractional Fourier Transform Domain Encoding	p. 245
Color Image Encoding and Digital Simulation/Virtual Optics-Based Techniques	p. 246
Phase Retrieval- and Polarization-Based Techniques	p. 246
Interference and Joint Transform Correlator Architecture-Based Techniques	p. 246
Fully Phase Encryption Techniques and Encrypted Holographic Memory	p. 246
Attacks against Random Encoding	p. 247
Speckle Coding for Optical and Digital Data Security	p. 247
Encryption Using a Sandwich Phase Mask Made of Normal Speckle Patterns	p. 248
Theoretical Analysis	p. 248
Description of the Experimental Work	p. 250
Preparation of Speckle Phase Masks	p. 250
Making a Sandwich Phase Mask	p. 251
Technique for Easy Alignment of the Constituent Speckle Phase Masks	p. 251
Experimental Results	p. 252
Computer Simulation	p. 253
Optical Encryption Using a Sandwich Phase Mask Made of Elongated Speckle Patterns	p. 256
Preparation of the Elongated Speckle Phase Mask	p. 256
Description of the Method	p. 256
Computer Simulation Results	p. 257
Speckles for Multiplexing in Encryption and Decryption	p. 262
Multiplexing in Encryption Using Apertures in the FT Plane	p. 264
Methodology	p. 264
Computer Simulation	p. 266
Effect of Aperture Size on the Encryption and Decryption	p. 267
Effect of Increasing the Number and Size of the Apertures	p. 267
Multiplexing in Encryption Using Circular Apertures	p. 272
Multiplexing in Encryption Using Square Apertures	p. 271
Multiplexing by In-Plane Rotation of Sandwich Phase Diffuser and Aperture Systems	p. 272
Methodology	p. 273
Effect on Decrypted Images of Rotation of One of the Constituent Phase Diffusers	p. 274
Multiplexing in Encryption Using the Rotation of the RPM R	p. 277
Multiplexing by Using Set of Apertures and Angular Rotation of Rsm	p. 278
Speckles in Digital Fresnel Field Encryption	p. 282
Digital Recording and Numerical Reconstruction of an Off-Axis Fresnel Hologram	p. 282
Digital Fresnel Field Encryption	p. 283
Digital Encryption of Fresnel Field Using Single Random Phase Encoding	p. 284
Direct Decryption of 3D Object Information from Encrypted Fresnel Field	p. 284
Experiment	p. 286
Results and Discussion	p. 288
Discussion of Encryption and Decryption by the Proposed Method	p. 288
Some General Remarks on Digital Encryption of Holographic Information	p. 290
Conclusions	p. 291
References	p. 292
Index	p. 301
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