Handbook of Surface and Interface Analysis: Methods for Problem-Solving: Riviere; John C.: 9780824700805: Book: Science: eCampus.com

Hands-on resource discusses electron optical and scanned probe microscopy, high spatial resolution imaging, & synchrotron-based techniques & more, integrating the latest advances in instrumentation & methods to solving problems. DLC: Surface (Physics) Analysis.

Preface

iii

(18)

About the Contributors

xxi

1. Introduction

(8)

J. C. Riviere

S. Myhra

1. A spectrum of practitioners

(2)

2. Trends in surface and interface science

(2)

3. The intended audience

(1)

4. The structure of the volume

(4)

2. Elements of Problem-Solving

(14)

S. Myhra

J. C. Riviere

1. Introduction

(1)

2. Surface, interface, and bulk

(2)

3. The problem-solving sequence

(4)

3.1. Identification of the problem and formation of an initial hypothesis

(1)

3.2. Identification of the essential variable(s)

(1)

3.3. Reduction of the problem as far as possible without losing essential information

(1)

3.4. Selection of the technique(s) likely to provide the crucial information by the most reliable and economic route

(1)

3.5. Choice of methodology(ies) consistent with the selection of technique(s)

(1)

3.6. Acquisition and processing of data of adequate quantity and quality

(1)

3.7. Interpretation of the data

(1)

3.8. Review and evaluation

(1)

3.9. Presentation

(1)

4. Practical matters in problem-solving for surfaces and interfaces

(8)

4.1. Specimen handling, preparation and configuration

(4)

4.1.1. Ex situ preparation

(1)

4.1.2. In situ preparation

(2)

4.1.3. Specimen configuration

(1)

4.2. Technique destructiveness

(1)

4.3. Quality assurance, best practice and good housekeeping

(3)

3. How to Use This Book

(34)

S. Myhra

J. C. Riviere

1. Introduction

(1)

2. Definitions

(1)

3. Decision-making in problem-solving

(2)

4. Acronyms and jargon

(5)

Table 4.1: Acronyms: Techniques for surfaces and interfaces

(2)

Table 4.2: Acronyms: Surface and interface methodologies

(1)

Table 4.3: Acronyms and trade names: Compounds

(1)

Table 4.4: Acronyms: Miscellaneous

(1)

Table 4.5: Definitions: Miscellaneous

5. Finding the information

(26)

Table 4.6: Choices and decisions: Specimen configuration and preparation

(1)

Table 4.7: Choices and decisions: Instrumental aspects

(2)

Table 4.8: Surface and interface techniques: Information and methods

(3)

Table 4.9: Surface and interface techniques: Characteristics and attributes

(6)

Table 4.10: Classes, functions and applications of materials: Key words and locations

(11)

4. Spectroscopic Techniques: X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and Ion Scattering Spectroscopy

(102)

Gar B. Hoflund

1. X-ray photoelectron spectroscopy (XPS)

(34)

1.1. Introduction and history

(6)

1.2. Experimental equipment and data collection

(12)

1.2.1. X-ray sources

(3)

1.2.2. Energy analyzers

(3)

1.2.3. Energy calibration

(2)

1.2.4. Data processing

(1)

1.2.5. Sample configuration

(1)

1.2.6. Sample treatment

(2)

1.3. Spectral features and interpretation

(11)

1.3.1. Determination of composition from XPS data

(3)

1.3.2. Determination of chemical state

(7)

1.3.3. Additional features in XPS spectra

(1)

1.4. Spatially resolved XPS

(5)

2. Auger electron spectroscopy (AES)

(30)

2.1. Introduction and history

(4)

2.2. Experimental equipment and data collection

(4)

2.2.1. Electron sources

(1)

2.2.2. Energy analyzers

(4)

2.3. Spectral features and interpretation

(7)

2.4. Associated methodologies

106

(15)

2.4.1. Depth profiling with AES

106

(5)

2.4.2. Angle-resolved AES (ARAES)

111

(7)

2.4.3. Scanning Auger microscopy (SAM)

118

(3)

3. Ion scattering spectroscopy (ISS)

121

(31)

3.1. Introduction and history

121

(5)

3.2. Experimental equipment and data collection

126

(4)

3.3. Spectral features and interpretation

130

(22)

3.3.1. General features

130

(2)

3.3.2. Background and neutralization

132

(2)

3.3.3. Multiple scattering

134

(1)

3.3.4. Multiply charged ion scattering

135

(1)

3.3.5. Choice of primary ion

136

(3)

3.3.6. Hydrogen and carbon

139

(2)

3.3.7. Elemental sensitivity

141

(3)

3.3.8. Energy resolution

144

(3)

3.3.9. Peak shape

147

(1)

3.3.10. Quantification

148

(2)

3.3.11. Data processing

150

(1)

3.3.12. Depth profiling

151

(1)

References

152

(7)

5. Compositional Analysis by Auger Electron and X-ray Photoelectron Spectroscopy

159

(50)

Graham C. Smith

1. Introduction

159

(2)

2. Spectral interpretation

161

(21)

2.1. XPS spectra

161

(16)

2.1.1. Elemental line energies

161

(4)

2.1.2. Photoelectron line shapes

165

(5)

2.1.3. Chemical shifts

170

(4)

2.1.4. Curve fitting

174

(3)

2.2. Auger electron spectra

177

(3)

2.2.1. Elemental line energies

177

(2)

2.2.2. Chemical shifts

179

(1)

2.3. X-ray-excited Auger electron spectra

180

(2)

3. Quantitative of structural analysis

182

(23)

3.1. Quantification and homogeneous samples

183

(17)

3.1.1. Use of sensitivity factors

183

(1)

3.1.2. Measurement of intensity

184

(5)

3.1.3. Modified sensitivity factors for improved quantification

189

(9)

3.1.3.1. Quantification of XPS data

189

(6)

3.1.3.2. Quantification of AES data

195

(3)

3.1.4. Statistical errors in quantification

198

(2)

3.2. Analysis of specimens with spatially varying compositions

200

(1)

3.3. Analysis of specimens with compositional variations in depth

201

(4)

References

205

(4)

6. Ion Beam Techniques: Surface Mass Spectrometry

209

(46)

Birgit Hagenhoff

Derk Rading

1. Principles

209

(17)

1.1. Physical effects of ion induced sputtering

210

(2)

1.1.1. Sputtering

210

(1)

1.1.2. Ionization

211

(1)

1.1.3. Formation of molecular species

211

(1)

1.2. Instrumentation

212

(5)

1.2.1. Primary-ion bombardment

212

(2)

1.2.2. Mass analyzers

214

(1)

1.2.3. Add-ons

215

(2)

1.3. Typical spectra

217

(4)

1.3.1. Typical characteristics of SSIMS spectra

217

(3)

1.3.2. Typical characteristics of SNMS spectra

220

(1)

1.4. Useful definitions in SSIMS and SNMS

221

(3)

1.4.1. General

221

(1)

1.4.2. SSIMS

222

(1)

1.4.3. SNMS

223

(1)

1.5. Use of noble metal substrates

224

(1)

1.6. Performance summary

225

(1)

2. Operational methodology

226

(13)

2.1. The analytical question

226

(1)

2.2. Spatial location

227

(3)

2.3. Identification and peak assignment

230

(2)

2.4. Quantification

232

(7)

2.4.1. Use of internal standards

233

(2)

2.4.2. (Sub)monolayer coverages

235

(2)

2.4.3. Organic multilayers

237

(2)

3. Problem solving

239

(10)

3.1. Defects in car paint

239

(3)

3.2. CI diffusion in polymer materials

242

(1)

3.3. Monitoring of surface modifications

243

(3)

3.4. Residues on glass

246

(3)

4. Summary and outlook

249

(2)

References

251

(4)

7. In-depth Analysis: Methods for Depth Profiling

255

(42)

F. Reniers

1. Introduction

255

(5)

2. Sample preparation

260

(1)

3. Nondestructive in-depth analysis

260

(6)

3.1. Rutherford backscattering spectrometry (RBS)

260

(3)

3.1.1. Basic principles

260

(1)

3.1.2. Quantitative analysis

261

(1)

3.1.3. Application of RBS

262

(1)

3.2. Angle-resolved AES and XPS

263

(3)

3.2.1. Basic principles

263

(2)

3.2.2. Applications

265

(1)

3.2.3. Summary

265

(1)

4. Destructive depth profiling

266

(22)

4.1. Ion guns

266

(1)

4.2. AES and XPS

266

(13)

4.2.1. Basic principles

267

(1)

4.2.2. Quantitative analysis

267

(2)

4.2.3. Depth determination-conversion

269

(1)

4.2.4. Depth resolution

269

(2)

4.2.4.1. Improvement in AES sputter depth profiling

269

(2)

4.2.5. Summary of optimized depth profiling conditions for AES/XPS

271

(2)

4.2.6. Improvement of depth resolution by sample rotation

273

(1)

4.2.7. Chemical depth profiles using AES

273

(6)

4.3. Glow discharge optical emission spectroscopy (GDOES)

279

(3)

4.3.1. Basic principles

279

(1)

4.3.2. Quantitative analysis

279

(1)

4.3.3. Recent improvements in GDOES

280

(2)

4.4. SIMS

282

(3)

4.4.1. Basic principles

282

(1)

4.4.2. Quantitative analysis

282

(1)

4.4.3. Applications

283

(1)

4.4.4. Optimum conditions for performing SIMS depth profiling

284

(1)

4.4.4.1. Bombarding conditions: ions

284

(1)

4.4.4.2. Angle of incidence

284

(1)

4.4.4.3. Effect of the choice of gas in SIMS

284

(1)

4.4.4.4. Choice of ion beam energy

285

(1)

4.4.4.5. Interferences in SIMS depth profiling

285

(1)

4.5. SNMS

285

(3)

4.5.1. Basic principles

285

(2)

4.5.2. Quantification in SNMS

287

(1)

4.5.3. Applications

288

(1)

5. Discussion and general conclusion

288

(2)

5.1. Typical problems that might be encountered when sputter profiling, and their solutions

289

(1)

5.2. Key parameters/considerations for choice of the appropriate analysis method

289

(1)

References

290

(7)

8. Ion Beam Effects in Thin Surface Films and Interfaces

297

(50)

I. Bertoti

M. Menyhard

A. Toth

1. Introduction

297

(3)

2. Low-energy atomic mixing

300

(13)

2.1. Auger depth profiling

301

(5)

2.1.1. Multilayer systems

301

(1)

2.1.2. High-resolution depth profiling equipment

301

(3)

2.1.3. Characteristic depth profiles

304

(2)

2.2. Evaluation of Auger depth profiles

306

(3)

2.2.1. Sputtering-induced surface roughness

306

(2)

2.2.2. Intrinsic surface roughness of interfaces

308

(1)

2.2.3. Calculation of the surface concentration

308

(1)

2.3. Atomic mixing

309

(4)

2.3.1. Energy dependence of ion mixing

310

(1)

2.3.2. Interpretation of the depth profiles

310

(3)

3. Particle-beam-induced chemical alterations

313

(27)

3.1. Thin surface films of inorganic compounds

314

(18)

3.1.1. TiN layers

314

(10)

3.1.2. Metal oxides

324

(3)

3.1.3. Cr-O-Si cermet films

327

(5)

3.2. Thin surface films of polymers

332

(8)

3.2.1. Aromatic poly(ether sulfone)

335

(1)

3.2.2. Aromatic polyimide

336

(2)

3.2.3. Organosilicon polymers

338

(2)

References

340

(7)

9. Surface Modification by Ion Implantation

347

(48)

D. M. Ruck

1. Introduction

347

(3)

2. Physical processes

350

(4)

3. Ion implantation: instrumentation and procedures

354

(1)

4. Methods for characterisation of implanted layers

355

(13)

4.1. Phase analysis by Mossbauer spectroscopy

360

(8)

4.1.1. General aspects

360

(1)

4.1.2. Depth-selective CEMS

361

(7)

5. Examples of the application of ion implantation

368

(20)

5.1. Improved surface properties in medical endoprothesis

369

(8)

5.1.1. Introduction

369

(1)

5.1.2. Results

370

(6)

5.1.3. Discussion and conclusions

376

(1)

5.2. Modification of chromium layers by nitrogen ion implantation

377

(4)

5.2.1. Introduction

377

(1)

5.2.2. Experimental procedures

377

(1)

5.2.3. Results

377

(3)

5.2.4. Conclusions

380

(1)

5.3. Waveguide structures by ion irradiation of polymeric materials

381

(7)

5.3.1. Introduction

381

(2)

5.3.2. Generation of um structures

383

(3)

5.3.3. Buried waveguide layers

386

(1)

5.3.4. Coupling between device and fiber: fiber-chip coupling

387

(1)

5.3.5. Conclusions and further developments

387

(1)

References

388

(7)

10. Introduction to Scanned Probe Microscopy

395

(52)

S. Myhra

1. Introduction

395

(7)

1.1. Essential elements of SPM

397

(1)

1.2. Brief history of SPM

398

(1)

1.3. The SPM family tree

398

(4)

2. Physical principles

402

(8)

2.1. STM/STS

402

(5)

2.2. SFM

407

(1)

2.3. Force-distance spectroscopy

407

(3)

3. Technical implementation of SPM instrumentation

410

(7)

3.1. Generic features and elements

410

(2)

3.2. Spatial positioning and control

412

(2)

3.3. Gap control loop

414

(1)

3.4. Raster implementation and control

415

(1)

3.5. Noise and drift management

415

(1)

3.6. Environmental control

416

(1)

3.7. Data management

417

(1)

4. Specifics for some SPM techniques

417

(23)

4.1. STM/STS specifics

417

(4)

4.2. SFM specifics

421

(4)

4.3. SFM probes: general considerations

425

(1)

4.4. SFM probes: design criteria

425

(2)

4.5. Probe calibration and image artefacts

427

(1)

4.6. Determination of normal spring constant

428

(3)

4.7. Determination of lateral spring constant

431

(2)

4.8. Resonance frequency

433

(1)

4.9. Aspect ratio

433

(1)

4.10. Radius of curvature of tip

434

(6)

4.11. Determination of tip height and tilt

440

(1)

5. Problem-solving with SPM

440

(3)

5.1. Manipulation on the nanoscale with SPM

442

(1)

References

443

(4)

11. Metallurgy

447

(38)

R. K. Wild

1. Introduction

447

(7)

1.1. Strength of materials

448

(1)

1.2. Failure mechanisms

449

(1)

1.3. Segregation

449

(5)

1.3.1. Thermal

449

(5)

1.3.2. Irradiation assisted

454

(1)

2. Analytical methods for determining grain boundary segregation

454

(23)

2.1. Introduction

454

(1)

2.2. Metallographically polished specimens

455

(4)

2.2.1. Chemical etching

455

(2)

2.2.2. SIMS

457

(1)

2.2.3. Autoradiography

458

(1)

2.3. Intergranular fracture

459

(12)

2.3.1. Impact at low temperature.

459

(6)

2.3.1.1. AES

460

(5)

2.3.1.2. XPS

465

(1)

2.3.2. Hydrogen charging

465

(6)

2.3.2.1. Charging methods

465

(3)

2.3.2.2. Impact and slow tensile fracture

468

(3)

2.4. Transmission electron microscopy

471

(6)

2.4.1. Production of a thin foil

471

(2)

2.4.2. Field emission gun STEM

473

(4)

2.4.2.1. Parallel electron energy loss spectroscopy

473

(1)

2.4.2.2. Energy dispersive X-ray analysis

474

(2)

2.4.2.3. Comparison of AES and FEGSTEM

476

(1)

2.4.3. Time-of-flight atom probe

477

(1)

3. Cracks in metals and alloys

477

(4)

References

481

(4)

12. Microelectronics and Semiconductors

485

(58)

E. Paparazzo

1. Introduction

485

(2)

2. Techniques

487

(6)

2.1. Surface specificity

487

(2)

2.2. Elemental specificity

489

(1)

2.3. Chemical sensitivity

489

(1)

2.4. Destructiveness

490

(1)

2.5. Quantification

491

(1)

2.6. Spatial resolution

491

(1)

2.7. Surface charging and other considerations

492

(1)

3. Josephson junctions

493

(7)

3.1. Problem specification

493

(1)

3.2. Experimental approach: choice of techniques and specimen configuration

493

(1)

3.3. Results

494

(5)

3.3.1. AES analysis

494

(2)

3.3.2. XPS analysis

496

(3)

3.4. Discussion

499

(1)

4. Oxidation of InxGa(1-x)AsyP(1-y) semiconductors by NO(2)

500

(9)

4.1. Problem specification

500

(1)

4.2. Experimental approach: choice of technique and specimen configuration

501

(1)

4.3. Results

501

(7)

4.3.1. AES analysis

501

(2)

4.3.2. SAM and scanning ELS analysis

503

(5)

4.4. Discussion

508

(1)

5. Si/SiO(2) interface

509

(16)

5.1. Problem specification

510

(1)

5.2. Experimental approach: choice of technique and specimen configuration

511

(1)

5.3. Results

511

(10)

5.3.1. Effects of Ar(+) bombardment

511

(4)

5.3.2. Interfacial suboxides

515

(1)

5.3.3. Surface-hydrated species

516

(5)

5.4. Discussion

521

(4)

5.4.1. Effects of Ar(+) bombardment and suboxides

521

(3)

5.4.2. Surface-hydrated species

524

(1)

6. InP/SiO2 system

525

(12)

6.1. Problem specification

525

(1)

6.2. Experimental approach: choice of technique and specimen configuration

525

(1)

6.3. Results

526

(3)

6.4. Discussion

529

(8)

References

537

(6)

13. Minerals, Ceramics, and Glasses

543

(62)

R. St. C. Smart

1. Introduction

543

(2)

2. Information required: analytical techniques

545

(1)

3. Analysis strategy

545

(7)

4. Minerals

552

(24)

4.1. Phase structures

552

(6)

4.2. Surface structures

558

(8)

4.3. Surface sites

566

(2)

4.4. Grain boundaries and intergranular films

568

(2)

4.5. Depth profiles

570

(1)

4.6. Adsorption

570

(3)

4.7. Surface reactions

573

(1)

4.8. Surface modification

574

(2)

5. Ceramics

576

(10)

5.1. Phase structures

576

(2)

5.2. Surface structures

578

(1)

5.3. Surface sites

579

(1)

5.4. Grain boundaries and intergranular films

580

(1)

5.5. Depth profiles

581

(1)

5.6. Adsorption

582

(3)

5.7. Surface reactions

585

(1)

5.8. Surface modification

585

(1)

6. Glasses

586

(12)

6.1. Surface composition

586

(3)

6.2. Surface sites

589

(1)

6.3. Depth profiles

589

(1)

6.4. Adsorption

590

(1)

6.5. Surface reactions

591

(5)

6.6. Surface modification

596

(2)

References

598

(7)

14. Composites

605

(38)

P. M. A. Sherwood

1. Introduction

605

(1)

2. Presenting fibers for surface analysis

606

(3)

2.1. Presentation of multiple fibers for analysis

606

(1)

2.2. Problems in the study of conducting fibers

607

(2)

2.3. The question of fiber decomposition

609

(1)

3. Presenting composites for surface analysis

609

(1)

4. Surface analytical techniques for composites and fibers

610

(4)

4.1. X-ray diffraction

610

(1)

4.2. FTIR and Raman spectroscopies

611

(1)

4.3. SEM

612

(1)

4.4. STM and AFM

612

(1)

4.5. Wavelength dispersive X-ray emission in an electron microprobe

612

(1)

4.6. Surface energy

613

(1)

4.7. Titrimetric methods

613

(1)

4.8. Mass spectrometry

614

(1)

4.9. SIMS

614

(1)

4.10. Ion scattering spectroscopy

614

(1)

5. X-ray photoelectron spectroscopic studies of composites and fibers

614

(24)

5.1. Introduction

614

(2)

5.2. The question of surface charging

616

(2)

5.3. Depth profiling of carbon composites and fibers

618

(1)

5.4. Decomposition of surface functionality during spectral collection

619

(2)

5.5. XPS data analysis and interpretation of core chemical shifts

621

(11)

5.5.1. Fitting C Is spectra

622

(3)

5.5.2. Detailed fitting considerations

625

(3)

5.5.3. The use of monochromatic X-radiation

628

(2)

5.5.4. Fitting O 1s spectra

630

(1)

5.5.5. Fitting N 1s spectra

631

(1)

5.6. Interpreting the valence-band spectrum

632

(4)

5.6.1. Using calculations to predict valence-band spectra

633

(1)

5.6.2. Understanding the valence-band spectra of carbon fibers

633

(2)

5.6.3. The use of UV rather than X-radiation

635

(1)

5.7. Interfacial studies

636

(2)

6. Concluding comments

638

(2)

References

640

(3)

15. Corrosion and Surface Analysis: An Integrated Approach Involving Spectroscopic and Electrochemical Methods

643

(54)

N. S. Mclntyre

R. D. Davidson

I. Z. Hyder

A. M. Brennenstuhl

1. Introduction

643

(3)

1.1. Types of corrosion process

644

(1)

1.2. Corrosion and surfaces

645

(1)

2. Protocols for corrosion film analysis

646

(22)

2.1. Preliminary sample handling

646

(1)

2.2. Contaminants

647

(1)

2.3. Preliminary examination

648

(2)

2.4. Cross sectioning of oxide surface films

650

(3)

2.5. Pressure restrictions on sample analysis

653

(1)

2.6. SEM and EDS analyses

653

(3)

2.7. XPS

656

(5)

2.8. AES

661

(4)

2.9. SIMS

665

(2)

2.10. Other methods

667

(1)

3. Background to the problem: A working hypothesis

668

(1)

4. Experimental strategy

669

(2)

5. Electrochemical techniques for surface corrosion studies

671

(3)

5.1. Basic electrode kinetics

671

(1)

5.2. Electrochemical techniques

672

(2)

5.2.1. Linear polarization

672

(1)

5.2.2. Anodic polarization

672

(1)

5.2.3. Electrochemical impedance spectroscopy

673

(1)

6. Results and assessment

674

(19)

6.1. Initial characterization

674

(1)

6.2. Boiler simulation corrosion experiments

675

(4)

6.3. Contrived corrosion experiments on Monel

679

(14)

6.3.1. Electrochemical measurements at pH 10

679

(3)

6.3.2. Microscopy studies of oxides from pH 10 exposures

682

(1)

6.3.3. Elemental and chemical compositions of oxides formed at pH 10

683

(7)

6.3.4. Electrochemical and microscopy studies of alloys exposed to pH 1

690

(3)

7. Conclusions

693

(3)

References

696

(1)

16. Problem-Solving Methods in Tribology with Surface-Specific Techniques

697

(50)

C. Donnet

1. Tribology and surface-related phenomena

697

(3)

2. Surface analysis requirements for tribology

700

(14)

2.1. Overview

700

(2)

2.2. Dimensional criterion

702

(1)

2.3. Time-scale criterion

703

(3)

2.4. Information criterion

706

(8)

2.4.1. Physicochemical and structural information

707

(4)

2.4.2. Surface morphology

711

(1)

2.4.3. Physical, mechanical and frictional surface and interface properties

712

(2)

3. Generic studies

714

(27)

3.1. Ultrathin boundary lubricant films

714

(3)

3.2. Tribochemistry of antiwear additives in boundary lubrication

717

(5)

3.2.1. Ex situ surface analytical investigations

717

(2)

3.2.2. In vivo pre mortem surface analytical investigations

719

(1)

3.2.3. In situ post mortem surface analytical investigations in Ultrahigh Vacuum

720

(2)

3.3. Tribochemical activity of nascent surfaces

722

(2)

3.4. Influence of the nature of the surface on the tribochemistry of various tribo-materials

724

(3)

3.5. Effect of adsorbate monolayers on dry friction

727

(2)

3.6. Tribochemistry of SiC/SiC under a partial pressure of oxygen

729

(2)

3.7. Relationship of durability to microstructure of IBAD MoS(2) coatings

731

(1)

3.8. Frictionless sliding of pure MoS(2) in UHV

732

(5)

3.9. Tribology of carbonaceous coatings

737

(3)

3.10. Tribochemistry of C(60) coatings

740

(1)

4. Synthesis and conclusion

741

(2)

Acronyms

743

(1)

References

744

(3)

17. Catalyst Characterization

747

(34)

W. E. S. Unger

T. Gross

1. Introduction

747

(2)

2. Applicability of surface spectroscopies in catalyst characterization

749

(3)

3. Sample damage

752

(1)

4. Sample preparation

753

(3)

5. Charging of insulator surfaces by the probe

756

(1)

6. Chemical-state analysis with XPS by fingerprinting and reference to databases or chemical-state plots

757

(9)

7. Chemical state analysis with SIMS by fingerprinting

766

(3)

8. Miscellaneous

769

(3)

8.1. The molecular probe approach: assessment of acid-base properties

769

(1)

8.2. Alloying at bimetallic supported catalysts

770

(1)

8.3. In-depth analysis

771

(1)

9. Quantitative surface analysis of catalysts: composition, dispersion and coverage

772

(4)

References

776

(5)

18. Adhesion Science and Technology

781

(54)

J. F. Watts

1. Introduction

781

(1)

2. Characteristics of the solid substrate

782

(6)

2.1. Organic contamination

783

(1)

2.2. Oxide films at metal surfaces

784

(3)

2.3. Carbon fiber composite materials

787

(1)

3. Failure analysis: identification of the locus of failure

788

(20)

3.1. Adhesion to brass

789

(2)

3.2. Adhesion of organic coatings to steel

791

(8)

3.3. Zinc surfaces

799

(1)

3.4. Aluminum alloys

800

(2)

3.5. Composite materials

802

(2)

3.6. Ceramics

804

(3)

3.7. Summary

807

(1)

4. Probing the buried interface

808

(3)

5. Organosilane adhesion promoters

811

(3)

6. Acid-base interactions in adhesion

814

(9)

6.1. Evaluation of acid-base interactions in adhesion

814

(2)

6.2. The XPS chemical shift and acid-base interactions

816

(1)

6.3. The use of vapor phase probes for the determination of -XXXH(AB)

817

(1)

6.4. Quantitative acid-base characteristics of the polymer

818

(4)

6.5. Acid-base properties of inorganic surfaces

822

(1)

6.6. Concluding remarks

823

(1)

7. Computer chemistry and molecular modeling

823

(2)

8. Future prospects

825

(3)

References

828

(7)

19. Archaeomaterials

835

(36)

E. Paparazzo

1. Introduction

835

(1)

2. Choice of techniques for the study of archeomaterials

836

(1)

2.1. Bulk techniques

836

(1)

2.2. Surface-specific techniques: XPS and SAM

836

(1)

3. Roman lead pipe fistula

837

(20)

3.1. Description of material and specimen

837

(1)

3.2. Results

838

(14)

3.3. Discussion

852

(5)

4. Roman leaded bronzes

857

(11)

4.1. Specification of the problem

857

(1)

4.2. Results

857

(10)

4.3. Discussion

867

(1)

References

868

(3)

Appendix 1. Physical Constants and Conversion Factors

871

(2)

Appendix 2. Data for the Elements and Isotopes

873

(12)

Appendix 3. Less Commonly Used Techniques for Analysis of Surfaces and Interfaces

885

(18)

Gar B. Hoflund

J. C. Riviere

1. Ultraviolet photoemission spectroscopy (UPS)

885

(4)

References

888

(1)

2. Electron energy loss spectroscopy (ELS)

889

(3)

References

892

(1)

3. Electron-stimulated desorption (ESD)

892

(5)

References

897

(1)

4. Vibrational spectroscopies

897

(5)

4.1. Infrared techniques

897

(2)

4.1.1. Attenuated total reflectance (ATR)

898

(1)

4.1.2. Reflection absorption infrared spectroscopy (RAIRS)

898

(1)

4.2. Electron impact technique

899

(3)

4.2.1. High-resolution electron energy loss spectroscopy (HREELS)

899

(3)

References

902

(1)

Appendix 4. Core-Level Binding Energies, Auger Kinetic Energies, and Modified Auger Parameters for Some Chemical Elements in Various Compounds

903

(4)

References

905

(2)

Appendix 5. Documentary Standards in Surface Analysis: The Way of the Future?

907

(22)

S. J. Harris

1. Introduction

907

(2)

2. ISO technical committee 201 on surface chemical analysis

909

(15)

2.1. Structure of ISO technical committee 201

909

(2)

2.2. ISO technical committee 201 sub-committees

911

(13)

2.3. ISO TC201 Working Groups

924

(1)

3. Conclusions

924

(3)

References

927

(2)

Index

929

Twenty-four contributors from universities, industry, and government from around the Western world have brought their expertise together to create a much needed handbook on surface analysis. As the title reflects, the primary aim of the editors was to provide a spectrum of practitioners with a reasonably-sized book which would provide a methodological way to study and solve surface-related problems. Each of the 16 chapters starts with "some general materials science questions that could arise in surface/interface science and technology, the user will be guided to ever more detailed and specific levels of questions...there will be descriptions of the principal surface specific techniques...the reader will be directed to whichever chapter (or chapters) is appropriate to the problem, and will find...the most productive methodology(ies)..." The reader is advised to consult the 57 pages on how to best use the book. Each chapter features a multitude of figures and tables, but most of the references are regrettably before the 1990s. This handbook is recommended for large academic science libraries.Reviewer: Jan Figa, Reference Librarian, Illinois Institute of Technology Paul V. Galvin Library, jfiga@charlie.cns.iit.eduCopyright 2000 YBP Library Services


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