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Table of Contents
|Problem Solving: Strategy, Tactics, and Resources||p. 7|
|Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS)||p. 19|
|Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)||p. 65|
|Surface and Interface Analysis by Scanning Probe Microscopy||p. 97|
|Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments||p. 139|
|Synchrotron-Based Techniques||p. 193|
|Quantification of Surface and Near-Surface Composition by AES and XPS||p. 223|
|Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy||p. 245|
|In-Depth Analysis/Profiling||p. 281|
|Characterization of Nanostructured Materials||p. 319|
|Problem-Solving Methods in Tribology with Surface-Specific Techniques||p. 351|
|Problem-Solving Methods in Metallurgy with Surface Analysis||p. 389|
|Minerals, Ceramics, and Glasses||p. 457|
|Catalyst Characterization||p. 501|
|Surface Analysis of Biomaterials||p. 529|
|Adhesion Science and Technology||p. 565|
|Electron Spectroscopy in Corrosion Science||p. 603|
|Table of Contents provided by Ingram. All Rights Reserved.|