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Preface | p. vii |
Editors | p. xi |
Contributors | p. xiii |
Authors | p. xv |
Introduction | p. 1 |
Problem Solving: Strategy, Tactics, and Resources | p. 7 |
Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS) | p. 19 |
Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) | p. 65 |
Surface and Interface Analysis by Scanning Probe Microscopy | p. 97 |
Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments | p. 139 |
Synchrotron-Based Techniques | p. 193 |
Quantification of Surface and Near-Surface Composition by AES and XPS | p. 223 |
Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy | p. 245 |
In-Depth Analysis/Profiling | p. 281 |
Characterization of Nanostructured Materials | p. 319 |
Problem-Solving Methods in Tribology with Surface-Specific Techniques | p. 351 |
Problem-Solving Methods in Metallurgy with Surface Analysis | p. 389 |
Composites | p. 421 |
Minerals, Ceramics, and Glasses | p. 457 |
Catalyst Characterization | p. 501 |
Surface Analysis of Biomaterials | p. 529 |
Adhesion Science and Technology | p. 565 |
Electron Spectroscopy in Corrosion Science | p. 603 |
Index | p. 635 |
Table of Contents provided by Ingram. All Rights Reserved. |
The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.