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Principles of CMOS VLSI Design : A Systems Perspective,9780201533767
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Principles of CMOS VLSI Design : A Systems Perspective

by Weste, Neil H. E.
Edition:
2nd
ISBN13:

9780201533767

ISBN10:
0201533766
Format:
Hardcover
Pub. Date:
5/1/1993
Publisher(s):
Addison-Wesley
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Summary

With this revision, Weste conveys an understanding of CMOS technology, circuit design, layout, and system design sufficient to the designer. The book deals with the technology down to the layout level of detail, thereby providing a bridge from a circuit to a form that may be fabricated. The early chapters provide a circuit view of the CMOS IC design, the middle chapters cover a sub-system view of CMOS VLSI, and the final section illustrates these techniques using a real-world case study.

Table of Contents

PART 1 INTRODUCTION TO CMOS TECHNOLOGY 1(378)
Introduction to CMOS Circuits
3(38)
A Brief History
3(1)
Book Summary
4(1)
MOS Transistors
5(2)
MOS Transistor Switches
7(2)
CMOS Logic
9(12)
The Inverter
9(1)
Combinational Logic
10(1)
The NAND Gate
11(2)
The NOR Gate
13(2)
Compound Gates
15(2)
Multiplexers
17(2)
Memory---Latches and Registers
19(2)
Circuit and System Representations
21(9)
Behavioral Representation
22(2)
Structural Representation
24(4)
Physical Representation
28(2)
An Example
30(8)
Specification
31(1)
Behavioral Description
31(1)
Structural Specification
32(3)
Physical Description
35(2)
Summary
37(1)
CMOS Scorecard
38(1)
Summary
39(1)
References
39(2)
MOS Transistor Theory
41(68)
Introduction
41(10)
nMOS Enhancement Transistor
43(4)
pMOS Enhancement Transistor
47(1)
Threshold Voltage
47(1)
Threshold Voltage Equations
48(3)
Body Effect
51(1)
MOS Device Design Equations
51(10)
Basic DC Equations
51(2)
Second Order Effects
53(1)
Threshold Voltage---Body Effect
54(1)
Subthreshold Region
55(1)
Channel-length Modulation
55(1)
Mobility Variation
56(1)
Fowler-Nordheim Tunneling
57(1)
Drain Punchthrough
57(1)
Impact Ionization---Hot Electrons
57(1)
MOS Models
58(1)
Small Signal AC Characteristics
59(2)
The Complementary CMOS Inverter---DC Characteristics
61(11)
βn/βp Ratio
68(1)
Noise Margin
69(2)
The CMOS Inverter as an Amplifier
71(1)
Static Load MOS Inverters
72(9)
The Pseudo-nMOS Inverter
73(4)
Saturated Load Inverters
77(1)
More Saturated Load Inverters
78(2)
The Cascode Inverter
80(1)
TTL Interface Inverter
80(1)
The Differential Inverter
81(5)
The Transmission Gate
86(5)
The Tristate Inverter
91(1)
Bipolar Devices
91(7)
Diodes
91(2)
Bipolar Transistors
93(3)
BiCMOS Inverters
96(2)
Summary
98(1)
Exercises
98(1)
Appendix---SPICE Level 3 Model
99(7)
References
106(3)
CMOS Processing Technology
109(66)
Silicon Semiconductor Technology: An Overview
109(8)
Wafer Processing
110(1)
Oxidation
111(1)
Expitaxy, Deposition, Ion-Implantation, and Diffusion
111(2)
The Silicon Gate Process
113(4)
Basic CMOS Technology
117(13)
A basic n-well CMOS Process
117(6)
The p-well Process
123(1)
Twin-Tub Processes
124(1)
Silicon On Insulator
125(5)
CMOS Process Enhancements
130(12)
Interconnect
130(1)
Metal Interconnect
130(2)
Polysilicon/Refractory Metal Interconnect
132(1)
Local Interconnect
133(1)
Circuit Elements
134(1)
Resistors
134(1)
Capacitors
134(2)
Electrically Alterable ROM
136(1)
Bipolar Transistors
136(3)
Thin-film Transistors
139(1)
3-D CMOS
140(1)
Summary
141(1)
Layout Design Rules
142(14)
Layer Representations
143(1)
CMOS n-well Rules
144(6)
Design Rule Backgrounder
150(5)
Scribe Line
155(1)
Layer Assignments
155(1)
SOI Rules
156(1)
Design Rules---Summary
156(1)
Latchup
156(7)
The Physical Origin of Latchup
156(2)
Latchup Triggering
158(2)
Latchup Prevention
160(1)
Internal Latchup Prevention Techniques
161(1)
I/O Latchup Prevention
162(1)
Technology-related CAD Issues
163(4)
DRC---Spacing and Dimension Checks
164(2)
Circuit Extraction
166(1)
Summary
167(1)
Exercises
167(1)
Appendix---An n-well CMOS Technology Process Flow
168(4)
References
172(3)
Circuit Characterization and Performance Estimation
175(86)
Introduction
175(1)
Resistance Estimation
176(4)
Resistance of Nonrectangular Regions
178(1)
Contact and Via Resistance
179(1)
Capacitance Estimation
180(25)
MOS-Capacitor Characteristics
180(3)
MOS Device Capacitances
183(3)
Diffusion (source/drain) Capacitance
186(2)
SPICE Modeling of MOS Capacitances
188(3)
Routing Capacitance
191(1)
Single Wire Capacitance
191(1)
Multiple Conductor Capacitances
192(6)
Distributed RC Effects
198(4)
Capacitance Design Guide
202(2)
Wire Length Design Guide
204(1)
Inductance
205(2)
Switching Characteristics
207(19)
Analytic Delay Models
208(1)
Fall Time
208(2)
Rise Time
210(1)
Delay Time
211(2)
Empirical Delay Models
213(1)
Gate Delays
214(2)
Further Delay Topics
216(1)
Input Waveform Slope
216(1)
Input Capacitance
217(1)
Switch-Level RC Models
218(3)
Macromodeling
221(2)
Body Effect
223(2)
Summary
225(1)
CMOS-Gate Transistor Sizing
226(5)
Cascaded Complimentary Inverters
226(2)
Cascaded Pseudo-nMOS Inverters
228(1)
Stage Ratio
229(2)
Power Dissipation
231(7)
Static Dissipation
231(2)
Dynamic Dissipation
233(2)
Short-Circuit Dissipation
235(1)
Total Power Dissipation
236(1)
Power Economy
237(1)
Sizing Routing Conductors
238(2)
Power and Ground Bounce
239(1)
Contact Replication
240(1)
Charge Sharing
240(3)
Design Margining
243(5)
Temperature
243(1)
Supply Voltage
244(1)
Process Variation
245(1)
Design Corners
246(1)
Packaging Issues
247(1)
Power and Clock Conductor Sizing
248(1)
Summary
248(1)
Yield
248(2)
Reliability
250(1)
Scaling of MOS Transistor Dimensions
250(5)
Scaling Principles
251(2)
Interconnect-Layer Scaling
253(2)
Scaling in Practice
255(1)
Summary
255(1)
Exercises
256(1)
References
257(4)
CMOS Circuit and Logic Design
261(118)
Introduction
261(1)
CMOS Logic Gate Design
262(11)
Fan-in and Fan-out
264(3)
Typical CMOS NAND and NOR Delays
267(4)
Transistor Sizing
271(1)
Summary
272(1)
Basic Physical Design of Simple Logic Gates
273(22)
The Inverter
273(5)
NAND and NOR gates
278(1)
Complex Logic Gates Layout
279(4)
CMOS Standard Cell Design
283(2)
Gate Array Layout
285(1)
Sea-of-Gates Layout
286(1)
General CMOS Logic-Gate Layout Guidelines
287(3)
Layout Optimization for Performance
290(1)
Transmission-gate Layout Considerations
291(3)
2-input Multiplexer
294(1)
CMOS Logic Structures
295(22)
CMOS Complementary Logic
295(2)
BiCMOS Logic
297(1)
Pseudo-nMOS Logic
298(3)
Dynamic CMOS Logic
301(1)
Clocked CMOS Logic (C2MOS)
302(2)
Pass-transistor Logic
304(4)
CMOS Domino Logic
308(2)
NP Domino Logic (Zipper CMOS)
310(1)
Cascade Voltage Switch Logic (CVSL)
311(3)
SFPL Logic
314(1)
Summary
315(2)
Clocking Strategies
317(40)
Clocked Systems
317(1)
Latches and Registers
318(4)
System Timing
322(1)
Setup and Hold Time
323(2)
Single-phase Memory Structures
325(9)
Phase Locked Loop Clock Techniques
334(3)
Metastability and Synchronization Failures
337(3)
Single-phase Logic Structures
340(4)
Two-phase Clocking
344(2)
Two-phase Memory Structures
346(4)
Two-phase Logic Structures
350(1)
Four-phase Clocking
351(1)
Four-phase Memory Structures
352(1)
Four-phase Logic Structures
353(2)
Recommended Clocking Approaches
355(1)
Clock Distribution
356(1)
I/O Structures
357(11)
Overall Organization
357(3)
VDD and VSS Pads
360(1)
Output Pads
360(1)
Input Pads
361(3)
Tristate and Bidirectional Pads
364(1)
Miscellaneous Pads
365(2)
ECL and Low Voltage Swing Pads
367(1)
Low-power Design
368(2)
Summary
370(1)
Exercises
370(2)
References
372(7)
PART 2 SYSTEMS DESIGN AND DESIGN METHODS 379(246)
CMOS Design Methods
381(84)
Introduction
381(1)
Design Strategies
382(9)
Introduction
382(1)
Structured Design Strategies
383(1)
Hierarchy
384(3)
Regularity
387(1)
Modularity
387(2)
Locality
389(2)
Summary
391(1)
CMOS Chip Design Options
391(33)
Programmable Logic
391(1)
Programmable Logic Structures
392(3)
Programmable Interconnect
395(5)
Reprogrammable Gate Arrays
400(1)
The XILINX Programmable Gate Array
400(3)
Algotronix
403(3)
Concurrent Logic
406(1)
Sea-of-Gate and Gate Array Design
407(6)
Standard-cell Design
413(1)
A Typical Standard-cell Library
414(3)
Full-custom Mask Design
417(1)
Symbolic Layout
417(1)
Coarse-grid Symbolic Layout
417(1)
Gate-matrix Layout
418(2)
Sticks Layout and Compaction
420(1)
Virtual-grid Symbolic Layout
421(2)
Process Migration---Retargetting Designs
423(1)
Design Methods
424(13)
Behavioral Synthesis
424(1)
RTL Synthesis
425(2)
Logic Optimization
427(4)
Structural-to-Layout Synthesis
431(1)
Placement
431(1)
Routing
431(1)
An Automatic Placement Example
432(2)
Layout Synthesis
434(3)
Design-capture Tools
437(3)
HDL Design
437(1)
Schematic Design
438(1)
Layout Design
438(1)
Floorplanning
438(1)
Chip Composition
439(1)
Design Verification Tools
440(9)
Simulation
441(1)
Circuit-level Simulation
441(1)
Timing Simulation
442(1)
Logic-level Simulation
443(1)
Switch-level Simulation
444(1)
Mixed-mode Simulators
444(1)
Summary
445(1)
Timing Verifiers
445(1)
Network Isomorphism
446(1)
Netlist comparison
447(1)
Layout Extraction
448(1)
Back-Annotation
448(1)
Design-rule Verification
448(1)
Pattern Generation
448(1)
Design Economics
449(7)
Nonrecurring Engineering Costs (NREs)
450(1)
Engineering Costs
450(1)
Prototype Manufacturing Costs
451(1)
Recurring Costs
452(1)
Fixed Costs
452(1)
Schedule
453(1)
Personpower
454(1)
An Example---Gate-array Productivity
454(2)
Data Sheets
456(2)
The Summary
456(1)
Pinout
456(1)
Description of Operation
457(1)
DC Specifications
457(1)
AC Specifications
457(1)
Package Diagram
458(1)
Summary
458(1)
Exercises
458(1)
References
459(6)
CMOS Testing
465(48)
The Need for Testing
465(6)
Functionality Tests
466(2)
Manufacturing Tests
468
A Walk Through the Test Process
456(15)
Manufacturing Test Principles
471(14)
Fault models
472(1)
Stuck-At Faults
472(1)
Short-Circuit and Open-Circuit Faults
473(1)
Observability
474(1)
Controllability
475(1)
Fault Coverage
475(1)
Automatic Test Pattern Generation (ATPG)
476(5)
Fault Grading and Fault Simulation
481(1)
Delay Fault Testing
482(1)
Statistical Fault Analysis
483(1)
Fault Sampling
484(1)
Design Strategies for Test
485(13)
Design for Testability
485(1)
Ad-Hoc Testing
485(4)
Scan-Based Test Techniques
489(1)
Level Sensitive Scan Design (LSSD)
489(1)
Serial Scan
490(3)
Partial Serial Scan
493(1)
Parallel Scan
493(2)
Self-Test Techniques
495(1)
Signature Analysis and BILBO
495(2)
Memory Self-Test
497(1)
Iterative Logic Array Testing
498(1)
IDDQ Testing
498(1)
Chip-Level Test Techniques
498(2)
Regular Logic Arrays
499(1)
Memories
500(1)
Random logic
500(1)
System-Level Test Techniques
500(6)
Boundary Scan
500(1)
Introduction
500(1)
The Test Access Port (TAP)
501(1)
The Test Architecture
502(1)
The Tap Controller
502(1)
The Instruction Register (IR)
503(1)
Test-Data Registers (DRs)
504(1)
Boundary Scan Registers
504(2)
Summary
506(1)
Layout Design for Improved Testability
506(2)
Summary
508(1)
Exercises
508(1)
References
508(5)
CMOS Subsystem Design
513(112)
Introduction
513(1)
Datpath Operations
513(50)
Addition/Subtraction
515(1)
Single-Bit Adders
515(2)
Bit-Parallel Adder
517(3)
Bit Serial Adders, Carry-save Addition, and Pipelining
520(4)
Transmission-Gate Adder
524(2)
Carry-Lookahead Adders
526(6)
Carry-Select Adder
532(1)
Conditional-Sum Adder
532(2)
Very Wide Adders
534(2)
Summary
536(1)
Parity Generators
537(1)
Comparators
537(1)
Zero/One Detectors
537(2)
Binary Counters
539(1)
Asynchronous Counters
539(1)
Synchronous Counters
539(2)
Boolean Operations---ALUs
541(1)
Multiplication
542(3)
Array Multiplication
545(2)
Radix-n Multiplication
547(7)
Wallace Tree Multiplication
554(3)
Serial Multiplication
557(3)
Shifters
560(3)
Memory Elements
563(27)
Read/Write Memory
564(1)
RAM
564(16)
Register Files
580(2)
FIFOs, LIFOs, SIPOs
582(1)
Serial-Access Memory
583(2)
Read Only Memory
585(4)
Content-Addressable Memory
589(1)
Control
590(30)
Finite-State Machines
591(1)
FSM Design Procedure
591(4)
Control Logic Implementation
595(1)
PLA Control Implementation
595(7)
ROM Control Implementation
602(2)
Multilevel Logic
604(1)
An Example of Control-Logic Implementation
604(16)
Summary
620(1)
Exercises
621(1)
References
622(3)
PART 3 CMOS SYSTEM CASE STUDIES 625(78)
CMOS System Design Examples
627(76)
Introduction
627(1)
A Core RISC Microcontroller
628(44)
Instruction Set
629(1)
Address Architecture
629(2)
ALU Class Instructions
631(2)
Control Transfer Instructions
633(1)
Pipeline Architecture
634(3)
Bypassing, Result Forwarding, or Pass-around
637(1)
Conditional Branching
638(1)
Subroutine Call and Return
639(1)
I/O Architecture
639(1)
Major Logic Blocks
640(1)
ALU_DP
640(11)
Register File
651(3)
PC Datapath (PC_DP)
654(2)
Instruction Memory
656(1)
Instruction Pipe
656(2)
Control Logic
658(5)
Layout
663(3)
Datapath Floorplans
666(3)
Functional Verification and Testing
669(3)
A TV Echo Canceller
672(22)
Ghost Cancellation
672(2)
FIR and IIR filters
674(2)
System Architecture
676(1)
Chip Architecture
677(1)
Filter Considerations
677(1)
Chip Overview
678(2)
Submodules
680(1)
Filter Taps
680(5)
Delay Lines
685(1)
Phase-locked Loop- and Clock-generation
685(4)
Peripheral Processing
689(1)
Power Distribution
689(1)
Chip Floorplan
690(2)
Testing and Verification
692(2)
Summary
694(1)
A 6-bit Flash A/D
694(7)
Introduction
694(1)
Basic Architecture
695(1)
Resistor String
696(1)
The Comparator
696(2)
Thermometer Code Logic
698(1)
Floorplan and Layout
698(3)
Summary
701(1)
Summary
701(1)
Exercises
701(1)
References
702(1)
Index 703


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