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A Personal Foreword | p. vii |
Preface to the First Edition | p. xiii |
Acknowledgment | p. xv |
Introduction | p. 1 |
Motivation | p. 1 |
Definition of Optical Pump and Probe | p. 4 |
Guideline | p. 4 |
Matrix of Laser Effects and Applications | p. 5 |
Historical Survey of Optical Ultra-fast Metrology | p. 6 |
Metrology Techniques Before the Advent of Laser | p. 6 |
Ultra-fast Pump and Probe Metrology | p. 7 |
Ultra-fast Engineering Working Tools | p. 11 |
Ultra-fast Laser Sources | p. 11 |
General Aspects for Ultra-precise Engineering | p. 12 |
General Aspects on Ultra-fast Lasers for Ultra-fast Metrology | p. 13 |
Laser Oscillator | p. 15 |
Rod and Disk Solid-State Laser | p. 15 |
Fiber Oscillator | p. 16 |
Amplifier | p. 18 |
Amplification Media | p. 18 |
Chirped-Pulse Amplification (CPA) | p. 18 |
Optical Parametric Chirped-Pulse Amplification (OPCPA) | p. 19 |
Amplifier Designs | p. 20 |
Commercial Systems | p. 24 |
Facilities | p. 25 |
Focusing of Ultra-fast Laser Radiation | p. 26 |
Ultra-small Laser Focus | p. 26 |
Gaussian Beam | p. 27 |
Beam Parameters of Gaussian Radiation | p. 29 |
Pulse Duration | p. 32 |
Beam Stability | p. 34 |
Key Parameters for Ultra-precision Machining and Diagnostics | p. 35 |
Ultra-precise Machining | p. 35 |
Ultra-fast Pump and Probe Diagnostics for Mechanical Engineering | p. 36 |
Beam Positioning and Scanning | p. 36 |
Positioning | p. 37 |
Scanning Systems | p. 39 |
New Challenges to Ultra-fast Metrology | p. 41 |
Temporal Domain | p. 42 |
Spatial Domain | p. 42 |
Domains of Optical Pump and Probe Techniques for Process Diagnosis | p. 43 |
Fundamentals of Laser Interaction | p. 45 |
Linear to Non-linear Optics | p. 45 |
Linear Optics: Group Velocity Dispersion and Chirp | p. 45 |
Non-linear Processes | p. 48 |
Non-linear Polarization | p. 48 |
Self-focusing | p. 49 |
Spectral Broadening by Self-phase Modulation | p. 51 |
Catastrophic Self-focusing | p. 53 |
High-Power Photon-Matter Interaction | p. 54 |
Absorption of Laser Radiation in Matter | p. 54 |
Energy Transfer from Electrons to Matter | p. 56 |
Melting and Vaporization | p. 58 |
Melt Dynamics | p. 60 |
Onset of Ablation | p. 62 |
Ionization | p. 63 |
Matching of Plasma Dynamics on Ultra-fast Time-Scale | p. 64 |
Absorption of Radiation in a Plasma | p. 64 |
Electromagnetic Waves in Plasmas | p. 64 |
Inverse Bremsstrahlung | p. 66 |
Plasma Heating | p. 69 |
Ionization of a Plasma | p. 72 |
Cross-Section and Collision Frequency | p. 73 |
Electron Transitions and Energy Transport | p. 74 |
The Total Emission | p. 76 |
The Opacity | p. 76 |
Dielectric Function of a Plasma | p. 77 |
Ponderomotive Force | p. 78 |
Fundamentals of Pump and Probe | p. 81 |
Ultra-fast Laser Radiation | p. 81 |
Beam Propagation | p. 82 |
Dispersion | p. 82 |
Coherence | p. 83 |
Preparation of States and Conditions for Probe Beams | p. 85 |
Preparation of States | p. 86 |
Preparation of States by Spectro-Temporal Shaping | p. 86 |
Measurement of States | p. 88 |
Measurement of Radiation Properties | p. 89 |
Pulse Duration | p. 89 |
Spectral Phase | p. 90 |
Imaging with Ultra-fast Laser Radiation | p. 91 |
Diffraction Theory and Incoherent Illumination | p. 91 |
Image Formation by Microscopy and Coherent Illumination | p. 95 |
Temporal Delaying | p. 97 |
Mechanical Delay | p. 98 |
Single-Pass Delay Stage | p. 98 |
Multi-Pass Delay Stage | p. 99 |
Mechanical Optoelectronic Scanning | p. 101 |
Non-mechanical Delay | p. 101 |
Free-Running Lasers | p. 102 |
Synchronized Lasers | p. 103 |
Examples for Ultra-fast Detection Methods | p. 105 |
Non-imaging Detection | p. 106 |
Transient Absorption Spectroscopy (TAS) | p. 106 |
Principle and Setup | p. 106 |
Characterization of the White-Light Continuum | p. 108 |
Measurement by TAS | p. 112 |
Temporal Shaped Pulses | p. 113 |
Principle and Setup | p. 113 |
Characterization of the Si-K¿-Radiation Source | p. 115 |
Imaging Detection | p. 118 |
Non-coherent Methods | p. 119 |
Shadowgraphy | p. 119 |
Transient Quantitative Phase Microscopy (TQPm) | p. 120 |
Coherent Methods | p. 124 |
Mach-Zehnder Micro-Interferometry | p. 124 |
Speckle Microscopy | p. 127 |
Nomarsky Microscopy | p. 129 |
Applications of Pump and Probe Metrology | p. 133 |
Drilling of Metals | p. 134 |
Introduction | p. 134 |
Measurement of Ejected Plasma, Vapor and Melt | p. 134 |
Microstructuring of Metals | p. 137 |
Introduction | p. 137 |
Detection of Plasma Dynamics | p. 138 |
Marking of Glass | p. 140 |
Introduction | p. 140 |
Detection of Laser-Induced Defects | p. 141 |
Detection of Refractive-Index Changes and Cracking | p. 143 |
Welding of Technical Glasses and Silicon | p. 145 |
Introduction | p. 145 |
Detection of Laser-Induced Melting | p. 146 |
Perspectives for the Future | p. 151 |
Laser and Other Sources | p. 152 |
Methodology | p. 153 |
Scanning Technology | p. 153 |
Spatial Scanning | p. 153 |
Temporal Scanning | p. 153 |
Beam Shaping | p. 153 |
Spatial Shaping | p. 153 |
Temporal Shaping | p. 154 |
Summary | p. 155 |
Lock-in Amplifier | p. 159 |
Onset on Optics | p. 161 |
Abbe Sine Condition | p. 161 |
Quantitative Phase Microscopy | p. 162 |
Plasma Parameters | p. 165 |
Transport Coefficients | p. 165 |
Electrical Conductivity | p. 165 |
Thermal Conductivity | p. 165 |
Diffusivity of Electrons | p. 166 |
Viscosity | p. 167 |
Debye Length | p. 168 |
Plasma Oscillations and Waves | p. 169 |
Coupling Between Electrons and Ions | p. 171 |
Hydrodynamic Instabilities | p. 172 |
Facilities | p. 173 |
List of Abbreviations and Symbols | p. 177 |
Abbreviations | p. 177 |
Symbols | p. 178 |
References | p. 183 |
Glossary | p. 195 |
Index | p. 199 |
Table of Contents provided by Ingram. All Rights Reserved. |
The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.