Capitalism at Risk

by Bower, Joseph L.; Leonard, Herman B.; Paine, Lynn S.

• ISBN13: 9781422130032
• ISBN10: 1422130037
• Format: Hardcover
• Copyright: 2011-10-04
• Publisher: Harvard Business School Pr

Summary

The spread of capitalism worldwide has made people wealthier than ever before. But capitalism'¬"s future is far from assured. The global financial meltdown of 2008 nearly produced a great depression. Economies in Europe are still teetering. Income inequality, resource depletion, mass migrations from poor to rich countries, religious fundamentalism these are just a few of the threats to continuing prosperity. How can capitalism be sustained? And who should spearhead the effort? Criticsturn to government. In Capitalism at Risk, Harvard Business School professors Joseph Bower, Herman Leonard, and Lynn Paine argue that while governments must play a role, businesses should take the lead. For enterprising companies whether large multinationals, established regional players, or small start-ups the current threats to market capitalism present important opportunities. Capitalism at Riskdraws on discussions with business leaders around the world to identify ten potential disruptors of the global market system. Presenting examples of companies already making a difference, the authors explain how business must serve both as innovator and activist developing corporate strategies that effect change at the community, national, and international levels. Filled with rich insights, Capitalism at Riskpresents a compelling and constructive vision for the future of market capitalism.

Table of Contents

Preface and Acknowledgments	p. vii
The Future of Market Capitalism
Introduction	p. 3
A Projection of Global Prospects	p. 19
Threats to the Global Market System	p. 43
Seeing the Threats as Systemic	p. 85
How Business Can Lead
The Business Response	p. 105
Leading Through Innovative Business Models	p. 125
Leading Through Institutional Activism	p. 153
Rethinking the Role of Business	p. 185
Appendix	p. 213
Notes	p. 217
Index	p. 227
About the Authors	p. 253
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