Handbook of Surface and Interface Analysis: Methods for Problem-Solving, Second Edition

by ;
  • ISBN13:


  • ISBN10:


  • Edition: 2nd
  • Format: Hardcover
  • Copyright: 2009-06-24
  • Publisher: CRC Press

Note: Supplemental materials are not guaranteed with Rental or Used book purchases.

Purchase Benefits

  • Free Shipping On Orders Over $35!
    Your order must be $35 or more to qualify for free economy shipping. Bulk sales, PO's, Marketplace items, eBooks and apparel do not qualify for this offer.
  • Get Rewarded for Ordering Your Textbooks! Enroll Now
List Price: $200.00 Save up to $173.62
  • Rent Book $180.00
    Add to Cart Free Shipping


Supplemental Materials

What is included with this book?

  • The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
  • The Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.


The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.

Table of Contents

Prefacep. vii
Editorsp. xi
Contributorsp. xiii
Authorsp. xv
Introductionp. 1
Problem Solving: Strategy, Tactics, and Resourcesp. 7
Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS)p. 19
Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)p. 65
Surface and Interface Analysis by Scanning Probe Microscopyp. 97
Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachmentsp. 139
Synchrotron-Based Techniquesp. 193
Quantification of Surface and Near-Surface Composition by AES and XPSp. 223
Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopyp. 245
In-Depth Analysis/Profilingp. 281
Characterization of Nanostructured Materialsp. 319
Problem-Solving Methods in Tribology with Surface-Specific Techniquesp. 351
Problem-Solving Methods in Metallurgy with Surface Analysisp. 389
Compositesp. 421
Minerals, Ceramics, and Glassesp. 457
Catalyst Characterizationp. 501
Surface Analysis of Biomaterialsp. 529
Adhesion Science and Technologyp. 565
Electron Spectroscopy in Corrosion Sciencep. 603
Indexp. 635
Table of Contents provided by Ingram. All Rights Reserved.

Rewards Program

Write a Review