9780199796212

An Introduction to Mixed-Signal IC Test and Measurement

by ; ;
  • ISBN13:

    9780199796212

  • ISBN10:

    0199796211

  • Edition: 2nd
  • Format: Hardcover
  • Copyright: 2011-10-14
  • Publisher: Oxford University Press

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Supplemental Materials

What is included with this book?

  • The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
  • The Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.

Summary

With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems.

Author Biography


Gordon Roberts is James McGill Professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. Dr. Roberts has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, Second Edition, with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books.

Friedrich Taenzler is an RF-Engineering Manager at Texas Instruments and a major contributor in the field of RF testing and design.

Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area.

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