Materials Characterization - Introduction to Micro Scopic and Spectroscopic Methods

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  • Edition: 1st
  • Format: eBook
  • Copyright: 2010-01-29
  • Publisher: Wiley

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Author Biography

Yang Leng is a Professor of Materials Science at Hong Kong University of Science and Technology. His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has authored nearly 80 papers in international journals and has been granted two US patents. In addition, he commissioned more than a dozen industrial reports. His contribution to teaching materials science is exemplified by the Teaching Excellence Appreciation award from the HKUST.

Table of Contents

Part One: Microstructure Examinations.

Light microscopy.

X-ray diffraction methods.

Transmission electron microscopy.

Scanning electron microscopy.

Scanning probe microscopy.

Part Two: Chemical and Thermal Analysis.

X-Ray Spectroscopy for Elemental Analysis.

Electron Spectroscopy for Surface Analysis.

Secondary Ion Mass Spectrometry for Surface Analysis.

Vibrational Spectroscopy for Molecular Analysis.

Thermal analysis.

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