Near Field Optics and Nanoscopy

by Fillard, J. P.

• ISBN13: 9789810223496
• ISBN10: 9810223498
• Format: Hardcover
• Copyright: 1996-12-01
• Publisher: WORLD SCIENTIFIC PUB CO INC

Summary

The aim of the book is to set out the basic information related to the photonic NF and also present the most recent results in the different fields and particularly in photonic scanning probe microscopy ( a new solution to nanoscopy).

Table of Contents

Foreword	vii	(8)
Notations, Abbreviations and Symbols	xv
Introduction	1	(6)
Chapter 1 Electromagnetic Waves	7	(68)
1.1. Theory of light in vacuum and matter	7	(13)
1.1.1. Maxwell-Helmholtz propagation	8	(3)
1.1.2. Vector waves	11	(3)
1.1.3. Light in matter: collective and quantum approaches	14	(6)
1.2. Interfaces	20	(21)
1.2.1. Reflection, refraction and evanescent waves	21	(9)
1.2.2. Dielectric multilayered structures	30	(5)
1.2.3. Surface microroughness and optical scattering	35	(6)
1.3. Diffraction	41	(27)
1.3.1. Diffraction in the Far Field	41	(8)
1.3.2. Angular spectrum of the e.m. diffracted waves	49	(4)
1.3.3. Diffraction in the Near Field	53	(15)
1.4. Dipolar antenna and the e.m. fields	68	(7)
1.4.1. Calculation of the radiated fields	68	(5)
1.4.2. Structure of the Near Field	73	(2)
Chapter 2 Digital Imaging and Image Processing	75	(34)
2.1. Image constitution and display	76	(9)
2.1.1. Spatial sampling	76	(5)
2.1.2. Image representation	81	(1)
2.1.3. Intensity quantization	82	(1)
2.1.4. Image imperfections	83	(1)
2.1.5. Qualification of images	84	(1)
2.2. Images as an information vehicle	85	(4)
2.2.1. Information theory guidelines	85	(2)
2.2.2. Optimization of images	87	(2)
2.3. Images and Linear System Theory	89	(11)
2.3.1. Linear System Theory	89	(2)
2.3.2. Point Spread Function and Optical Transfer Function	91	(1)
2.3.3. Image resolutions	92	(2)
2.3.4. Discrete Fourier Transform (DFT)	94	(6)
2.4. Computer processing of images	100	(6)
2.4.1. Statistical methods	100	(1)
2.4.2. Frequency transformations	101	(2)
2.4.3. Morphological transformations	103	(3)
2.5. Image processing in Nanoscopy instruments	106	(3)
2.5.1. Nanoscopy images	106	(1)
2.5.2. Instrument software facilities	107	(2)
Chapter 3 Electronic and Optical Tunnel Effect	109	(44)
3.1. Near Field optical transmission	109	(10)
3.1.1. Dielectric Capture Model	109	(6)
3.1.2. Surface layers and interferences	115	(2)
3.1.3. Photonic band gap	117	(2)
3.2. Plasmons	119	(15)
3.2.1. Surface plasmon dispersion relation	119	(2)
3.2.2. Smooth surfaces	121	(5)
3.2.3. Corrugated surfaces and protrusions	126	(1)
3.2.4. Surface plasmons in Nanoscopy imaging	127	(7)
3.3. Electron and photon tunnel effect	134	(10)
3.3.1. Quantum tunneling	134	(5)
3.3.2. Photon tunneling	139	(2)
3.3.3. Electron-Photon interaction	141	(3)
3.4. Virtual photons in the Near Field	144	(9)
3.4.1. Virtual photons	144	(3)
3.4.2. Radiation strength	147	(1)
3.4.3. Atomic traps	148	(1)
3.4.4. Optical binding	149	(4)
Chapter 4 Optical Microscopy and Nanoscopy	153	(68)
4.1. Lens imaging	154	(9)
4.1.1. Far Field lens transmission	154	(3)
4.1.2. Far Field image generation	157	(5)
4.1.3. Point sources of light	162	(1)
4.2. Three-dimensional optical microscopy	163	(9)
4.2.1. Resolution limits and sectioning	163	(4)
4.2.2. Missing cone of frequencies	167	(3)
4.2.3. Three-dimensional computer microscopy	170	(2)
4.3. Scanning Confocal Microscopy (SCM)	172	(7)
4.3.1. Confocal methods	172	(4)
4.3.2. Resolution and band pass	176	(2)
4.3.3. Three-dimensional SCM	178	(1)
4.4. Scattering Microscopy	179	(18)
4.4.1. Dark field scattering microscopy	180	(5)
4.4.2. Laser Scanning Tomography	185	(12)
4.5. Axial interferometry microscopy	197	(17)
4.5.1. Phase stepping microscopy	198	(9)
4.5.2. Coherent probe techniques	207	(7)
4.6. Near Field lens microscopy	214	(7)
4.6.1. Photon Tunneling Microscopy (PTM)	214	(3)
4.6.2. Multisource scanning	217	(4)
Chapter 5 Scanning Probe Optical Microscopy	221	(52)
5.1. Scanning Probe Microscopy and STM	222	(5)
5.1.1. Scanning probe profiling	222	(1)
5.1.2. Scanning Tunneling Microscopy (STM)	223	(3)
5.1.3. Optically assisted STM	226	(1)
5.2. AFM and SFM imaging	227	(10)
5.2.1. Atomic force fields	227	(5)
5.2.2. AFM imaging	232	(2)
5.2.3. Shear Force Microscopy (SFM)	234	(1)
5.2.4. AFM and SFM techniques	235	(2)
5.3. Evanescent wave interaction in PSTM	237	(21)
5.3.1. Roughness induced field distorsion in the evanescent NF	238	(7)
5.3.2. Tip coupling mechanisms	245	(6)
5.3.3. AFM tips as PSTM optical converters	251	(7)
5.4. Aperture Scanning Microscopy	258	(9)
5.4.1. SNOM	258	(4)
5.4.2. TNOM	262	(2)
5.4.3. RSOM	264	(3)
5.5. Apertureless Optical Microscopy	267	(6)
5.5.1. Transmission mode SIAM	268	(2)
5.5.2. Reflection mode modulation of amplitude	270	(3)
Chapter 6 Optical Converters, Probes and Nanodetectors	273	(36)
6.1. Optical fibers	273	(22)
6.1.1. Guided modes	273	(7)
6.1.2. Optical fibers	280	(4)
6.1.3. Optical fiber technology	284	(2)
6.1.4. OF tips as SOM probes	286	(7)
6.1.5. Optical microresonators	293	(2)
6.2. AFM probe technology	295	(9)
6.2.1. Nanofabrication of AFM tips	295	(5)
6.2.2. AFM supertips	300	(2)
6.2.3. Piezolevers	302	(2)
6.3. Nano photo electronic probes	304	(5)
6.3.1. Nano photo detectors	304	(3)
6.3.2. Nano photo emitters	307	(2)
Chapter 7 Near Field Optics	309	(34)
7.1. Optical probe cross-section and instrument resolution	310	(13)
7.1.1. Resolution of linear and invariant systems	310	(2)
7.1.2. Scanning probe microscopy	312	(3)
7.1.3. Range finder microscopy	315	(4)
7.1.4. Lateral resolution evaluation	319	(4)
7.2. Theoretical Near Field calculation methods	323	(20)
7.2.1. The Green Tensor approach	324	(8)
7.2.2. Multiple MultiPole method	332	(3)
7.2.3. Self-Consistent Microscopic approach	335	(8)
Chapter 8 Experimental Set-Up and Techniques	343	(30)
8.1. Nanodrive actuators	343	(12)
8.1.1. Piezoelectric effect	343	(4)
8.1.2. Translators for micropositioning	347	(2)
8.1.3. Piezoelectric actuators for scanning microscopy	349	(6)
8.2. Low temperature experiments	355	(3)
8.2.1. The early CSTM arrangements	356	(1)
8.2.2. Cryogenic SFM/SNOM	356	(2)
8.2.3. Localised laser emission from quantum wells	358	(1)
8.3. Optical Phase Contrast Modulation	358	(5)
8.3.1. Experimental set-up and operation	358	(3)
8.3.2. Phase Contrast Modulation results	361	(2)
8.4. Dithering techniques for SOM	363	(6)
8.5. Dedicated test objects	369	(4)
Chapter 9 Results, Constraints and Prospects in SOM Nanoscopy	373	(32)
9.1. Achieved high resolution specifications	373	(6)
9.1.1. High resolution SOM	374	(1)
9.1.2. Optical aperture evaluation	375	(4)
9.2. NF optics for semiconductor technology	379	(8)
9.2.1. Integrated waveguide observation	379	(3)
9.2.2. Minority carriers in semiconductor junctions	382	(3)
9.2.3. Optical confinement analysis	385	(2)
9.3. NFO in semiconductor technology	387	(8)
9.3.1. Optical data storage	388	(3)
9.3.2. Nanolithography	391	(4)
9.4. Biology and biochemistry applications of NFO	395	(10)
9.4.1. Specific microprobes and instruments	396	(1)
9.4.2. Tests and calibrations	397	(2)
9.4.3. Single molecule analysis	399	(4)
9.4.4. In-vivo and liquid environment investigations	403	(2)
Appendices	405	(14)
Appendix-1 Radial symmetry in optical systems	405	(3)
Appendix-2 Green formula	408	(2)
Appendix-3 Calculation of the coefficient T0	410	(3)
Appendix-4 Fourier correspondences in diffraction limited optical systems	413	(2)
Appendix-5 Dyson equation and operational solution	415	(4)
References	419	(16)
Subject Index	435