9780750687577

Platform Interference in Wireless Systems : Models, Measurement, and Mitigation

by ;
  • ISBN13:

    9780750687577

  • ISBN10:

    0750687576

  • Format: Hardcover
  • Copyright: 2008-04-25
  • Publisher: Elsevier Science Ltd

Note: Supplemental materials are not guaranteed with Rental or Used book purchases.

Purchase Benefits

  • Free Shipping On Orders Over $35!
    Your order must be $35 or more to qualify for free economy shipping. Bulk sales, PO's, Marketplace items, eBooks and apparel do not qualify for this offer.
  • Get Rewarded for Ordering Your Textbooks! Enroll Now
List Price: $97.95 Save up to $9.79
  • Rent Book $88.16
    Add to Cart Free Shipping

    TERM
    PRICE
    DUE
    USUALLY SHIPS IN 3-5 BUSINESS DAYS

Supplemental Materials

What is included with this book?

Summary

Intra-system EMC problems are becoming increasingly common in mobile devices, ranging from notebook PCs to cell phones, with RF/wireless capbilities. These issues range from minor annoyances to serious glitches which impede the functioning of the device. This book gives a thourough review of electromagnetic theory (including Maxwell's equations), discusses possible sources and causes of intra-system interference, shows to use models and analysis to discover potential sources of intra-system EMC in a design, how to use appropriate tests and measurements to detect intra-system EMC problems, and finally extensively discusses measures to mitigate or totally eliminate intra-system EMC problems. With more and more mobile devices incorporating wirless capability (often with multiple wireless systems, such as Bluetooth and WiFi), this book should be part of the reference shelf of every RF/wireless engineer and mobile device designer. *Throughouly describes sources of intra-system interference in RF/wireless devices and how to minimize them for maximum device performance *Gives proven techniques for interference mitigation, ranging from the simple (component placement and cable routing) to the advanced (such as the use of shielding and signal absorption materials) *Discusses modeling and analysis methods to predict likely sources of intras-system EMC *Explains test and measurement techniques to detect intra-system EMC problems.

Table of Contents

Prefacep. ix
Introductionp. 1
Setting The Scenep. 1
Wireless vs. EMIp. 2
Addressing the Fundamentalsp. 4
Platform Interference: Describing the Problemp. 6
Platform RF Snapshotsp. 26
Platform RF Sources: Summing It All Upp. 34
The Structure of Signalsp. 37
Time has Little To Do with Infinity and Jelly Doughnutsp. 37
Platform Signals: Preliminaries in Spectral Analysisp. 38
Harmonic Variation with Timep. 40
Variation with Duty Cyclep. 43
Nonrepetitive Signalsp. 55
Modifying a Clockp. 57
Random Data Sequences as Signalsp. 59
Spectra of Display Symbolsp. 66
Summaryp. 75
Referencesp. 76
Analysis of Symbolsp. 77
When People Finally Come to Understand your Vision...It's Time for a New Visionp. 77
Analysis of Display Symbols Part IIp. 92
Justification for the Differential Operatorp. 102
Wireless Performance in the Presence of Radiated Emissions from Digital Display Symbolsp. 104
Developing the Analysis of Differential Symbolsp. 107
The Impact of Pulse Width and Edge Rate Jitter on the Expected EMI/RFIp. 113
Summaryp. 119
Referencesp. 119
Measurement Methodsp. 121
One Measurement is Worth a Thousand Opinionsp. 121
Near-field Scans of Clock ICsp. 128
Measurements Beyond the Near Field: Transition Regionp. 133
The Near-Field, Far-Field Transitionp. 133
Far-field Measurementsp. 141
Other Measurement Methodsp. 142
Summaryp. 145
Referencesp. 145
Electromagneticsp. 147
He Must Go by Another Way Who Would Escape This Wildernessp. 147
The Time-Varying Maxwell's Equationsp. 154
Electric and Magnetic potentialsp. 156
Radiation Mechanismsp. 158
Referencesp. 163
Analytical Modelsp. 165
Honest Analysis Gets in the Way of Results Desired Emotionallyp. 165
The Electric Dipolep. 165
Field Impedance of the Elementary Electric Dipolep. 172
The Extended Dipole Radiatorp. 174
The Magnetic Dipolep. 180
Developing Simple Analytical Structures for Real Devicesp. 185
Developing Channel Modelsp. 196
Summaryp. 210
Referencesp. 210
Connectors, Cables, and Power Planesp. 213
Chance and Caprice Rule the Worldp. 213
Power Distribution Radiated Emissionsp. 215
Investigating the Radiated Emissions Potentials of Power Distributions in Packages and Siliconp. 229
Further Investigations with Various Power Topologiesp. 237
Substrate Noisep. 245
Summaryp. 251
Referencesp. 251
Passive Mitigation Techniquesp. 253
Introductionp. 253
Passive Mitigationp. 254
Shieldingp. 254
Absorbersp. 276
Layoutp. 281
Referencesp. 289
Active Mitigationp. 291
Frequency Planningp. 291
Frequency Contentp. 297
Spread Spectrum Clockingp. 301
Radio Improvementsp. 305
Noise Estimationp. 306
Closing Remarksp. 308
Referencesp. 309
Appendixp. 311
Indexp. 329
Table of Contents provided by Ingram. All Rights Reserved.

Rewards Program

Write a Review