Applications and Metrology at Nanometer Scale 1 Smart Materials, Electromagnetic Waves and Uncertainties

by Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak

• ISBN13: 9781786306401
• ISBN10: 1786306409
• Edition: 1st
• Format: Hardcover

• New Textbook Copy Print on Demand: 2-4 Weeks. This item cannot be cancelled or returned.
• Free Shipping On Orders Over $35!

Applications and Metrology at Nanometer-Scale 2 Measurement Systems, Quantum Engineering and RBDO Method

by Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak

• ISBN13: 9781786306876
• ISBN10: 1786306875
• Edition: 1st
• Format: Hardcover

• New Textbook Copy Print on Demand: 2-4 Weeks. This item cannot be cancelled or returned.
• Free Shipping On Orders Over $35!

Applications and Metrology at Nanometer Scale 1

by Pierre Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami

• ISBN13: 9781119808244
• ISBN10: 1119808243
• Format: Nonspecific Binding

Applications and Metrology at Nanometer-Scale 2

by Pierre-Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami

• ISBN13: 9781119818984
• ISBN10: 1119818982
• Format: Nonspecific Binding