Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices

by Sikula, Josef; Levinshtein, Michael E.

• ISBN13: 9781402021688
• ISBN10: 1402021682
• Format: Hardcover
• Copyright: 2004-08-01
• Publisher: Kluwer Academic Pub

Summary

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

Table of Contents

PREFACE	ix
I. Noise Sources
1/f Noise Sources	3	(8)
F.N. Hooge
Noise Sources in GaN/AlGaN Quantum Wells and Devices	11	(8)
S. Rumyantsev
1/f Noise in Nanomaterials and Nanostructures: Old Questions in a New Fashion	19	(10)
M.N. Mihaila
1/f Spectra as a Consequence of the Randomness of Variance	29	(8)
G. Härtler
Quantum Phase Locking, 1/f Noise and Entanglement	37	(8)
M. Planat and H. Rosu
Shot Noise in Mesoscopic Devices and Quantum Dot Networks	45	(8)
M. Macucci, P. Marconcini, G. Iannaccone, M. Gattobigio, G. Basso and B. Pellegrini
Super-Poissonian Noise in Nanostructures	53	(8)
Ya. M. Blanter
Stochastic and Deterministic Models of Noise	61	(10)
J. Kumicák
II. Noise in Nanoscale Devices
Noise in Optoelectronic Devices	71	(8)
R. Alabedra
Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers	79	(10)
S. Pralgauskaite, V. Palenskis and J. Matukas
Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels	89	(8)
A. Matulionis
Noise of High Temperature Superconducting Bolometers	97	(12)
I.A. Khrebtov
1/f Noise in MOSTs: Faster is Noisier	109	(12)
L.K.J. Vandamme
Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs	121	(8)
E. Simoen, A. Mercha and C. Claeys
Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs	129	(8)
N. Lukyanchikova, E. Simoen, A. Mercha and C. Claeys
Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors	137	(8)
S. Ferraton, L. Montès, I. Ionica, J. Zimmermann, and J.A. Chroboczek
Noise Modelling in Low Dimensional Electronic Structures	145	(8)
L. Reggiani, V. Ya. Aleshkin and A. Reklaitis
Correlation Noise Measurements and Modeling of Nanoscale MOSFETs	153	(8)
J. Lee and G. Bosman
Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs	161	(8)
M. Levinshtein, S. Rumyantsev and M.S. Shur
High Frequency Noise Sources Extraction in Nanometique MOSFETs	169	(8)
F. Danneville, G. Pailloncy and G. Dambrine
Informative "Passport Data" of Surface Nano- and Microstructures	177	(12)
S.F. Timashev, A.B. Solovieva and G. V. Vstovsky
III. Noise Measurement Technique
Noise Measurement Techniques	189	(14)
L.K.J. Vandamme
Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures	203	(8)
B. Pellegrini, G. Basso and M. Macucci
Correlation Spectrum Analyzer: Principles and Limits in Noise Measurements	211	(8)
G. Ferrari and M. Sampietro
Measurement and Analysis Methods for Random Telegraph Signals	219	(8)
Z. Çelik-Butler
RTS In Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation	227	(10)
J. Sikula, J. Pavelka, M. Tacano, S. Hashiguchi and M. Toita
Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region	237	(8)
J. Sikula, S. Hashiguchi, M. Ohki and M. Tacano
Measurements of Low Frequency Noise in Nano-Grained RuO2+Glass Films Below 1 K	245	(8)
A. Kolek
Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices	253	(8)
A. Yakimov, A. Belyakov, S. Medvedev, A. Moryashin and M. Perov
The Noise Background Suppression of Noise Measuring Set-Up	261	(10)
P. Hruska and K. Hajek
Accuracy of Noise Measurements for 1/f and GR Noise	271	(8)
I. Slaidinš
Radiofrequency and Microwave Noise Metrology	279	(8)
E. Rubiola and V. Giordano
Treatment of Noise Data in Laplace Plane	287	(6)
B.M. Grafov
Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation	293	(10)
L. Hasse
Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices	303	(8)
L. Spiralski, A. Szewczyk and L. Hasse
Hooge Mobility Fluctuations in n-InSb Magnetoresistors as a Reference for Access Resistance LF-Noise Measurements of Si Ge Metamorphic HMOS FETs	311	(8)
S. Durov, O.A. Mironov, M. Myronov, T.E. Whall, V.T. Igumenov, V.M. Konstantinov and V.V. Paramonov
Optimised Preamplifier for LF-Noise MOSFET Characterization	319	(8)
S. Durov and O.A. Mironov
Net of YBCO and LSMO Thermometers for Bolometric Applications	327	(10)
B. Guillet, L. Méchin, F. Yang, J.M. Routoure, G. Le Dem, C. Gunther, D. Robbes and R.A. Chakalov
Diagnostics of GaAs Light Emitting Diode pn Junctions	337	(8)
P. Koktavy and B. Koktavy
New Tools for Fast and Sensitive Noise Measurements	345	(10)
J. Sikula, M. Tacano, S. Yokokura and S. Hashiguchi
Using a Novel, Computer Controlled Automatic System for LF Noise Measurements under Point Probes	355	(8)
J.A. Chroboczek, S. Ferraton and G. Piantino
AUTHOR INDEX	363	(2)
SUBJECT INDEX	365