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9783540269090

Applied Scanning Probe Methods III

by ;
  • ISBN13:

    9783540269090

  • ISBN10:

    3540269096

  • Format: Hardcover
  • Copyright: 2006-04-30
  • Publisher: Springer Verlag

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Summary

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Table of Contents

12 Atomic Force Microscopy in Nanomedicine
Dessy Nikova, Tobias Lange, Hans Oberleithner, Hermann Schillers, Andreas Ebner, Peter Hinterdorfer
1(26)
12.1 AFM in Biological Sciences
1(3)
12.2 Plasma Membrane Preparation for AFM Imaging
4(6)
12.2.1 Introduction
4(1)
12.2.2 Plasma Membrane Preparation
5(2)
12.2.3 Atomic Force Microscopy
7(1)
12.2.4 Molecular Volume Measurements of Membrane Proteins
7(1)
12.2.5 AFM Imaging
7(3)
12.3 AFM Imaging of CFTR in Oocyte Membranes
10(6)
12.3.1 Introduction
11(1)
12.3.2 Does the CFTR Form Functional Assemblies?
11(2)
12.3.3 Two CFTRs are Better Than One
13(3)
12.4 Single Antibody—CFTR Recognition Imaging
16(3)
12.4.1 Introduction
16(1)
12.4.2 Tethering of Antibodies to AFM Tips
17(1)
12.4.3 AFM Imaging and Recognition
17(1)
12.4.4 A Single Antibody Sees a Single CFTR
17(2)
12.5 Single Cell Elasticity: Probing for Diseases
19(5)
12.5.1 Introduction
19(1)
12.5.2 Force—Mapping AFM
20(1)
12.5.3 Can One Protein Change Cell Elasticity?
21(3)
12.6 Summary
24(1)
References
24(3)
13 Scanning Probe Microscopy: From Living Cells to the Subatomic Range
Ille C. Gebeshuber, Manfred Drack, Friedrich Aumayr, Hannspeter Winter, Friedrich Franek
27(28)
13.1 Introduction
27(1)
13.2 Cells In Vivo as Exemplified by Diatoms
28(5)
13.2.1 Introduction to Diatoms
28(2)
13.2.2 SPM of Diatoms
30(3)
13.3 Interaction of Large Organic Molecules
33(4)
13.4 Nanodefects on Atomically Flat Surfaces
37(8)
13.4.1 Ion Bombardment of Highly Oriented Pyrolytic Graphite (HOPG)
38(4)
13.4.2 Bombardment of Single Crystal Insulators with Multicharged Ions
42(3)
13.5 Subatomic Features
45(5)
13.5.1 Atom Orbitals
45(2)
13.5.2 Single Electron Spin Detection with AFM and STM
47(3)
13.6 Conclusions and Outlook
50(1)
References
51(4)
14 Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces
Zachary Burton, Bharat Bhushan
55(28)
14.1 Introduction
55(3)
14.2 Experimental Details
58(5)
14.2.1 Instrumentation
58(1)
14.2.2 Samples
59(2)
14.2.3 Roughness Factor
61(1)
14.2.4 Test Matrix for Nanopatterned Polymers
62(1)
14.3 Results and Discussion
63(16)
14.3.1 Hydrophobic Leaf Surfaces
64(10)
14.3.2 Nanopatterned Polymers
74(5)
14.4 Summary
79(2)
References
81(2)
15 Probing Macromolecular Dynamics and the Influence of Finite Size Effects
Scott Sills, René M. Overney
83(48)
15.1 Introduction
84(1)
15.2 The Glass Transition and Molecular Mobility
85(5)
15.3 Macromolecular Probing Techniques
90(13)
15.3.1 Static Contacts
90(2)
15.3.2 Modulated Contacts
92(1)
15.3.3 Calibration of Lateral Forces in Scanning Probe Microscopy
93(4)
15.3.4 Shear Modulation Force Microscopy (SM-FM)
97(1)
15.3.5 Friction Force Microscopy (FFM)
98(1)
15.3.6 Tribological Models for FFM
99(4)
15.4 Internal Friction and Dynamics near the Glass Transition
103(6)
15.4.1 Molecular Relaxations
103(2)
15.4.2 Structural Heterogeneity and Relaxation near the Glass Transition
105(2)
15.4.3 Cooperative Molecular Motion During the Glass Transition
107(2)
15.5 Constraints and Structural Modifications near Interfaces
109(6)
15.5.1 Interfacial Plasticization
109(1)
15.5.2 Dewetting Kinetics
110(1)
15.5.3 Disentanglement Barriers
111(2)
15.5.4 Interfacial Glass Transition Profiles
113(2)
15.6 Mechanical Operations in Nanoscopic Polymer Systems
115(11)
15.6.1 Indentation Contact Mechanics
116(4)
15.6.2 Rim Formation During Indentation
120(2)
15.6.3 Strain Shielding and Confined Plasticity in Nanoscopic Polymer Systems
122(4)
15.7 Closing Remarks
126(1)
References
127(4)
16 Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum
Laurent Nony, Enrico Gnecco, Ernst Meyer
131(52)
16.1 Introduction
131(1)
16.2 Methods
132(10)
16.2.1 Organic Molecular Beam Epitaxy (OMBE)
132(2)
16.2.2 Scanning Tunneling Microscopy (STM)
134(3)
16.2.3 Atomic Force Microscopy (AFM)
137(5)
16.3 Molecules
142(3)
16.3.1 Fullerenes
142(1)
16.3.2 Porphyrins
142(1)
16.3.3 Phthalocyanines
142(2)
16.3.4 Perylene Derivatives
144(1)
16.3.5 Lander Molecules
144(1)
16.3.6 PVBA Molecules
144(1)
16.3.7 Decacyclene and Derivatives
144(1)
16.4 Molecules on Metals
145(17)
16.4.1 STM Investigations
145(12)
16.4.2 Non-Contact AFM Investigations
157(5)
16.5 Molecules on Semiconductor Surfaces
162(5)
16.5.1 STM Investigations
162(3)
16.5.2 Non-Contact AFM Investigations
165(2)
16.6 Molecules on Insulating Surfaces
167(4)
16.6.1 STM Investigations
168(1)
16.6.2 Non-contact AFM Investigations
169(2)
16.7 Manipulation of Single Molecules
171(4)
16.7.1 STM Investigations
171(4)
16.7.2 Non-contact AFM Investigations
175(1)
16.8 Conclusions
175(1)
References
176(7)
17 One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures
Luca Gavioli, Massimo Sancrotti
183(34)
17.1 Introduction
183(2)
17.2 Basic Principles of STM and STS
185(3)
17.3 Inorganic Overlayers
188(13)
17.3.1 1D Structures
188(8)
17.3.2 2D Structures
196(5)
17.4 Molecular Overlayers
201(11)
17.4.1 1D Structures
202(6)
17.4.2 2D Overlayers
208(4)
17.5 Conclusions
212(1)
References
212(5)
18 Scanning Probe Microscopy Applied to Ferroelectric Materials
Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini
217(44)
18.1 Introduction
217(1)
18.2 Development of Scanning Probe Techniques for Ferroelectrics
217(3)
18.3 Scanning Force Microscopy
220(15)
18.3.1 Non-Contact Mode
220(1)
18.3.2 Contact Mode
221(1)
18.3.3 Voltage-Modulated SFM
222(2)
18.3.4 Resonance Modes of EFM
224(4)
18.3.5 Lateral Force
228(4)
18.3.6 Frontal Force
232(1)
18.3.7 Second Harmonic
233(1)
18.3.8 Tapping Mode
234(1)
18.4 Scanning Optical Microscopy
235(12)
18.4.1 Pure Optical Microscopy
235(2)
18.4.2 Scanning Electrooptic Microscopy
237(5)
18.4.3 Near-Field Electrooptic Microscopy
242(2)
18.4.4 Micro-Spectroscopic Techniques
244(1)
18.4.5 Second Harmonic Microscopy
245(2)
18.5 Applications to Ferroelectrics
247(6)
18.5.1 Imaging of Domains and Domain Walls
247(1)
18.5.2 Writing Patterns
248(1)
18.5.3 Phase Transitions
249(1)
18.5.4 Morphotropic Phase Boundary
250(1)
18.5.5 Relaxors
251(1)
18.5.6 Thin Films
251(1)
18.5.7 Artificial Nanostructures
252(1)
18.6 Conclusions
253(1)
References
254(7)
19 Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
Renato Buzio, Ugo Valbusa
261(38)
19.1 Characterization of Surface Roughness by Atomic Force Microscopy
263(9)
19.1.1 Statistical Methods for Stationary Random Surfaces
264(2)
19.1.2 Statistical Methods for Fractal Surfaces
266(4)
19.1.3 Estimation of Morphological Parameters from AFM Topographies
270(2)
19.2 Modeling Contact Mechanics for Rough Surfaces
272(14)
19.2.1 Early Phenomenological Contact Theories
273(4)
19.2.2 Contact Mechanics Theories for Fractal Roughness
277(7)
19.2.3 On the Molecular Origins of Amontons' Law
284(2)
19.3 Investigations of Multi-Asperity Contacts by AFM
286(7)
19.3.1 AFM Characterization of Surface Roughness for Tribological Purposes
286(2)
19.3.2 Contact Mechanics Investigations at the Nanometer Scale
288(3)
19.3.3 Contact Mechanics Investigations on the Micrometer Scale
291(2)
19.4 Conclusions
293(1)
References
294(5)
20 AFM Applications for Contact and Wear Simulation
Nikolai K. Myshkin, Mark I. Petrokovets, Alexander V. Kovalev
299(28)
20.1 Introduction
299(1)
20.2 Scale Factor in Tribology
299(1)
20.3 AFM as a Tool of Contact Simulation
300(16)
20.3.1 Contact of Rough Surfaces
300(3)
20.3.2 Rough Contact with Adhesion
303(4)
20.3.3 Multilevel Contact Models
307(2)
20.3.4 Simulation of Contact Using AFM Images
309(3)
20.3.5 Nanomechanical Probing of Soft Layers
312(4)
20.4 AFM in Wear Simulation
316(7)
20.4.1 Nanoscratching and Nanowear with AFM Tip
317(3)
20.4.2 Wear Simulation in AFM Contact Mode
320(3)
20.5 Conclusions
323(1)
References
324(3)
21 AFM Applications for Analysis of Fullerene-Like Nanoparticles
Lev Rapoport, Armen Verdyan
327(16)
21.1 Introduction
327(1)
21.2 Instrumentation
328(2)
21.2.1 Friction Experiment
328(1)
21.2.2 AFM Experiment
329(1)
21.3 Characterization of Fullerene-Like Solid Lubricant Nanoparticles
330(1)
21.4 Friction of Solid Lubricant Films
331(2)
21.5 Friction and Wear of the Surfaces Lubricated with Oil + IF Nanoparticles
333(3)
21.6 Friction of IF Nanoparticles Under Severe Contact Conditions
336(3)
21.7 Mechanisms of Friction of the IF Nanoparticles
339(2)
21.8 Conclusions
341(1)
References
341(2)
22 Scanning Probe Methods in the Magnetic Tape Industry
James K. Knudsen
343(28)
22.1 Introduction
343(2)
22.2 Atomic Force Microscopy
345(13)
22.2.1 Topographic Characterization of the Magnetic Tape
345(4)
22.2.2 Topographic Characterization of Heads
349(2)
22.2.3 Tape Roughness Analysis
351(7)
22.3 Magnetic Force Microscopy
358(9)
22.3.1 Methodology
358(1)
22.3.2 Characterization of the Magnetic Tape with MFM
359(5)
22.3.3 Characterization of Heads with MFM
364(3)
22.4 Conclusions
367(1)
References
367(4)
Subject Index 371

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