Applied Scanning Probe Methods XI

by Bhushan, Bharat; Fuchs, Harald

• ISBN13: 9783540850366
• ISBN10: 3540850368
• Format: Hardcover
• Copyright: 2008-11-01
• Publisher: Springer Nature

Summary

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Table of Contents

J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM.- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies.- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements.- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip.- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations.- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.