Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I.; Newbury, Dale E.; Kchlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda
ISBN13: 9780306472923
ISBN10: 0306472929
More Details
Edition: 3rd
Format: Hardcover
Copyright: 12/1/2002
Publisher: Plenum Pub Corp
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