Dynamic Characterisation of Analogue-to-digital Converters

by Dallet, Dominique; Da Silva, Jose Machado

• ISBN13: 9780387259024
• ISBN10: 0387259023
• Format: Hardcover
• Copyright: 2005-12-30
• Publisher: Springer Verlag

Summary

The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for systema??s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCsa?? dynamic performance behaviour using sinusoidal stimuli. The three classical methods a?? histogram, sine wave fitting, and spectral analysis a?? are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.

Author Biography

Dallet, Dominique obtained his PhD degree in Electrical Engineering in 1995 from the University of Bordeaux 1, where he is currently a professor at the Electronic Engineering School of Bordeaux (ENSEIRB). His main research activities, carried-out at the IXL laboratory, focus on mixed-signal circuit design and testing, digital and analogue signal processing, and programmable devices' applications. His interests include also digital design and its application in BIST structures for the characterization of embedded A/D converters, as well as, digital signal processing applied to nondestructive techniques based on time-frequency representation.Machado da Silva, Jos+¬ received the Licenciatura and PhD, both in Electrical and Computer Engineering from the Faculdade de Engenharia da Universidade do Porto (FEUP), Portugal, in 1984 and 1998, respectively. He is currently an Assistant Professor at FEUP and a project leader at Instituto de Engenharia de Sistemas e de Computadores (INESC-Porto), with teaching and research responsibilities on design and testing of electronic circuits. His research interests include analogue and mixed-signal design for testability, new testing methodologies, analogue and digital signal processing, and VLSI design.

Table of Contents

Preface	ix
Contributing Authors	xi
Introduction	xv
Jose Machado da Silva
Glossary	xvii
Part I ADC Characterisation Based on Sinewave Analysis
ADC Applications, Architectures and Terminology	3	(44)
Jose Machado da Silva
Helio Mendonca
Introduction	3	(2)
ADCs' applications	5	(5)
ADCs' architectures	10	(5)
Terminology	15	(5)
Quantisation and A/D conversion	20	(7)
Output coding	27	(4)
Errors, non-linearity, noise, and distortion	31	(9)
Data acquisition and processing	40	(3)
Input characteristics	43	(4)
Sinewave Test Setup	47	(14)
Pierre-Yves Roy
Jacques Durand
Test Setup description	47	(2)
Specification of the clock and input signal	49	(7)
Example of filter specification	56	(1)
Filter selection	57	(2)
Taking a record of data	59	(2)
Time-Domain Data Analysis	61	(24)
Dominique Dallet
Djamel Haddadi
Philippe Marchegay
Introduction	61	(1)
Calculation of the dynamic parameters	62	(1)
Definitions	62	(1)
The fixed-frequency method	63	(2)
The four-parameter method	65	(5)
Definitions of THD and SNR	70	(1)
The multi-harmonic sine-wave fitting method	71	(2)
Estimation of the normalised angular frequency	73	(1)
Estimation of the linear parameters	74	(1)
On the rank of EP	75	(1)
The algorithm	76	(1)
Multitone test to circumvent signal purity problems	77	(8)
Frequency-Domain Data Analysis	85	(20)
Pierre-Yves Roy
Jacques Durand
Discrete Fourier Transform and Fast Fourier Transform	85	(1)
Choice of input and clock frequencies	86	(1)
Windowing	86	(2)
Comment on the accuracy of the input frequency	88	(2)
Record size	90	(2)
Calculation of ADC dynamic parameters in the frequency domain	92	(13)
Code Histogram Test	105	(52)
Giovanni Chiorboli
Carlo Morandi
Introduction	105	(3)
The sampling strategy and its contribution to count variance and measurement uncertainty	108	(7)
Additional contributions to count uncertainty: additive noise and Jitter	115	(7)
Factors affecting the p.d.f. of the input signal	122	(11)
Required record length and number of records, expression of measurement uncertainty	133	(6)
Choice of the coverage factor	139	(2)
Comparing the number of samples required by random and by synchronous sampling	141	(1)
Determining the transfer characteristic	142	(1)
Offset error and gain	143	(4)
Linearity errors	147	(1)
Appendix	148	(9)
Comparative Study of ADC Sinewave Test Methods	157	(62)
JoseMachado da Silva
Helio Mendonca
Sara Mazoleni
Introduction	157	(2)
General considerations	159	(15)
Simulation results	174	(13)
ATE Implementation	187	(26)
Conclusions	213	(6)
Part II Measurement of Additional Parameters
Jitter Measurement	219	(16)
Pierre-Yves Roy
Jacques Durand
Introduction	219	(1)
The double beat technique	220	(10)
The joint probability technique	230	(3)
Conclusion	233	(2)
Differential Gain and Phase Testing	235	(8)
JoseMachado da Silva
Helio Mendonca
Introduction	235	(1)
Test setup and hardware requirements	236	(1)
Analysis	237	(3)
Test results	240	(1)
Calculation of differential gain and phase from the test results	241	(2)
Step and Transient Response Measurement	243	(12)
Giovanni Chiorboli
Carlo Morandi
Introduction	243	(2)
Settling time and transition duration of step response	245	(4)
Frequency response measurement	249	(6)
Hysteresis Measurement	255	(10)
Giovanni Chiorboli
Carlo Morandi
Introduction	255	(1)
Test conditions	256	(1)
A practical case	257	(1)
Collection of samples in HC↑ and HC↓	258	(2)
Some warning	260	(5)
References	265	(14)
Index	279