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9781891121067

Electromagnetic Measurements in the Near Field

by ;
  • ISBN13:

    9781891121067

  • ISBN10:

    1891121065

  • Edition: 2nd
  • Format: Hardcover
  • Copyright: 2011-11-15
  • Publisher: Scitech Pub Inc
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List Price: $130.00

Summary

SciTech Series on Electromagnetic Compatibility Alistair Duffy, PhD - Series Editor This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.

Author Biography

Pawel Bienkowski is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic compatibility and electromagnetic field measurements and standards. He is the author or co-author of over 100 publications and over 20 patents. Hubert Trzaska is a Professor in the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic field measurements and standards. He is a Charter Member of the Bioelectromagnetic Society and is the author or co-author of over 300 publications and over 50 patents.

Table of Contents

Prefacep. vii
Preface to the Second Editionp. ix
Acknowledgmentsp. xi
Introductionp. 1
The Near Field and the Far Fieldp. 11
An EMF Generated by a System of Currentsp. 11
The Far Field and the Near Fieldp. 14
EMF from Simple Radiating Structuresp. 19
EMF Measurement Methodsp. 27
E, H, and S Measurementp. 28
Temperature Rise Measurementsp. 33
SAR Measurementp. 40
Current Measurementsp. 41
Electric Field Measurementp. 51
Field Averaging by a Measuring Antennap. 52
Influence of Fields from beyond a Probe Measuring Bandp. 55
Mutual Interaction of the Measuring Antenna and the Field Sourcep. 69
Changes in the Probes' Directional Patternp. 74
E-Field Probe Comparisonp. 80
Comments and Conclusionsp. 85
Magnetic Field Measurementp. 89
The Sizes of the Measuring Antennap. 89
Frequency Response of the Magnetic Field Probep. 92
Directional Pattern Alternationsp. 95
Measurement Accuracy vs. Antenna Distance from Radiation Sourcep. 100
Magnetic Field Probe with a Loop Working above Its Self-Resonant Frequencyp. 105
Comments and Conclusionsp. 109
Power Density Measurementp. 113
Power Density Measurement Methodsp. 113
Power Density Measurement Using the Antenna Effectp. 122
Conclusions and Commentsp. 128
Directional Pattern Synthesisp. 133
A Probe Composed of Linearly Dependent Elementsp. 134
Spherical Radiation Pattern of an E/H Probep. 137
A Probe Composed of Three Mutually Perpendicular Dipolesp. 140
Comments and Conclusionsp. 145
Other Factors Limiting Measurement Accuracyp. 151
Thermal Stability of a Field Meterp. 151
The Dynamic Characteristics of the Detectorp. 158
Measured Field Deformationsp. 164
Susceptibility of the Meter to External EMFp. 167
Resonant Phenomenap. 172
Human Factorp. 175
Uncertainty Budgetp. 177
Photonic EMF Measurementsp. 183
The Photonic EMF Probep. 186
Frequency Response of the Probep. 190
Sensitivity of the Photonic Probep. 194
Magnetic Field Photonic Probep. 199
Detector Linearityp. 200
Synthesis of the Spherical Directional Patternp. 201
The "Future Meter"p. 203
Final Commentsp. 207
Indexp. 215
Table of Contents provided by Ingram. All Rights Reserved.

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