What is included with this book?
Introduction | p. 1 |
Nature of ESD Phenomena | p. 1 |
ESD Failures in Nanometric Technologies | p. 3 |
Circuit Reliability: ESD Models | p. 8 |
ESD Challenges for Advanced CMOS Technologies | p. 9 |
ESD Design Window | p. 13 |
Book Objective and Organization | p. 14 |
ESD Models and Test Methods | p. 21 |
Introduction | p. 21 |
ESD Zapping Modes | p. 22 |
HBM Model | p. 24 |
MM Model | p. 25 |
CDM Model | p. 28 |
CBM Model | p. 31 |
TLP Testing | p. 32 |
Correlation of ESD Test Methods | p. 36 |
ESD Testers | p. 38 |
ESD Devices for Input/Output Protection | p. 45 |
Introduction | p. 45 |
Non-Snapback Devices | p. 45 |
Snapback Devices | p. 53 |
Latch-Up in ESD Protection Devices | p. 71 |
ESD Devices Under Stress Conditions: Burn-In | p. 76 |
Failure Criteria of ESD Devices | p. 79 |
Circuit Design Concepts for ESD Protection | p. 85 |
Introduction | p. 85 |
ESD Protection Networks | p. 86 |
Distributed ESD Protection Networks | p. 91 |
Circuit Design Flow for ESD | p. 97 |
ESD Power Clamps | p. 117 |
Introduction | p. 117 |
Static ESD Clamp | p. 118 |
Transient Power Clamps | p. 124 |
ESD Protection Circuits for High-Speed I/OS | p. 147 |
Introduction | p. 147 |
Parasitic Capacitance of ESD Protection Circuits | p. 148 |
A 12-bit 20 MS/S Analog to Digital Converter [3] | p. 153 |
A 14-bit 125 MS/S Analog to Digital Converter [5] | p. 156 |
A 4GB/S Current Mode Logic Driver [9] | p. 161 |
ESD Protection for Smart Power Applications | p. 173 |
Introduction | p. 173 |
LDMOS-Based ESD Protection | p. 174 |
BJT-Based ESD Protection | p. 178 |
SCR-Based ESD Protection | p. 183 |
Power Bus ESD Protection Circuits for High Voltage Applications | p. 189 |
ESD Protection for RF Circuits | p. 199 |
Introduction | p. 199 |
Basic Concepts | p. 201 |
Low Noise Amplifer | p. 205 |
ESD Protection Methods for RF Circuits | p. 209 |
Conclusion | p. 219 |
Introduction | p. 219 |
Future Work | p. 221 |
Index | p. 223 |
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