Evolvable Designs of Experiments Applications for Circuits

by Iordache, Octavian

• ISBN13: 9783527324248
• ISBN10: 3527324240
• Edition: 1st
• Format: Hardcover
• Copyright: 2009-02-17
• Publisher: Wiley-VCH

Summary

Adopting a groundbreaking approach, the highly regarded author shows how to design methods for planning increasingly complex experiments. He begins with a brief introduction to standard quality methods and the technology in standard electric circuits. The book then gives numerous examples of how to apply the proposed methodology in a series of real-life case studies. Although these case studies are taken from the printed circuit board industry, the methods are equally applicable to other fields of engineering.

Author Biography

Octavian Iordache has a PhD in chemical engineering and a diploma in mathematics. He was a professor of chemical engineering and has conducted research at several universities in Europe and North America. He has managed the R&D Reliability Center for large companies in microelectronics. He has authored 8 books and over 100 papers.

Table of Contents

Preface	p. XI
Abbreviations	p. XIII
Introduction	p. 1
Printed Circuits	p. 3
Technology Presentation	p. 3
Inner-Layer Processing	p. 4
Materials Preparation	p. 4
Lamination	p. 5
Drilling	p. 5
Making the Hole Conductive	p. 6
Imaging	p. 7
Electroplating	p. 8
Copper Etching	p. 9
Solder Masking	p. 9
Surface Finishing	p. 10
Routing	p. 10
Testing and Inspection	p. 10
Assembling	p. 11
Problem Solving for Reliability and Quality	p. 15
Conventional Paradigms	p. 15
Complexity and Time Frames	p. 18
Quasilinearity, Circularity, and Closure	p. 21
Advance of Reliability Paradigms	p. 23
Evolvable Designs of Experiments (EDOE)	p. 27
Polystochastic Models	p. 29
What Is PSM?	p. 29
Basic Notions for Categorical Frame	p. 32
Illustrative Examples of PSM and Categorical Frames	p. 34
Lumped Stochastic Chains	p. 34
Conditional Stochastic Chains	p. 35
First-Order Wave Equation	p. 37
Algebraic Frames for Time "T" and Space "Z"	p. 37
The First-Order Wave Equation	p. 41
"Kinetic" Model: Walsh-Hadamard Matrices	p. 42
"Convection" Model: Latin Squares	p. 44
GF(3) Solution	p. 45
GF(4) Solution	p. 47
Spectral Analysis: Correlation	p. 49
Informational Analysis: EDOE Matrices	p. 51
Walsh-Hadamard Matrices and Latin Square Designs	p. 51
Classification Procedures: Informational Criteria	p. 52
Informational Entropy and Distances	p. 53
Adaptability in Classification	p. 54
Informational Results	p. 55
Proposition 1	p. 55
Proposition 2	p. 56
Proposition 3	p. 56
Relation with Thermodynamics	p. 58
Ranking, Discarding, and Replication of the Columns	p. 59
Lumping and Splitting Columns	p. 60
Juxtaposing and Cutting	p. 61
Tables of DOE Matrices	p. 62
EDOE Methodology	p. 65
Scientific and Engineering Methods	p. 65
Center Design and Hierarchy	p. 66
Recursivity and Focusing	p. 66
Problem-Solving Framework for PCB Quality	p. 67
Forward and Backward Search	p. 69
Interactions: Dissociation-Integration	p. 71
EDOE Basic Steps	p. 73
Problem Statement	p. 73
Propose the Preliminary Problem-Solving Framework	p. 73
Select the DOE Matrices	p. 73
Run Center Design	p. 74
Analyze Results	p. 74
Run Multiple Forward and Backward Steps	p. 74
Perform Dissociation-Integration Experiments	p. 74
Establish the New Center Design	p. 75
Repeat the Testing Procedure from the New Center Design	p. 75
Run Simulations: Analyze the Solutions of the Problem	p. 75
EDOE Frame and SKUP Schema	p. 75
Comparison of EDOE with Other Methods	p. 81
Case Studies	p. 85
Solder Wicking	p. 87
Illustrative Failure Analysis	p. 87
Illustrative EDOE Frame	p. 91
SKUP Schema for Solder Wicking	p. 92
Reliability Analysis	p. 95
EDOE for Reliability	p. 95
SKUP Schema for Reliability	p. 99
Reliability Management System: Main Elements	p. 100
Reliability Prediction Software	p. 101
Minicoupons	p. 103
Reliability Analysis	p. 104
IST Electrical Resistance Analysis	p. 105
Drilling	p. 111
Drilling Quality Framework	p. 111
Test Coupons	p. 111
Testing Small Plated Through Holes: SKUP Schema for Drilling	p. 113
Reliability Tests	p. 116
Lifetime Maps	p. 117
Drilling Quality Evaluations	p. 119
Testing the Design, D	p. 121
Testing for Processing, P	p. 122
Reliability Evaluations	p. 123
Surface Finish Solderability	p. 125
Finish Solderability Frame	p. 125
SKUP Schema for Surface Finish	p. 128
Direct Plate	p. 131
Direct Plate Reliability	p. 131
Microsectioning Results	p. 132
Electrical Resistance versus the Number of Cycles Classification Method	p. 132
Associated Vectors-Grids	p. 135
First Step of Classification	p. 136
Second Step of Classification	p. 137
IST Lifetime and Electroplated Cu Thickness	p. 138
Summary	p. 138
SKUP Schema for Direct Plate	p. 139
Plating Voids	p. 141
Plating Voids Type	p. 141
The SKUP Schema for Plating Voids	p. 145
Evolvability	p. 149
Self-Adaptive Circuits	p. 151
Evolvability Levels	p. 151
Self-Adaptivity	p. 152
Self-Adaptive Designs and Constructions	p. 152
Self-Adaptive Materials	p. 153
Self-Adaptive Processing	p. 155
Self-Adaptability to Testing and Field Conditions	p. 156
Proactive Circuits	p. 159
Proactiveness for Circuits	p. 159
Evolutionary Hardware	p. 160
Electrochemical Filament Circuits	p. 161
ECFC Design	p. 162
Materials for ECFC	p. 163
ECFC Processing	p. 163
Potential ECFC Products and Applications	p. 164
Evolvable Circuits	p. 165
Evolvability Challenges	p. 165
Molecular Electronics	p. 166
Bacteriorhodopsin for Optoelectronic Circuitry	p. 167
Embedded Symbolic-Connectionists Hybrids	p. 168
Temporal Synchrony for Embedded Symbolic-Connectionist Hybrids	p. 170
Embedded EDOE	p. 172
Hybrid Controlled Microfluidic Circuits	p. 173
Reconfigurable Microfluidic Circuits	p. 174
Self-Constructed Molecular Circuits and Computing	p. 175
Genetic Code-Like Mechanism for Molecular Circuitry	p. 177
Conventional Circuits versus Evolvable Circuits	p. 182
Evolvable Manufacturing Systems	p. 185
Manufacturing Paradigms	p. 185
Fractal Manufacturing System	p. 187
Holonic Manufacturing System	p. 187
Biologic Manufacturing System	p. 189
Virtual Manufacturing System	p. 190
SKUP Schema for Virtual Manufacturing Systems	p. 190
Multiagent Manufacturing Systems: Architecture	p. 192
Multiagent-Based Versus Conventional Manufacturing Systems	p. 195
Concluding Remarks	p. 199
Related Concepts	p. 201
Complexity	p. 201
Evolvability	p. 202
Polystochastic Method	p. 202
Constructivism	p. 203
Cybernetics and the Cycle of Sciences	p. 203
References	p. 205
Index	p. 211
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