Fault Diagnosis of Analog Integrated Circuits

by Kabisatpathy, Prithviraj; Barua, Alok; Sinha, Satyabroto

• ISBN13: 9780387257426
• ISBN10: 038725742X
• Format: Hardcover
• Copyright: 2005-10-30
• Publisher: Springer Verlag

Summary

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort. Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Table of Contents

Dedication	v
Preface	1	(2)
Introduction	3	(20)
Basic Concepts	4	(4)
Historical Background	8	(7)
Summary	15	(8)
References	16	(7)
Fault and Fault Modelling	23	(18)
Introduction	23	(2)
Failure modes in electronic components	25	(2)
Analog fault modelling	27	(4)
Approximation modelling of analog integrated circuits	31	(4)
Summary	35	(6)
Exercises	35	(2)
References	37	(4)
Test Stimulus Generation	41	(32)
Introduction	41	(3)
Conventional analog test stimulus generation	44	(5)
Digital test stimulus generation	49	(4)
Delta sigma (Δ-Σ) signal generation	53	(7)
Pseudorandom noise generation	60	(7)
Summary	67	(6)
Exercises	68	(1)
References	69	(4)
Fault Diagnosis Methodology	73	(60)
Introduction	73	(1)
Fault diagnosis procedure	74	(1)
Fault dictionary techniques	75	(4)
DSP based techniques	79	(3)
Model based observer technique	82	(40)
Experimental verification of the model based observer technique	122	(8)
Summary	130	(3)
Exercises	130	(1)
References	131	(2)
Design for Testability and Built-in-Self-Test	133	(20)
Introduction	133	(3)
Design-for-testability approaches	136	(6)
Increased testability with test bus	142	(3)
Built-in-self-test	145	(4)
Summary	149	(4)
References	149	(4)
Appendix A	153	(6)
Appendix B	159	(10)
Appendix C	169	(8)
Notes	177	(2)
Index	179