Impact Of Electron And Scanning Probe Microscopy On Materials Research

by Rickerby, David G.; Valdre, Giovanni; Valdre, Ugo

• ISBN13: 9780792359401
• ISBN10: 0792359402
• Format: Paperback
• Copyright: 2000-12-01
• Publisher: Kluwer Academic Pub

Summary

This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

Table of Contents

Preface	vii
Participants photos	ix
List of Contributors	xiii
List of Participants	xvii
The impact of electron microscopy on materials research	1	(24)
G. Thomas
Microstructural design and tayloring of advanced materials	25	(16)
G. Thomas
Nanostructured materials	41	(22)
V. Provenzano
Characterization of heterophase transformation interfaces by high-resolution transmission electron microscope techniques	63	(46)
J. M. Howe
High resolution scanning electron microscopy observations of nano-ceramics	109	(26)
J. TH.M. De Hosson
M. De Haas
D. H. J. Teeuw
Metal-ceramic interfaces studied with high resolution transmission electron microscopy	135	(26)
J.Th.M. De Hosson
H. B. Groen
B. J. Kooi
W. P. Velinga
Z-contrast scanning transmission electron microscopy	161	(48)
S. J. Pennycook
P. D. Nellist
Electron energy loss spectrometry in the electron microscope-Part 1: Introduction	209	(22)
L. M. Brown
Electron energy loss spectrometry in the electron microscope-Part 2: EELS in the context of solid state spectroscopies	231	(20)
L. M. Brown
Electron energy loss spectrometry in the electron microscope-Part 3: Interfaces and localised spectrometry	251	(14)
L. M. Brown
EELS near edge structures. Application to intermetallic alloys and other materials	265	(36)
G. A. Botton
Surface chemistry and microstructure analysis of novel technological materials	301	(24)
M. L. Trudeau
Convergent beam electron diffraction	325	(14)
C. J. Humphreys
New developments in scanning probe microscopy	339	(20)
E. Meyer
M. Guggisberg
Ch. Loppacher
F. Battiston
T. Gyalog
M. Bammerlin
R. Bennewitz
J. Lu
T. Lehmann
A. Baratoff
H.-J. Guntherodt
R. Luthi
Ch. Gerber
R. Berger
J. Gimzewski
L. Scandella
Low-energy scanning electron microscope for nanolithography	359	(8)
A. Zlatkin
N. Garcia
Application of low voltage Scanning Electron Microscopy and energy dispersive x-ray spectroscopy	367	(20)
D. G. Rickerby
Environmental SEM and related applications. History of the environmental SEM and basic design concepts	387	(10)
T. A. Hardt
Environmental SEM and related applications. Gas interactions and gaseous amplification	397	(10)
T. A. Hardt
Environmental SEM and related applications. Applications	407	(8)
T. A. Hardt
ESSEM image contrast and applications to wet organic materials	415	(30)
Athene M. Donald
B. L. Thiel
Advanced electron and scanning probe microscopy on dental and medical materials research	445	(10)
G. Valdre
Correlative microscopy and probing in materials science	455	(18)
G. Valdre
Epilogue	473	(4)
Subject index	477