What is included with this book?
Theoretical Modelling of Rare Earth Dopants in GaN | p. 1 |
Introduction | p. 1 |
Theoretical Modelling | p. 2 |
Quantum Mechanical Methods | p. 3 |
4f Electrons | p. 5 |
The RE Pseudopotential | p. 6 |
Basis Functions | p. 7 |
Semi-Empirical Modelling | p. 7 |
Semi-Empirical LDA+U | p. 8 |
Clusters and Supercells | p. 10 |
Kohn-Sham and Occupancy Levels | p. 11 |
Formation Energies, Vibrational Modes, Energy Level | p. 11 |
Er, Eu and Tm in GaN | p. 13 |
Treatment of f-Electrons - Substitutional ErGa | p. 15 |
Deep Level Transient Spectroscopy | p. 16 |
Excitation and Emission m GaN:Eu | p. 17 |
RE Defects in A1N | p. 18 |
Conclusions | p. 20 |
References | p. 21 |
RE Implantation and Annealing of III-Nitrides | p. 25 |
Introduction | p. 26 |
Implantation Damage in GaN | p. 27 |
Implantation Geometry Dependence | p. 27 |
Fluence Dependence | p. 29 |
Implanatation Temperature Dependence | p. 35 |
Annealing and Optical Activation of RE Ions | p. 37 |
Optical Activation by High Temperature Annealing | p. 38 |
Influence of Annealing Atmosphere | p. 39 |
Annealing of A1N-Capped Samples | p. 42 |
Annealing at Ultrahigh Pressure | p. 46 |
RE Doping of A1N and A1N-Containing Ternary Alloys | p. 48 |
Summary | p. 52 |
References | p. 52 |
Lattice Location of RE Impurities in III-Nitrides | p. 55 |
Introduction | p. 56 |
Lattice Sites in Wurtzite Crystals | p. 57 |
Experimental Lattice Site Determination | p. 59 |
Ion Beam Channelling | p. 60 |
Emission Channelling | p. 61 |
X-Ray Absorption Fine Structure (XAFS) | p. 65 |
Hypertinc Interactions | p. 66 |
Lattice Site in Wurtzite Crystals | p. 66 |
Lattice Location of High-Fluence GaN:RE Implants by RBS/C | p. 66 |
Lattice Location of Low-Fluence GaN:RE by EC | p. 71 |
RE Lattice Site Dependence on Experimental Parameters | p. 79 |
Dependence on the Fluence | p. 79 |
Dependence on the Implantation Geometry | p. 83 |
Dependence on the Implantation Temperature | p. 86 |
Co-Implantation of RE and O or Other Impurity | p. 86 |
The Effect of Sample Mosaicity on Determining the Lattice Sites: A1N vs. GaN | p. 90 |
Conclusions | p. 94 |
Acknowledgements | p. 95 |
References | p. 96 |
Electroluminescent Devices Using RE-Doped III-Nitrides | p. 99 |
Introduction | p. 99 |
General Treatment of EL devices | p. 101 |
III-N:RE EL Devices | p. 102 |
Light Emitting Diode with RE-doped GaN Active Layer | p. 109 |
Summary | p. 111 |
References | p. 112 |
Er-Doped GaN and InxGa1-xN for Optical Communications | p. 115 |
Introduction | p. 116 |
Er Doping of GaN and InGaN by Ion Implantation | p. 117 |
In Situ Er Doping of GaN by MBE and HVPE | p. 129 |
MOCVD Growth of Er-Doped III-Nitrides | p. 136 |
Er-Doped GaN | p. 138 |
Er-Doped InGaN | p. 142 |
Current-Injected 1.54 ¿m LEDs Based on GaN:Er | p. 150 |
Er-Doped Nitride Amplifier (EDNA) Development | p. 152 |
Summary | p. 155 |
Acknowledgements | p. 155 |
References | p. 156 |
Rare-Earth-Doped GaN Quantum Dots | p. 159 |
Introduction | p. 159 |
Growth of GaN QDs | p. 161 |
Undoped Dots | p. 161 |
Rare-Earth-Doped Dots | p. 163 |
Optical Properties | p. 168 |
Eu-Doped GaN QDs Embedded in A1N | p. 168 |
Eu-Doped InGaN QDs Embedded in GaN | p. 171 |
Tm-Doped Dots | p. 172 |
Tb-Doped GaN QDs | p. 175 |
Photoluminescence Dynamics of RE-Doped GaN QDs | p. 177 |
Electroluminescence of Rare Earth-Doped GaN QDs | p. 183 |
Conclusion | p. 185 |
Acknowlegements | p. 186 |
References | p. 186 |
Visible Luminescent RE-doped GaN, AlGaN and AlInN | p. 189 |
Introduction to Luminescence of RR-Doped GaN | p. 189 |
Preparation of Samples | p. 192 |
Cathodoluminescence and X-Ray Microanalysis | p. 192 |
Annealing Temperature Dependence of RE Luminescence | p. 197 |
Site Multiplicity in GaN:Eu Revealed by Photoluminescence Spectroscopy | p. 200 |
Luminescence of Eu Ions in AlGaN across the Entire Alloy Composition Range | p. 205 |
Luminescence of RE Ions in AlInN Hosts | p. 213 |
Conclusion | p. 216 |
Acknowledgements | p. 217 |
References | p. 217 |
Combined Excitation Emission Spectroscopy (CEES) of RE Ions in Gallium Nitride | p. 221 |
Introduction | p. 221 |
RE Ions in GaN: General Considerations | p. 222 |
CEES Experimental Setup | p. 223 |
Application of CEES to Erbium in GaN | p. 226 |
Introduction | p. 226 |
Direct Excitation of 1.5 ¿m Emission | p. 226 |
Two-Step Excitation of 980 nm and 820 nm Emission | p. 231 |
Three-Step Excitation of 670 nm and 550 nm Emission | p. 236 |
Direct Excitation of 670 nm and 550 nm Emission | p. 237 |
Comparison of in situ Doped MBE and MOCVD Grown GaN:Er Samples | p. 239 |
Above Bandgap Excitation of 1.5 ¿m Emission | p. 241 |
Summary of CEES Spectroscopy of GaN:Er | p. 242 |
Application of CEES to Neodymium in GaN | p. 242 |
Introduction and Experimental Background | p. 242 |
Assignment of Excitation and Emission Peaks | p. 243 |
Electron-Phonon Coupling | p. 246 |
Inhomogeneous Broadening: Spectral and Spatial Aspects | p. 246 |
Summary of CEES of GaN:Nd | p. 249 |
Application of CEES to Europium in GaN and AlGaN | p. 250 |
Introduction | p. 250 |
Energetic Fingerprints of Different Sites | p. 251 |
Electron Phonon Coupling | p. 255 |
Effect of Growth Conditions | p. 257 |
Excitation under Non-Resonant Conditions | p. 260 |
Summary | p. 265 |
Conclusion | p. 266 |
Acknowledgements | p. 266 |
References | p. 267 |
Excitation Mechanisms of RE Ions in Semiconductors | p. 269 |
Introduction | p. 270 |
Excitation Mechanisms | p. 271 |
Excitation Paths Involving Electron-Hole Pairs | p. 271 |
Excitation Paths Involving Change of RE Ion Charge | p. 274 |
Excitation Paths Involving Donor-Acceptor Pairs | p. 278 |
Energy Transfer Processes | p. 280 |
RE Excitation Processes in GaN | p. 282 |
RE Excitation Schemes | p. 282 |
Isolated RE Ions Versus RE Ions Coupled to Carrier Traps | p. 283 |
Effective Excitation Cross-Section | p. 288 |
RE-Related Carrier Trap | p. 294 |
Conclusion | p. 303 |
Acknowledgements | p. 305 |
References | p. 305 |
High-Temperature Ferromagnetism in the Super-Dilute Magnetic Semiconductor GaN:Gd | p. 309 |
Introduction | p. 310 |
Experimental | p. 311 |
Sample Growth and Structural Characterization | p. 311 |
Assessment of Electrical and Magnetic Properties | p. 312 |
Assessment of Optical Properties | p. 313 |
Basic Structural and Magnetic Properties | p. 314 |
Gd Incorporation in GaN | p. 314 |
Magnetic Characteristics | p. 318 |
Phenomenological Model | p. 323 |
Optical Properties | p. 326 |
Magnetic Phases and Anisotropy | p. 331 |
Magnetic Phases | p. 332 |
Magnetic Anisotropy | p. 334 |
Discussion | p. 336 |
Recent Studies in the Literature | p. 338 |
Conclusions | p. 339 |
Acknowledgements | p. 340 |
References | p. 340 |
Summary and Prospects for Future Work | p. 343 |
References | p. 345 |
Index | p. 347 |
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