Scanning and Transmission Electron Microscopy An Introduction

by Flegler, Stanley L.; Heckman, John W.; Klomparens, Karen L.

• ISBN13: 9780195107517
• ISBN10: 0195107519
• Edition: Reprint
• Format: Hardcover
• Copyright: 1993-09-23
• Publisher: Oxford University Press

Summary

This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide youthrough microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique bookcovers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmissionelectron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

Author Biography

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Table of Contents

Preface	vii
Introduction	1	(12)
Electron Sources and Electon Lenses	13	(10)
Electron Sources	13	(6)
Electron Lenses	19	(4)
Vacuum Systems	23	(20)
Vacuum Pumps Commonly Used in EM Labs	26	(9)
Methods of Measuring Vacuums	35	(3)
Vacuum Systems Used in Electron Microscopy	38	(5)
The Transmission Electron Microscope	43	(22)
Theory of Operation	44	(2)
Real Images	46	(1)
Virtual Images	47	(1)
Depth of Field and Depth of Focus	48	(1)
Anatomy of a Transmission Electron Microscope	49	(14)
Medium- and High-Voltage Transmission Electron Microscopy	63	(2)
The Scanning Electron Microscope	65	(32)
Theory of Operation	67	(4)
Specimen-Beam Interactions	71	(11)
Machine Variables	82	(7)
Ultrahigh-Resolution SEMS	89	(1)
Environmental SEMS	89	(1)
Scanning Transmission Electron Microscopes	90	(3)
Scanning Tunneling and Atomic Force Microscopy	93	(4)
Specimen Preparation for Tem	97	(54)
Negative Staining of Small Particulates	98	(2)
Ultrathin Sectioning of Larger Samples	100	(26)
Vacuum Evaporators and Evaporation Techniques	126	(6)
Shadowcasting and Replica Techniques	132	(10)
Cytological Techniques	142	(6)
Preparation of Nonbiological Materials	148	(3)
Specimen Preparation for Sem	151	(22)
Mounting	152	(1)
Coating for Conductivity	153	(5)
Special Methods for Various Sample Types	158	(1)
Biological Sample Preparation	159	(3)
Alternative Methods for Biological Samples	162	(5)
SEM Histochemistry for Biological Samples	167	(6)
X-Ray Analysis	173	(28)
X-ray Production and Naming	174	(3)
Measuring the Energy and Wavelength of X Rays	177	(1)
Construction of the EDS Detector	178	(2)
Construction of the EDS X-Ray Analyzer	180	(2)
Outputs	182	(1)
Spectrum Accumulation and Interpretation	182	(3)
Optimizing the Detection of X Rays	185	(2)
Artifacts	187	(4)
Quantitative Analysis	191	(5)
Sample Preparation	196	(5)
Electron Micrographic Techniques	201	(20)
Silver Graphic Process	202	(3)
Photographic Printing	205	(3)
Transmission Electron Micrography	208	(5)
Scanning Electron Micrography	213	(2)
The Electronic Darkroom	215	(2)
Micrograph Presentation and Publication	217	(4)
Index	221