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Alain Claverie is Directeur of CEMES/CNRS, Toulouse, France.
Introduction
Chapter 1 Strain mapping using diffraction techniques NBD (Leti XX), CBED
Chapter 2 Strain mapping using GPA/HREM
Chapter 3 Dopant mapping using bright field TEM
Chapter 4 Strain mapping using dark field holography
Chapter 5 Interdiffusion and chemical reaction at interfaces by EELS
Chapter 6 Dopant segregation using STEM-EELS
Chapter 7 Chemical imaging using STEM-HAADF
Chapter 8 Characterization of process induced defects
Chapter 9 Specimen preparation by FIB
Chapter 10 Magnetic mapping using bright field holography
The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.