9781596932715

This practical resource offers you detailed guidance on the impact of substrate noise on a wide range of circuits operating from baseband frequencies up to mm-wave frequencies. This unique book presents case studies to illustrate that careful modeling of the assembly characteristics and layout details is required to bring simulations and measurements into agreement. You learn how to use a proper combination of isolation structures and circuit techniques to make analog/RF circuits more immune to substrate noise.

Stephane Bronckers is currently an EMC specialist at Laborelec, which is part of the GDF Suez Group. Dr. Bronckers has been a research assistant in the Department of Fundamental Electricity and Instrumentation at the Vrije Universiteit Brussels (VUB) and has worked at the Interuniversity Microelectronics Center (IMEC). He received an M.Sc. and a Ph.D. from the VUB. Geert Van der Plas is a principal scientist at the Interuniversity Microelectronics Center (IMEC) in Belgium. He received an M.Sc. and a Ph.D. from the Katholieke Universities Leuven, Belgium. Gerd Vandersteen is a professor in the Department of Electrical Measurement (ELEC) at the Vrije Universities Brussels, where he received a Ph.D. in electrical engineering. Yves Rolain is a professor in the Department of Electrical Measurement (ELEC) at the Vrije Universiteit Brussels, where he received an M.S. in computer sciences and a Ph.D. in applied sciences.

Foreword	p. xiii
Preface	p. xv
Acknowledgments	p. xvii
Introduction	p. 1
Introduction and Motivation	p. 1
Book overview	p. 4
References	p. 5
Substrate Noise Propagation	p. 7
Introduction	p. 7
Modeling the Substrate	p. 8
Analytical Resistance Calculation Between Two Contacts	p. 9
Finite Difference Method	p. 13
Finite Element Method	p. 17
The Substrate Modeled with FDM	p. 19
Experimental Description	p. 19
Analysis of the Substrate Noise Propagation	p. 20
Conclusions	p. 27
The Substrate as a Finite Element Model	p. 28
Simulation Methodology	p. 28
Dealing with N-Doped Regions	p. 30
Simulation Setup for the Test Structure	p. 33
Comparison	p. 33
Conclusions	p. 33
Conclusions	p. 34
References	p. 36
Passive Isolation Structures	p. 39
Introduction	p. 39
Overview and Description of the Different Types of Passive Isolation Structures	p. 40
The Template Layout	p. 42
Integrating the Different Types of Guard Rings	p. 43
Simulation Setup	p. 44
Prediction and Understanding of Guard Rings	p. 44
Reference Structure	p. 45
P-Well Block Isolation	p. 47
N-Well Isolation	p. 50
P⁺ Guard Ring Shielding	p. 52
Triple Well Shielding	p. 56
Comparison and Conclusion	p. 60
Design of an Efficient P⁺ Guard Ring	p. 65
Impedance of the Ground Interconnect	p. 65
Width of the P⁺ Guard Ring	p. 67
Distance to the Victim	p. 70
Guidelines for Good P⁺ Guard Ring Design	p. 75
Conclusions	p. 76
References	p. 77
Noise Coupling in Active Devices	p. 79
Introduction	p. 79
Substrate Noise Impact on Analog Design	p. 80
Impact Simulation Methodology	p. 82
EM Simulation	p. 83
Circuit Simulation	p. 86
Transistor Test Bench	p. 86
Description of the Transistor Under Test	p. 87
Modeling the Transistor Test Bench	p. 87
Experimental Validation	p. 92
Substrate Noise Coupling Mechanisms in a Transistor	p. 92
Analyzing the Different Coupling Mechanisms in a Transistor	p. 94
Description and Measurement of the Device Under Test	p. 97
Modeling Different Substrate Noise Coupling Mechanisms	p. 100
Quantifying the Different Substrate Noise Coupling Mechanisms	p. 104
Experimental Validation of the Substrate Noise Coupling Mechanisms	p. 106
Conclusions	p. 108
References	p. 109
Measuring the Coupling Mechanisms in Analog/RF Circuits	p. 111
Introduction	p. 111
Measurement-Based Identification of the Dominant Substrate Noise Coupling Mechanisms	p. 114
Measurement of the Different Spurs	p. 115
Sensitivity Functions	p. 116
Determining the Influence of the PCB	p. 118
Example: 900 MHz LC-VCO	p. 119
Description of the LC-VCO	p. 119
Substrate Sensitivity Measurements	p. 120
Revealing the Dominant Coupling Mechanism for FM Spurs	p. 123
Revealing the Dominant Coupling Mechanism for AM Spurs	p. 128
Influence of the PCB Decoupling Capacitors on the Substrate Noise Impact	p. 130
Conclusions	p. 132
Study of the Coupling Mechanisms Between a Power Amplifier and an LC-VCO	p. 133
Description of the Design of the PPA and the LC-VCO	p. 135
Coupling Mechanisms Between the PPA and the LC-VCO	p. 137
Measuring the Dominant Coupling Mechanisms	p. 142
Conclusions	p. 146
Conclusions	p. 148
References	p. 148
The Prediction of the Impact of Substrate Noise on Analog/RF Circuits	p. 151
Introduction	p. 151
The Substrate Modeled with FDM	p. 152
Impact Simulation Methodology	p. 152
Prediction of the Impact of Substrate Noise from DC Up to LO Frequency	p. 156
Experimental Validation of the Simulation Methodology	p. 160
Conclusions	p. 162
Substrate Modeled by the FEM Method	p. 163
Impact Simulation Methodology	p. 163
Prediction of the Impact of Substrate Noise	p. 166
Verification with Measurements	p. 170
Conclusions	p. 172
Techniques to Reduce Substrate Noise Coupling	p. 173
Layout Techniques to Reduce the Substrate Noise Coupling	p. 174
Circuit Techniques to Reduce the Substrate Noise Coupling	p. 175
3D Stacking as a Solution to Substrate Noise Issues	p. 179
Separated Analog/Digital Ground	p. 185
Shared Analog/Digital Ground	p. 186
Experimental Validation	p. 186
Conclusions	p. 190
Conclusions	p. 191
References	p. 192
Noise Coupling in Analog/RF Systems	p. 195
Introduction	p. 195
Impact Simulation Methodology	p. 196
EM Simulation	p. 198
Parasitic Extraction	p. 200
Circuit Simulation	p. 200
Analyzing the Impact of Substrate Noise in Analog/RF Systems	p. 201
Analysis of the Propagation of Substrate Noise	p. 202
Analyzing the Substrate Noise Coupling	p. 202
Substrate Noise Impact on a 48-53 GHz LC-VCO	p. 203
Description of the LC-VCO	p. 203
Simulation Setup	p. 203
Conclusion	p. 207
Impact of Substrate Noise on a DC to 5 GHz Wideband Receiver	p. 208
Description of the Wideband Receiver	p. 208
Simulation Setup	p. 211
Parasitic Extraction	p. 214
Circuit Simulation	p. 214
Revealing the Dominant Coupling Mechanism	p. 215
Experimental Verification	p. 220
Conclusions and Discussion	p. 222
Conclusions	p. 222
Discussion	p. 223
References	p. 224
Narrowband Frequency Modulation of LC-Tank VCOs	p. 227
Port Conditions	p. 231
List of Acronyms	p. 233
About the Authors	p. 237
Index	p. 239
Table of Contents provided by Ingram. All Rights Reserved.

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Substrate Noise Coupling in Analog/Rf Circuits

1596932716

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