Symposium SS, "Advanced Imaging and Scattering Techniques for In Situ Studies," Symposium TT, "In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis," Symposium UU, "Real-Time Studies of Evolving Thin Films and Interfaces" and Symposium VV, "Novel Development and Applications of Scanning Probe Microscopy," were held at the 2010 MRS Fall Meeting in Boston, Massachusetts. A major unifying theme for these symposia is exploration of intricate properties of materials on the near-to-atomic length scale in the immediate vicinity of the free surface or at interfaces between materials. These symposia focus on various aspects and approaches of exploration of surfaces and interfaces from more traditional electron and x-ray scattering (the focus of Symposia SS, TT, and UU) to more recent and rapidly advancing scanning probe microscopy, or SPM (Symposium VV). Together, they cover a field of great importance across the broad MRS community.

Preface	p. ix
Acknowledgments	p. xi
Materials Research Society Symposium Proceedings	p. xiii
AdVanced Imaging And Scattering Techniques For In Situ Studies
In situ Imaging at the NIST Neutron Imaging Facility	p. 3
Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields	p. 15
Electron Phase Microscopy of Magnetic Fields in Ferromagnets and Superconductors	p. 21
Effect of Oxygen Pressure on the Initial Oxidation Behavior of Cu and Cu-Au Alloys	p. 31
Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope	p. 37
In Situ X-Ray Synchrotron Radiation Spectroscopies In Energy-Related Materials Science And Heterogeneous Catalysis
Electronic Structures of Non-Pt Carbon Alloy Catalysts for Polymer Electrolyte Membrane Fuel Cells Revealed by Synchrotron Radiation Analyses	p. 45
Quantum Rods and Dots-based Structures & Devices: Low Cost Aqueous Synthesis and Bandgap Engineering for Solar Hydrogen and Solar Cells Applications	p. 59
Real-Time Studies Of Evolving Thin Films And Interfaces
Formation of Irregular Al Islands by Room-Temperature Deposition on NiAl(110)	p. 73
In-situ TEM Observation of Formation-Retraction-Fracture Experiment of Liquid-Like Silicon Nanocontact	p. 79
Observation of Real-Time Thin Film Evolution Using Microcantilever Sensors	p. 91
X-Ray Study of Strained and Strain Balanced Superlattice Material	p. 91
In-situ XRD and FIB Microscopy Studies of the Dynamics of Intermetallic Phase Formation in Thin Layer Cu/Sn Films for Low-temperature Isothermal Diffusion Soldering	p. 95
Stochastic Models of Epitaxial Growth	p. 101
Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy
The Electrical Conduction at Early Stages of Cluster-Assembled Films Growth	p. 111
Spreading Kinetics at a Molecular Level	p. 117
Novel Development And Applications Of Scanning Probe Microscopy
Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile Ti02 (110)	p. 127
Experimental and Theoretical Study of the New Image Force Microscopy Principle	p. 137
Crystallographic Processing of Scanning Tunneling Microscopy Images of Cobalt Phthalocyanines on Silver and Graphite	p. 149
Scanning Thermal Lithography as a Tool for Highly Localized Nanoscale Chemical Surface Functionalization	p. 155
Digital Pulsed Force Mode AFM and Confocal Raman Microscopy in Drug-Eluting Coatings Research	p. 161
Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films	p. 167
Circular AFM Mode: A New AFM Mode for Investigating Surface Properties	p. 173
Scanning Probe Microscopy with Diamond Tip in Tribo-nanolithography
Photoinduced Temporal Change of Surface-Potential Undulation on AIq3 Thin Films Observed by Kelvin Probe Force Microscopy	p. 185
Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales	p. 191
In Situ Chemical Functionalization of a Single Carbon Nanotube Functionalized AFM Tip using a Correlated Optical and Atomic Force Microscope	p. 197
Author Index	p. 203
Subject Index	p. 205
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Advances in Spectroscopy and Imaging of Surfaces and Nanostructures

9781605112954

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