Summary

Practical Guide to Materials Characterization

Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more

Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner.

To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements.

Specific sample topics covered in the remaining seven chapters include:

Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates
Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy
Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter
Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM)

With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.

Author Biography

Khalid Sultan is Assistant Professor in the Department of Physics of the Central University of Kashmir. His research interests are the rare earth transition metal oxide systems, characterized by electric, transport, dielectric, magnetic and X-ray measurements as well as by a variety of microscopy and spectroscopy techniques. Dr. Sultan has international collaborations with the Pohang Accelerator Lab and the Advanced Analysis Center of the Korea Institute of Technology.

Chapter 1: Basics of Material Characterization Techniques
1.1 Introduction
1.2 Electromagnetic Spectrum and Characteristics
1.3 Production of different Radiations
1.4 Optical Properties
1.4.1 Reflection
1.4.2 Refraction
1.4.3 Absorption
1.4.4 Transmittance
1.4.5 Diffraction
1.4.6 Interference
1.4.7 Dispersion
1.5 Fundamentals of Crystallography
1.6 Molecular Motions and Vibration
1.7 Electron Imaging
1.8 Magnetism in Solids
1.8.1 Magnetic Terminology
1.8.2 Types of Magnetism
1.9 Dielectric Constant and Dielectric Loss: Definition
References

Chapter 2: X-Ray Diffraction
2.1 Introduction
2.2 Bragg's law
2.3 Von Laue Treatment: Laue's Equation
2.4 Experimental Techniques
2.5 Geometry and Instrumentation
2.6 Standard X-ray Diffraction Pattern
2.7 Applications
References

Chapter 3: Raman Spectroscopy
3.1 Introduction
3.2 Classical theory of Raman Scattering
3.3 Quantum theory of Raman Scattering
3.4 Raman Spectrometer
3.5 Special Techniques
3.6 Resonance Raman Scattering
3.7 Applications
References

Chapter 4: X-ray Spectroscopic Techniques
4.1 X-Ray Absorption Spectroscopy (XAS)
4.1.1 Introduction
4.1.2 Basic Principle of XAS
4.1.3 Experimental Aspects
4.1.4 Experimental Setup
4.1.5 Example and Analysis
4.2 X-ray Photoelectron Spectroscopy (XPS)
4.2.1 Introduction
4.2.2 Basic Principles
4.2.3 Energy Referencing
4.2.4 Instrumentation
4.2.5 XPS Spectra and its Features
4.2.6 Example and Analysis
4.3 Auger Electron Spectroscopy (AES)
4.3.1 Introduction
4.3.2 Interactions of Electrons with Matter
4.3.3 Competition between X-ray and Auger Electron Emission
4.3.4 Auger Process
4.3.5 Kinetic Energy of Auger Electrons
4.3.6 Instrumentation
4.3.7 Auger Spectra
4.3.8 Examples and Analysis
References

Chapter 5: Electron Microscopy
5.1 Elastic Scattering
5.2 Inelastic Scattering
5.3 Family of Electron Microscopes
5.4 Electron diffraction
5.5 The X-ray Microscope
5.6 Transmission Electron Microscope
5.7 Scanning Electron Microscope
5.8 Scanning Transmission Electron Microscope
5.9 Examples and Analysis
References

Chapter 6: Magnetic Measurement Techniques
6.1 Introduction
6.2 Extraction Method
6.3 Vibrating Sample Magnetometer (VSM)
6.4 Advantages and Disadvantages of VSM
6.5 SQUID Magnetometer
6.6 Applications, Illustration and Analysis
References

Chapter 7: Infrared Spectroscopy
7.1 Introduction
7.2 Theoretical Concepts
7.3 Instrumentation and Sampling methods
7.4 FTIR
7.5 Examples, Illustrations and Analysis
References

Chapter 8: Dielectric Measurements
8.1 Introduction
8.2 Dependence of Dielectric properties on Frequency
8.3 Dependence of Dielectric properties on Temperature
8.4 Dielectric Measurement Techniques
8.5 Examples, Illustrations and Analysis
References

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Practical Guide to Materials Characterization Techniques and Applications

9783527350711

3527350713

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Summary

Author Biography

Table of Contents

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