What is included with this book?
Energy Filtered X-Ray Photoemission Electron Microscopy | p. 1 |
Introduction | p. 2 |
History | p. 3 |
Principle and Experimental Setup of PEEM and EXPEEM | p. 6 |
Chemical Application of EXPEEM | p. 32 |
Summary and Future Prospects | p. 37 |
References | p. 38 |
Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy | p. 45 |
Introduction | p. 46 |
Three-Dimensional Electron Microscopy | p. 47 |
Coherent Imaging in SCEM | p. 61 |
Partially Coherent Imaging in SCEM | p. 66 |
Conclusions | p. 71 |
Acknowledgments | p. 72 |
References | p. 72 |
New Dimensions for Field Emission: Effects of Structure in the Emitting Surface | p. 77 |
Introduction | p. 78 |
Behavior in Constant Potential | p. 82 |
Behavior in Constant Field | p. 88 |
Summary of Results for Intensity | p. 106 |
Behavior in Realistic Geometry | p. 109 |
Interference Patterns | p. 112 |
Electron-Optical Brightness | p. 114 |
Discussion | p. 114 |
Conclusions | p. 117 |
Appendices | p. 118 |
Acknowledgments | p. 126 |
References | p. 126 |
Conductivity Imaging and Generalized Radon Transform: A Review | p. 129 |
Introduction | p. 130 |
The Reconstruction Process in EIT | p. 132 |
Research Issues and Key Problem Areas of EIT | p. 150 |
Application Areas of EIT | p. 155 |
Conclusions and Future Research | p. 158 |
Appendices | p. 159 |
Acknowledgments | p. 161 |
References | p. 161 |
Comparison of Color Demosaicing Methods | p. 173 |
Introduction | p. 174 |
Color Demosaicing | p. 175 |
Demosaicing Schemes | p. 198 |
Objective Evaluation Criteria for Demosaiced Images | p. 227 |
Quality Evaluation Results | p. 246 |
Conclusion | p. 261 |
References | p. 262 |
Contents of Volumes 151-161 | p. 267 |
Index | p. 271 |
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The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.