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Applications and Metrology at Nanometer-Scale 2

by Pierre-Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami

ISBN13: 9781119818984
ISBN10: 1119818982
eBook ISBN(s): 9781119818977
Format: Nonspecific Binding
Copyright: 2021-04-14
Publisher: Wiley Global Research (STMS)

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1. Applications and Metrology at Nanometer-Scale 2 > ISBN13: 9781119818984

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5% off 1 book, 7% off 2 books, 10% off 3+ books

Applications and Metrology at Nanometer-Scale 2

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