Applications and Metrology at Nanometer-Scale 2 Measurement Systems, Quantum Engineering and RBDO Method book cover, ISBN 9781786306876

Applications and Metrology at Nanometer-Scale 2 Measurement Systems, Quantum Engineering and RBDO Method

by Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
  • ISBN13: 9781786306876
  • ISBN10: 1786306875
  • eBook ISBN(s): 9781119818977
  • Edition: 1st
  • Format: Hardcover
  • Copyright: 2021-04-06
  • Publisher: Wiley-ISTE
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