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9780198513872

Atom Probe Field Ion Microscopy

by ; ; ;
  • ISBN13:

    9780198513872

  • ISBN10:

    0198513879

  • Format: Hardcover
  • Copyright: 1996-11-28
  • Publisher: Clarendon Press

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Summary

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely dueto the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-theart account of this important field, and is intended for a graduate-level readership.

Table of Contents

Historical background and general introduction
Physical principles of field ion microscopy
FIM image interpretation and application
Physical principles of atom probe interpretation
Statistical analysis of atom probe data
Metallurgical applications
Atom probe studies of non-metallic materials, then films and surface phenomena
Table of Contents provided by Publisher. All Rights Reserved.

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