Preface | p. v |
Preface to the Second Edition | p. vii |
Introduction | p. 1 |
The History of Group Testing | p. 1 |
A Prototype Problem and Some General Remarks | p. 5 |
Some Practical Considerations | p. 7 |
References | p. 9 |
Sequential Group Testing Algorithms | p. 11 |
General Sequential Algorithms | p. 13 |
The Binary Tree Representation of a Sequential Algorithm | p. 13 |
The Structure of Group Testing | p. 20 |
Li's s-Stage Algorithm | p. 23 |
Hwang's Generalized Binary Splitting Algorithm | p. 24 |
The Nested Class | p. 27 |
(d, n) Algorithms and Merging Algorithms | p. 32 |
Number of Group Testing Algorithms | p. 35 |
References | p. 37 |
Sequential Algorithms for Special Cases | p. 39 |
Two Disjoint Sets Each Containing Exactly One Defective | p. 39 |
An Application to Locating Electrical Shorts | p. 44 |
The 2-Defective Case | p. 49 |
The 3-Defective Case | p. 54 |
When is Individual Testing Minimax? | p. 57 |
Identifying a Single Defective with Parallel Tests | p. 60 |
References | p. 62 |
Competitive Group Testing | p. 65 |
The First Competitiveness | p. 65 |
Bisecting | p. 67 |
Doubling | p. 71 |
Jumping | p. 73 |
The Second Competitiveness | p. 77 |
Digging | p. 80 |
Tight Bound | p. 82 |
References | p. 87 |
Unreliable Tests | p. 89 |
Ulam's Problem | p. 89 |
General Lower and Upper Bounds | p. 95 |
Linearly Bounded Lies (1) | p. 100 |
The Chip Game | p. 104 |
Linearly Bounded Lies (2) | p. 109 |
Other Restrictions on Lies | p. 112 |
References | p. 115 |
Complexity Issues | p. 117 |
General Notions | p. 117 |
The Prototype Group Testing Problem is in PSPACE | p. 119 |
Consistency | p. 120 |
Determinacy | p. 122 |
On Sample Space S(n) | p. 123 |
Learning by Examples | p. 129 |
References | p. 130 |
Nonadaptive Group Testing Algorithms | p. 131 |
Deterministic Designs and Superimposed Codes | p. 133 |
The Matrix Representation | p. 133 |
Basic Relations and Bounds | p. 134 |
Constant Weight Matrices | p. 140 |
General Constructions | p. 145 |
The Small d Cases | p. 151 |
References | p. 159 |
Random Designs and Error Tolerance | p. 163 |
Random Matrices | p. 163 |
Macula's Error Tolerance d-Disjunct Matrices | p. 167 |
q-Error-Tolerance d-Disjunct Matrices | p. 170 |
References | p. 175 |
DNA Applications | p. 177 |
Clone Library Screening | p. 177 |
Deterministic Designs | p. 180 |
Random Designs | p. 183 |
Some Additional Problems | p. 188 |
References | p. 192 |
Extended Group Testing Models | p. 195 |
Multiaccess Channels and Extensions | p. 197 |
Multiaccess Channels | p. 198 |
Nonadaptive Algorithms | p. 202 |
Two Variations | p. 205 |
The k-Channel | p. 208 |
Quantitative Channels | p. 211 |
References | p. 211 |
Additive Model and Others | p. 213 |
Symmetric Group Testing | p. 213 |
Some Additive Models | p. 215 |
A Maximum Model | p. 221 |
Some Models for d = 2 | p. 224 |
References | p. 230 |
Group Testing on Graphs | p. 233 |
2-Optimal Graphs | p. 233 |
Solution of the Du-Hwang Conjecture | p. 236 |
Defective Vertices | p. 242 |
On Trees | p. 245 |
Other Constraints | p. 250 |
References | p. 250 |
Other Related Searching Problems | p. 253 |
Optimal Search in One Variable | p. 255 |
Midpoint Strategy | p. 255 |
Fibonacci Search | p. 257 |
Minimum Root Identification | p. 261 |
References | p. 268 |
Unbounded Search | p. 271 |
Introduction | p. 271 |
Bentley-Yao Algorithms | p. 273 |
Search with Lies | p. 277 |
Unbounded Fibonacci Search | p. 279 |
References | p. 280 |
Membership Problems | p. 281 |
Examples | p. 281 |
Polyhedral Membership | p. 283 |
Boolean Formulas and Decision Trees | p. 285 |
Recognition of Graph Properties | p. 289 |
References | p. 292 |
Counterfeit Coins | p. 295 |
One Counterfeit Coin | p. 295 |
Two, Three, and More Counterfeit Coins | p. 301 |
The All-Equal Problem | p. 302 |
Anti-Hadamard Matrices | p. 308 |
Coins with Arbitrary Weights | p. 314 |
References | p. 315 |
Index | p. 319 |
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