Digital Electronics An Integrated Laboratory Approach

by Bartelt, Terry L.M.

• ISBN13: 9780130931023
• ISBN10: 0130931020
• Edition: 1st
• Format: Paperback
• Copyright: 2001-10-04
• Publisher: Pearson

Summary

This introductory book explains, with completeness and clarity, how components and circuits are used in practical digital devices. It also describes any digital components or circuits that exist in integrated-circuit form.Chapter topics cover digital number systems, basic logic gates, Boolean algebra, combination and integrated circuits, basic storage elements: latches and flip-flops, counters, registers, arithmetic circuits, conversion devices and circuits, memory devices, and functional digital circuits.For individuals new to the electronics field, and for military personnel as a self-study reference.

Author Biography

Terry Bartelt is a long-time educator and author in the Electronics Technology field. He currently teaches at Fox Valley Technical College in Wisconsin

Table of Contents

Introduction to Digital Electronics	1	(13)
Introduction	1	(1)
Comparing Analog and Digital Signals	2	(1)
Digital Circuit Devices	3	(1)
Evolution of Digital Circuits	4	(2)
Advantages of Digital Electronics	6	(4)
Complex Digital Functions	10	(4)
Summary	12	(1)
Problems	12	(1)
Answers to Review Questions	12	(2)
Digital Number Systems	14	(21)
Introduction	14	(1)
Understanding Number Systems	14	(1)
Decimal Numbers	14	(3)
Binary Numbers	17	(2)
BCD Numbers	19	(1)
Octal Numbers	20	(1)
Hexadecimal Numbers	21	(3)
Number Conversions	24	(1)
Decimal-to-Binary Conversion	24	(1)
Decimal-to-Octal Conversion	25	(1)
Decimal-to-Hexadecimal Conversion	25	(1)
Decimal-to-BCD Conversion	26	(1)
BCD-to-Decimal Conversion	26	(1)
Binary-to-Decimal Conversion	27	(1)
Octal-to-Decimal Conversion	28	(1)
Hexadecimal-to-Decimal Conversion	28	(1)
Binary Arthmetic	29	(1)
Binary Addition	29	(1)
Binary Subtraction	30	(1)
ASCII Code	31	(1)
ASCII Code	31	(4)
Summary	33	(1)
Problems	34	(1)
Answers to Review Questions	34	(1)
Basic Logic Gates	35	(50)
Introduction	35	(1)
Logic Gate Types	36	(1)
Logic Gate Integrated Circuits	36	(2)
AND Gates	38	(6)
Experiment: Logic Probe and Pulser	39	(5)
OR Gates	44	(2)
Inverter	46	(1)
NAND Gate	47	(2)
NOR Gate	49	(6)
Experiment: Basic Gates and Integrated Circuits	51	(4)
Exclusive-OR Gate	55	(1)
Exclusive-NOR Gate	56	(6)
Experiment: Exclusive-OR and NOR Gates	58	(4)
Memorizing Truth Tables	62	(1)
Gate Substitutions	63	(3)
State Indicators	66	(4)
Three-State Logic	70	(5)
Experiment: Tristate Logic Devices	71	(4)
Troubleshooting	75	(10)
Summary	79	(1)
Problems	79	(5)
Answers to Review Questions	84	(1)
Boolean Algebra	85	(26)
Introduction	85	(1)
Boolean Algebra Characteristics	86	(1)
Symbology	86	(3)
Boolean Algebra Applications	88	(1)
Boolean Equations as a Shorthand for Logic Circuit Configuration	89	(4)
Boolean Equations that Describe Logic Circuit Operations	93	(1)
Designing Logic Circuits Using Boolean Expressions	94	(1)
Boolean Algebra Simplification	95	(11)
Boolean Algebra and Associated Laws	96	(10)
Troubleshooting	106	(5)
Summary	107	(1)
Problems	107	(1)
Answers to Review Questions	108	(3)
Combination Circuits	111	(65)
Introduction	111	(1)
Conversion Circuits	112	(1)
Octal-to-Binary Encoder	112	(6)
Decimal-to-Binary Encoder	118	(7)
Experiment: Priority Encoder	119	(6)
BCD-to-Decimal Decoder	125	(5)
Experiment: BCD--Decimal Decoder	125	(5)
BCD-to-Seven-Segment Decoder/Driver	130	(7)
Liquid Crystal Displays	132	(3)
Data-Transfer Circuits	135	(2)
Multiplexer	137	(6)
Experiment: Multiplexer/Data Selector	139	(4)
Demultiplexer	143	(6)
Experiment: Demultiplexer/Data-Transfer Circuit	146	(3)
Parity Circuits	149	(4)
Data Processing Circuits	153	(1)
Binary Adder Circuit	153	(6)
Experiment: Binary Full Adder	154	(5)
Magnitude Comparator	159	(8)
Experiment: Magnitude Comparator	161	(3)
Experiment: Cascading Magnitude Comparators	164	(3)
Troubleshooting	167	(9)
Summary	169	(1)
Problems	170	(4)
Answers to Review Questions	174	(2)
Integrated Circuits	176	(42)
Evolution of ICs	176	(1)
Manufacturing an Integrated Circuit	177	(2)
Bipolar Families	179	(1)
MOS Family IC	180	(3)
Using IC Data Sheets	182	(1)
Name	183	(1)
Part Number	183	(3)
General Description	186	(1)
Connection Diagram	186	(1)
Function Table	186	(1)
Absolute Maximum Ratings Table	186	(1)
Recommended Operating Conditions	187	(4)
DC Electrical Characgteristics Table	191	(11)
Experiment: Open-Collector Logic Devices	193	(5)
Experiment: Input and Output Logic Voltage Levels	198	(4)
Switching Characteristics Table	202	(4)
Experiment: Propagation Delay	204	(2)
Input and Output Loading and Fan-Out Table	206	(4)
Experiment: Input and Output Current Ratings	208	(2)
Selecting ICs	210	(1)
Interfacing ICs	211	(2)
Troubleshooting	213	(5)
Summary	214	(1)
Problems	214	(2)
Answers to Review Questions	216	(2)
Basic Storage Elements: Latches and Flip-Flops	218	(32)
Introdduction	218	(1)
Basic Storage-Element Concepts	219	(1)
NOR R-S Latch	220	(2)
NAND R-S Latch	222	(2)
Gated R-S Latch	224	(2)
D Latch	226	(2)
D Flip-Flop	228	(1)
Clock-Pulse Triggering	228	(3)
T Flip-Flop	231	(1)
J-K Flip-Flop	232	(1)
Preset and Clear Inputs	233	(8)
Experpiement: J-K Flip-Flop	237	(4)
Master-Slave-Slave J-K Flip-Flop	241	(3)
Troubleshooting Flip-Flops	244	(6)
Summary	246	(1)
Problmes	246	(3)
Answers to Review Questions	249	(1)
Counters	250	(46)
Introduction to Sequential Circuits	251	(1)
Introduction to Counters	251	(1)
Binary up-Counter	251	(3)
Binary Down-Counter	254	(1)
Controlling Counter Functions	254	(2)
Modulo Coungters	256	(1)
Mod-10 Decade Up-Counter	256	(1)
Mod-6 Up-Counter	257	(1)
Mod-10 Down-Counter	258	(2)
Mod-6 Down-Counter	260	(1)
The 7493 Binary Counter	261	(9)
Experiment: Mod-16 Binary Up-Counter	264	(6)
The 7490 Decade Counter	270	(4)
Synchronous Up/Down-Counter ICs	274	(12)
Experiment: Up/Down Counter	276	(7)
Experiment: Cascading Up/Down Counters	283	(3)
Frequency Divider	286	(3)
Troubleshooting	289	(7)
Summary	292	(1)
Problems	292	(3)
Answers to Review Questions	295	(1)
Registers	296	(38)
Introduction	296	(1)
Storage Registers	297	(1)
Shift Registers	297	(1)
Serial-In Serial-Out (SISO) Shift Register	298	(5)
Parallel-In Parallel-Out (PIPO) Shift Register	303	(1)
Data Conversion	304	(2)
Parallel-In Serial-Out (PISO) Shift Register	306	(1)
Serial-In Parallel-Out (SIPOO) Shift Register	307	(6)
Experiment: Shift Registers	308	(5)
Bidirectional Shift Registers	313	(4)
The 74194 Universal Shift Register	317	(11)
Experiment: 74194 Universal Shift Register	320	(6)
Experiment: Cascading the 74194 Universal Shifts Register	326	(2)
Troubleshooting a Shifts Register	328	(6)
Summary	330	(1)
Problmes	330	(3)
Answers to Review Questions	333	(1)
Arithmetic Circuits	334	(31)
Intrdouction	334	(1)
Serial Adder Circuit	335	(6)
Serial Subtractor Circuit	341	(7)
Experiment: Adder/Substractor Circuit	344	(4)
Parallel Adder/Subtrtactor Circuit	348	(1)
Multiplication Circuit	349	(5)
Divider Circuit	354	(6)
Troubleshooting	360	(5)
Summary	362	(1)
Problmes	363	(1)
Answers to Review Questions	364	(1)
Conversion Devices and Circuits	365	(62)
Introdiction	366	(1)
Operational Amplifiers	366	(1)
Comparators	367	(2)
Inverting Amplifiers	369	(1)
Voltage-Summing Amplifiers	370	(4)
Experiment: Operational Amplifiers	371	(3)
Digital-to-Analog Converters	374	(6)
Experiment: Binary-Weighted D/A Converter	377	(3)
Intergrated Circuit Digigal-to-Analog Converter	380	(4)
Experiment: Integrated Circuit Digital-to-Analog Converter	382	(2)
Analog-to-Digital Converter	384	(8)
Experiment: Counter-Ramp A/D Converter	387	(5)
Intergrated Circuit Analog-to-Digital Converter	392	(5)
Experiment: IC Analog-to-Digital Converter	394	(2)
Digital Signal-Generating Devices	396	(1)
Logic-Gate Devices	397	(1)
Mechanical Switches	397	(3)
Wave-Shaping Devices	400	(5)
Experiment: Schmitt Trigger	402	(3)
Multivibrators	405	(13)
Experiment: 555 Clock Timer (Astable Multivibrator)	410	(5)
Experiment: 555 Clock Timer (Monostable One-Shot Multivibrator	415	(3)
Optical Encoders	418	(5)
Troubleshooting a D/A Converter	423	(4)
Summary	424	(1)
Problmes	425	(1)
Answers to Review Questions	426	(1)
Memory Devices	427	(36)
Introduction	427	(1)
Memory Organization	428	(3)
Working Memory	431	(1)
Read-Only Memory (ROM)	431	(7)
Random-Access Memory (RAM)	438	(2)
The Operation of A RAM IC	440	(7)
Experiment: Integrated Circuit Random-Access Memory (RAM)	442	(5)
Memory Capacity	447	(1)
Mass Memory Storage	448	(7)
Programmable Logic Devices (PLDs)	455	(2)
Troubleshooting a RAM Device	457	(6)
Summary	459	(1)
Problems	459	(3)
Answers to Review Questions	462	(1)
Functional Digital Circuits	463	(44)
Digitl Voltmeter	464	(2)
Digital Frequency Counter	466	(4)
Digital Measuring Instruments	470	(3)
Digital Device Controlling the Velocity of a Motor	473	(1)
Digital Device Controlling the Number of Motor Revolutions	474	(3)
Digital Control of a Physical Position	477	(3)
Digital Clock	480	(4)
Basketball Shooting Game	484	(4)
Digital Sound Synthesizer	488	(4)
Digital Lock	492	(4)
Digital Music Synthesizer	496	(3)
Coffee Vending Machine	499	(5)
Troubleshooting a Digital Clock	504	(3)
Problems	505	(1)
Answers to Review Questions	506	(1)
Appendix A TROUBLESHOOTING DIGITAL SYSTEMS	507	(14)
A.1 Troubleshooting Stpes	507	(1)
A.2 Test Instrument Used	508	(3)
A.3 How to Use the Logic Probe	511	(3)
A.4 Logic Clip and Current Tracer	514	(1)
A.5 The Isolated Fault	514	(1)
A.6 Internal Digital IC Faults	515	(1)
A.7 External Digital IC Faults	516	(1)
A.8 Intermittent Problems	517	(1)
A.9 More Troubleshooting Steps	518	(3)
Appendix B IEEE STANDARD LOGIC SYMBOLS	521	(8)
B.1 Symbol Composition	521	(1)
B.2 Logic Gates	521	(2)
B.3 Dependency Notation	523	(2)
B.4 Common-Control Block	525	(4)
Appendix C ANSWER TO SELECTED PROBLEMS	529	(6)
Glossary	535	(6)
Index	541

Excerpts

This book is an introductory text for students new to the electronics field. Before using the text, students should have had a course in DC circuits; and while using it, students should be concurrently enrolled in a basic solid-state electronics class. This text can be the basis for a one- or two-semester course in digital electronics at the vocational school, technical school, or community college level, and in industrial education at the university level. It is also appropriate for students enrolled in continuing education evening courses and for advanced high school students studying digital electronics. With a background in individualized instruction, the author has taken great care to describe the concepts completely and with clarity, making the book also appropriate for book club members, for military schools, and as a reference in self-study courses. Because each chapter of the book builds on information presented in the preceding chapter, it is important that the reader comprehend the initial material before advancing to the more difficult material covered in later chapters. The exception is chapter 4 on Boolean algebra. This chapter is designed to be studied either in the numerical sequence where it is placed or at the end of the book, or it may be deleted. Each chapter begins with a list of objectives and concludes with a summary and end-of-chapter problems. Illustrative examples and review questions are placed throughout each chapter for consistent reinforcement and the figures are designed to enhance the explanation of the concepts. Explanations about the use of components and circuits in practical digital devices are provided to give the reader a better insight and understanding. Many of the digital components or circuits in this book also exist in integrated circuit form. These ICs are included and their operation is described in detail. To reinforce the theory of digital components and circuits, there are 31 experiments included in the book. All of these lab activities have been class tested and can be performed on protoboards. A test file that contains exams for each chapter is provided with an answer key in an instructor's guide. The guide also has answers to all the review questions and chapter problems in the text, and solutions for all the laboratory experiments. The author has constructed some of the circuits for the laboratory experiments on the simulation software product produced by Electronics Workbench (MultiSim). These circuits are provided on a CD-ROM that accompanies the instructor's guide. An appendix on troubleshooting procedures and test equipment used for defective digital circuitry is included. The last section of all but two chapters describes troubleshooting principles that apply to the types of circuitry covered in each chapter. Chapter problems include exercises to help the reader envision and experience the troubleshooting process. The last chapter explains how circuits described throughout the book can be used in the construction of functional digital equipment. I wish to thank the reviewers of the manuscript: Terry Collett, Lake Michigan College; Richard Skelton; and Ray Williams, Tennessee State University. I would like to express my appreciation to my colleagues and students who have given me assistance and feedback during the development of the text. I would also like to acknowledge my editor, Scott Sambucci, and Holly Henjum from Clarinda Publication Services. Special thanks to my wife Carol for her patience and support during this long project. Terry Bartelt