Preface | p. ix |
Acknowledgments | p. xi |
Materials Research Society Symposium Proceedings | p. xii |
Dislocation and Deformation Mechanisms in Thin Metal Films and Multilayers I | |
Constrained Diffusional Creep in Thin Copper Films | P1.2 |
An Experimental and Computational Study of the Elastic-Plastic Transition in Thin Films | P1.3 |
"Reverse" Stress Relaxation in Cu Thin Films | P1.4 |
Stress Evolution in a Ti/Al(Si,Cu) Dual Layer During Annealing | P1.5 |
Study of the Yielding and Strain Hardening Behavior of a Copper Thin Film on a Silicon Substrate Using Microbeam Bending | P1.9 |
Mechanical Behavior of Thin Cu Films Studied by a Four-Point Bending Technique | P1.10 |
Discrete Dislocations: Observations and Simulations | |
Dislocation Dynamics Simulations of Dislocation Interactions in Thin FCC Metal Films | P2.2 |
Discrete Dislocation Simulation of Thin Film Plasticity | P2.3 |
Influence of Film/Substrate Interface Structure on Plasticity in Metal Thin Films | P2.6 |
Observations of Dislocation Motion and Stress Inhomogeneities in a Thin Copper Film | P2.7 |
Dislocations and Deformation Mechanisms in Thin Films and Small Structures | |
Solid Solution Alloy Effects on Microstructure and Indentation Hardness in Pt-Ru Thin Films | P3.2 |
Lack of Hardening Effect in TiN/NbN Multilayers | P3.3 |
Temperature and Strain Rate Dependence of Deformation-Induced Point Defect Cluster Formation in Metal Thin Foils | P3.5 |
Dislocation Locking by Intrinsic Point Defects in Silicon | P3.9 |
Optical Study of SiGe Films Grown With Low Temperature Si Buffer | P3.11 |
Thickness-Fringe Contrast Analysis of Defects in GaN | P3.12 |
Dislocations in Small Structures | |
Modeling of Dislocations in an Epitaxial Island Structure | P4.2 |
Misfit Dislocation Introduction During the Epitaxial Growth of InAs Islands on GaP | P4.3 |
X-ray Diffuse Scattering From Misfit Dislocation at Buried Interface | P4.9 |
Dislocations and Deformation in Epitaxial Layers | |
Development of Cross-Hatch Morphology During Growth of Lattice Mismatched Layers | P5.2 |
Mechanism for the Reduction of Threading Dislocation Densities in Si[subscript 0.82]Ge[subscript 0.18] Films on Silicon on Insulator Substrates | P5.3 |
TEM Study of Strain States in III-V Semiconductor Epitaxial Layers | P5.5 |
A Kinetic Model for the Strain Relaxation in Heteroepitaxial Thin Film Systems | P5.11 |
Dislocation Fundamentals: Observations, Calculations and Simulations | |
Dislocation Core Spreading at Interfaces Between Crystalline and Amorphous Solids | P6.6 |
Dislocation Networks Strain Fields Induced by Si Wafer Bonding | P6.9 |
Dislocations and Deformation Mechanisms in Thin Metal Films and Multilayers II | |
Misfit Dislocations in Epitaxial Ni/Cu Bilayer and Cu/Ni/Cu Trilayer Thin Films | P7.1 |
Structure and Mechanical Behavior Relationship in Nano-Scaled Multilayered Materials | P7.3 |
Dislocations in Thin Metal Films Observed With X-Ray Diffraction | P7.6 |
Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction | P7.7 |
Deformation Microstructure of Cold Gas Sprayed Coatings | P7.10 |
Plastic Deformation of Thin Metal Foils Without Dislocations and Formation of Point Defects and Point Defect Clusters | P7.11 |
Author Index | |
Subject Index | |
Table of Contents provided by Syndetics. All Rights Reserved. |
The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.