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9780470623466

Electrical Modeling and Design for 3D System Integration 3D Integrated Circuits and Packaging, Signal Integrity, Power Integrity and EMC

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  • ISBN13:

    9780470623466

  • ISBN10:

    0470623462

  • Edition: 1st
  • Format: Hardcover
  • Copyright: 2012-04-10
  • Publisher: Wiley-IEEE Press

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Summary

The first book to address electromagnetic modeling methodologies for analysis of the large complex electronic structures, Efficient Electromagnetic Modeling for High Speed Electronics systematically reviews a series of fast and efficient electromagnetic modeling techniques. The book presents a number of special methods to solve the SI, PI, and EMI problems and provides an overview of the existing electromagnetic modeling methods used in electronic chips, package, and PCB. The text also addresses the limitations individuals in the real-world engineering community face for design engineers, researchers, postgraduates, postdoctoral researchers, university professors, and consultants.

Author Biography

Er-ping Li, PhD, holds an appointment as Chair Professor at Zhejiang university, China, and has also been a principal scientist and director at the Institute of High performance Computing, Singapore. He is a Fellow of the IEEE and a fellow of the Electromagnetics Academy. He has received numerous awards and honors in recognition of his professional work from the IEEE and other professional bodies. Dr. Li is a pioneer in the modeling and simulation for signal/power and EMC in integrated circuits and electronic systems packaging. He has chaired oR spoken at numerous international conferences and universities, and has also served as editor to several IEEE transactions.

Table of Contents

Forewordp. xi
Prefacep. xiii
Introductionp. 1
Introduction of Electronic Package Integrationp. 1
Review of Modeling Technologiesp. 6
Organization of the Bookp. 10
Referencesp. 11
Macromodeling of Complex Interconnects in 3D Integrationp. 16
Introductionp. 16
Scope of macromodelingp. 18
Macromodeling in the picture of electrical modeling of interconnectsp. 19
Network Parameters: Impedance, Admittance, and Scattering Matricesp. 19
Impedance matrixp. 21
Admittance matrixp. 22
Scattering matrixp. 23
Conversion between Z, Y, and S matricesp. 24
Rational Function Approximation with Partial Fractionsp. 25
Introductionp. 25
Iterative weighted linear least-squares estimatorp. 27
Vector Fitting (VF) Methodp. 29
Two steps in vector fitting methodp. 29
Fitting vectors with common polesp. 35
Selection of initial polesp. 37
Enhancement to the original vector fitting methodp. 38
Macromodel Synthesisp. 41
Jordan canonical method for macromodel synthesisp. 42
Equivalent circuitsp. 46
Stability, Causality, and Passivity of Macromodelp. 48
Stabilityp. 48
Causalityp. 50
Passivity assessmentp. 54
Passivity enforcementp. 58
Other issuesp. 78
Macromodeling Applied to High-Speed Interconnects and Circuitsp. 79
A lumped circuit with nonlinear componentsp. 79
Vertically natural capacitors (VNCAPs)p. 83
Stripline-to-microstrip line transition with viasp. 87
Conclusionp. 91
Referencesp. 92
2.5D Simulation Method for 3D Integrated Systemsp. 97
Introductionp. 97
Multiple Scattering Method for Electronic Package Modeling with Open Boundary Problemsp. 98
Modal expansion of fields in a parallel-plate waveguide (PPWG)p. 98
Multiple scattering coefficients among cylindrical PEC and perfect magnetic conductor (PMC) viasp. 101
Excitation source and network parameter extractionp. 109
Implementation of effective matrix-vector multiplication (MVM) in linear equationsp. 117
Numerical examples for single-layer power-ground planesp. 121
Novel Boundary Modeling Method for Simulation of Finite-Domain Power-Ground Planesp. 127
Perfect magnetic conductor (PMC) boundaryp. 128
Frequency-dependent cylinder layer (FDCL)p. 128
Validations of FDCLp. 131
Numerical Simulations for Finite Structuresp. 133
Extended scattering matrix method (SMM) algorithm for finite structure simulationp. 133
Modeling of arbitrarily shaped boundary structuresp. 139
Modeling of 3D Electronic Package Structurep. 142
Modal expansions and boundary conditionsp. 143
Mode matching in PPWGsp. 150
Generalized T-matrix for two-layer problemp. 158
Formulae summary for two-layer problemp. 164
Formulae summary for 3D structure problemp. 169
Numerical simulations for multilayered power-ground planes with multiple viasp. 176
Conclusionp. 182
Referencesp. 183
Hybrid Integral Equation Modeling Methods for 3D Integrationp. 185
Introductionp. 185
2D Integral Equation Equivalent Circuit (IEEC) Methodp. 186
Overview of the algorithmp. 186
Modal decoupling inside the power distribution network (PDN)p. 187
2D integral equation solution of parallel plate mode in power-ground planes (PGPs)p. 189
Combinations of transmission and parallel plate modesp. 194
Cascade connections of equivalent networksp. 205
Simulation resultsp. 214
3D Hybrid Integral Equation Methodp. 220
Overview of the algorithmp. 220
Equivalent electromagnetic currents and dyadic green's functionsp. 224
Simulation resultsp. 231
Conclusionp. 238
Referencesp. 238
Systematic Microwave Network Analysis for 3D Integrated Systemsp. 241
Intrinsic Via Circuit Model for Multiple Vias in an Irregular Plate Pairp. 242
Introductionp. 242
Segmentation of vias and a plate pairp. 245
An intrinsic 3-port via circuit modelp. 248
Determination of the virtual via boundaryp. 263
Complete model for multiple vias in an irregular plate pairp. 267
Validation and measurementsp. 269
Conclusionp. 280
Parallel Plane Pair Modelp. 281
Introductionp. 281
Overview of two conventional Zpp definitionsp. 283
New Zpp definition using the zero-order parallel plate wavesp. 285
Analytical formula for radial scattering matrix SRpp in a circular plate pairp. 290
BIE method to evaluate SRpp for an irregular plate pairp. 292
Numerical examples and measurementsp. 296
Conclusionp. 303
Cascaded Multiport Network Analysis of Multilayer Structure with Multiple Viasp. 305
Introductionp. 305
Multilayer PCB with vias and decoupling capacitorsp. 307
Systematic microwave network methodp. 308
Validations and discussionp. 316
Conclusionp. 324
Appendix: Properties of the Auxiliary Function Wmn(x, y)p. 326
Referencesp. 327
Modeling of Through-Silicon Vias (TSV) in 3D Integrationp. 331
Introductionp. 331
Overview of process and fabrication of TSVp. 332
Modeling of TSVp. 335
Equivalent Circuit Model for TSVp. 336
Overviewp. 337
Problem statement: Two-TSV configurationp. 338
Wideband Pi-type equivalent-circuit modelp. 339
Rigorous closed-form formulae for resistance and inductancep. 341
Scattering parameters of two-TSV systemp. 345
Results and discussionp. 346
MOS Capacitance Effect of TSVp. 351
MOS capacitance effectp. 351
Bias voltage-dependent MOS capacitance of TSVsp. 351
Results and analysisp. 355
Conclusionp. 356
Referencesp. 358
Indexp. 361
Table of Contents provided by Ingram. All Rights Reserved.

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