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| Contributors | |
| Foreword | |
| Preface | |
| Introduction to Electronic Instruments | |
| Measurements and Instruments | p. 1.1 |
| Calibration, Traceability, and Standards | p. 2.1 |
| Basic Electronic Standards | p. 3.1 |
| Basics of Electronic Instrumentation | |
| Introduction to Electronic Instruments | p. 4.1 |
| Transducers | p. 5.1 |
| Analog-to-Digital Converters | p. 6.1 |
| Signal Sources | p. 7.1 |
| Microwave Signal Sources | p. 8.1 |
| Signal Processing | p. 9.1 |
| Microprocessors in Electronic Instruments | p. 10.1 |
| Power Supplies | p. 11.1 |
| Instrument-User Interfaces | p. 12.1 |
| Current and Voltage Measurement Instruments | |
| Voltage, Current, and Resistance Measuring Instruments | p. 13.1 |
| Oscilloscopes | p. 14.1 |
| Power Measurements | p. 15.1 |
| Signal and Waveform Generation Instruments | |
| Oscillators, Function Generators, Frequency and Waveform Synthesizers Generators | p. 16.1 |
| Pulse Generators | p. 17.1 |
| Microwave Signal Generators | p. 18.1 |
| Frequency and Time Measurement Instruments | |
| Electronic Counters and Frequency and Time Interval Analyzers | p. 19.1 |
| Precision Time and Frequency Sources | p. 20.1 |
| Spectrum Analyzers | p. 21.1 |
| Phase Noise Instruments | p. 22.1 |
| Lightwave Test Instruments | |
| Lightwave Signal Sources | p. 23.1 |
| Lightwave Signal Analysis | p. 24.1 |
| Lightwave Component Analyzers | p. 25.1 |
| Optical Time Domain Reflectometers | p. 26.1 |
| Circuit Element Measurement Instruments | |
| Impedance Measuring Instruments | p. 27.1 |
| Semiconductor Test Instruments | p. 28.1 |
| Network Analyzers | p. 29.1 |
| Digital Domain Instruments | |
| Data/Word Generators | p. 30.1 |
| Logic Analyzers | p. 31.1 |
| Protocol Analyzers | p. 32.1 |
| Bit Error Rate Measuring Instruments: Pattern Generators and Error Detectors | p. 33.1 |
| Waveguide Passive Devices | |
| Microwave Passive Devices | p. 34.1 |
| Using Electronic Instruments | |
| Impedance Considerations | p. 35.1 |
| Electrical Interference | p. 36.1 |
| Electrical Grounding | p. 37.1 |
| Distributed Parameters and Component Considerations | p. 38.1 |
| Digital Interface Issues | p. 39.1 |
| Instruments in Systems | |
| Introduction to Instrument Systems | p. 40.1 |
| Switches in Automated Test Systems | p. 41.1 |
| Instrument System Elements | p. 42.1 |
| Computer-Controlled Instrument Systems | p. 43.1 |
| Software in Instruments and Virtual Instruments | |
| Virtual Instruments and the Role of Software | p. 44.1 |
| Acronyms and Abbreviations | p. A.1 |
| Index | p. I.1 |
| Table of Contents provided by Blackwell. All Rights Reserved. |
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