Summary

An essential reference for statisticians, engineers, and quality professionals in industry, academia, and government, Encyclopedia of Statistics in Quality and Reliability offers an essential knowledge source in an area where one is sorely needed. Providing a practical orientation with a large selection of case studies, this multi-volume state-of-the-art publication examines the widespread use of Six Sigma. This popular quality measuring technique is a highly adaptable tool with many wide-reaching applications in a large variety of sectors.

Author Biography

Editors-in-Chief

Fabrizio Ruggeri, CNR-IMATI, Milan, ItalyProf. Ruggeri's research interests include reliability, general statistical modelling with applications in industry, and Bayesian statistics. He is a former President of the European Network for Business and Industrial Statistics (ENBIS) and former Board member of the International Society for Bayesian Analysis (ISBA). He edited two volumes on Bayesian Robustness and special issues of journals. He also served as the Editor (1999-2002) of the ISBA Bulletin and is currently Editor-in-Chief of Applied Stochastic Models in Business and Industry and an Editor of Bayesian Analysis. He is Co-Director of the Applied Bayesian Statistics summer school (ABS) and Chair of the Scientific Committee of the Bayesian Inference in Stochastic Processes (BISP) series of workshops. He is a faculty in the Ph.D. programme in Mathematics and Statisics at the University of Pavia and the Master programme in Applied Mathematics for Industry at University of Milano Bicocca. He has been member of many committees, including Savage Award, De Groot Award and Box Medal. He is the author of nearly 100 publications.

Ron S. Kenett, KPA Ltd, Raanana, Israel and University of Turin, Turin, Italy. Professor Kenett’s interests include Strategic Planning and Quality Management, Industrial Statistics and Biostatistics, Statistical Process Control and Design of Experiments, Survey Methodology and Software Quality. He is a Fellow of the Royal Statistical Society, a Senior Member of the American Society for Quality,past member of the board of the Israeli Statistical Association and past president of ENBIS, the European Network for Business and Industrial Statistics. He is editor in chief of the journal Quality Technology and Quantitative Management and associate editor of the Journal of the Royal Statistical Society (A) and Applied Stochastic Models in Business and Industry. He is co author of 4 books and over 130 papers, including Modern Industrial Statistics (with S. Zacks), Duxbury Press 1998, and Software Process Quality - Management and Control (with E. Baker) Marcel Dekker Inc., 1999. Ron has been a consultant for leading corporations such as AT&T, hp, EDS, SanDisk, IBM and Amdocs. His career has combined academic positions with activity in the industrial and business sector.

Frederick W. Faltin, The Faltin Group, Cody, WY, USAMr. Faltin’s interests include Managing Six Sigma, Design for Six Sigma, Business Process Simulation & Optimization, Financial Quality, Supply Chain Management, and Design of Experiments. He is a Fellow of the American Statistical Association, a recipient of the Shewell Prize of the American Society for Quality, and has served on the selection committees of various ASQ awards. He served on the Editorial Review Board of the Journal of Quality Technology, is a past Chair of ASA's Quality and Productivity Section, and is a member of the boards of the Quality & Productivity Research Conference and the Fall Technical Conference. Mr. Faltin has published dozens of papers on applications of mathematics & statistics, and has authored Six Sigma curricula for a number of prominent companies, including Motorola—the company that invented Six Sigma. He was formerly manager of the Strategic Enterprise Technologies laboratory at GE’s Global Research Center, and is today Managing Director of The Faltin Group, which he founded in 1999.

Editors

Basics Statistics

Jeroen de Mast, University of Amsterdam,

The Netherlands

Computationally Intensive Methods & Simulation

Simon Wilson, Trinity College Dublin, Ireland

Design of Experiments & Robust Design

David Steinberg, Tel Aviv University, Israel

Health, Safety & Environmental Applications

Tony Greenfield, Greenfield Research, UK

Management of Quality & Business Statistics

Blanton Godfrey, College of Textiles, USA

Ramon Leon, University of Tennessee, USA

Process Capability & Measurement Systems Analysis

Connie Borror, University of Illinois, USA

Process Control

Mike Adams, University of Alabama, USA

Reliability: Life Cycle & Warranty Cost Prediction

Refik Soyer, George Washington University, USA

Reliability: Life Distribution Modeling & Accelerated Testing

Tom Mazzuchi, George Washington University, USA

Sampling

Rainer Göb, University of Wuerzberg, Germany

Statistical and Stochastic Modelling

Shelley Zacks, Binghamton University, USA

System Reliability

Steven Rigdon, Southern Illinois University, USA

Entries in the published Encyclopedia are presented in alphabetic order
The following listing shows articles grouped under the section headings used for editorial planning of the work
Basic Statistics
Assignable cause
Autocorrelation function
Bias of an estimator
Box and Cox transformation
Coefficient of determination (R2)
Collinearity
Confidence intervals
Correlation
Covariance
Covariate
Cumulative distribution function (CDF)
Data collection
Degrees of freedom
Dependence
Descriptive Statistics
Estimation
Expectation
Exploratory data analysis
Exponentially weighted moving average (EWMA)
Graphical representation of data
Heteroscedasticity
Homogeneity of Variances; Homoscedasticity
Hotelling's T2
Hypothesis testing
Kurtosis
Lack of fit
Laws of large numbers
Least squares estimation
Leverage
Maximum likelihood
Mean square error
Measures of Association
Measures of Location
Measures of Scale
Missing data and imputation
Moments
Monte Carlo methods
Moving averages
Multi-vari chart
Multivariate analysis
Nonparametric Tests
Normal distribution
Normality Tests
Observational studies
Outliers
Overview of Statistics
Parametric tests
Pareto chart
Pooled variance, pooled estimate
Power
Probability density function (PDF)
Probability density functions
Probability plots
Probability theory
P-values
Quantiles
Quartiles
Residuals
Runs, runs tests
Sample Size Determination
Sigma Metric
Significance level
Six Sigma Method
Skewness
Standard error
Statistical Methods for Counts, Rates and Proportions
Sum of squares
Time series analysis
Transfer function
Trimmed mean
Variables
Variance
Variance components
Computationally Intensive Methods & Simulation
Asymptotic Reliability Analysis of Very Large Systems
Bayesian networks in reliability
Bayesian robustness: theory and computation
Bootstrap And Jacknife: Overview
Classification and Regression Tree Methods
Computational Issues in Network Reliability
Convergence and Mixing in Markov Chain Monte Carlo
Data Mining in Quality and Reliability
Decision search via simulation
Density and failure rate estimation
Dirichlet process, Simulation of
Discrete event simulation for reliability prediction
Dynamic Programming
Methods in Repair and Replacement
Evaluation techniques in data mining
Expectation Maximisation Algorithm
Failure Modes and Effects Analysis, Implementation of
Fault tree analysis for large systems
Integrating computer and physical experiment data
Laplace approximations in Bayesian lifetime analysis
Levy Processes, Simulation of
Life Distributions, Simulation of
Lifetime Distributions, Optimization Methods for
Markov chain Monte Carlo, Introduction
Monte Carlo Methods: Univariate and Multivariate
Neural networks in Statistical Process Control
Optimal Reliability Design- Algorithms and Comparisons
Optimal Reliability Design- ModellingP
Table of Contents provided by Publisher. All Rights Reserved.

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