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Preface | |
Optical Wave Propagation in Periodic Structures | p. 1 |
MEMS Technology for Advanced Telecommunication Applications | p. 9 |
Low Temperature Physics at Room Temperature in Water: Charge Inversion in Chemical and Biological Systems | p. 29 |
MOSFET and Front-End Process Integration: Scaling Trends, Challenges, and Potential Solutions Through the End of the Roadmap | p. 61 |
Issues, Achievements and Challenges Towards Integration of High-k Dielectrics | p. 89 |
Materials for Strained Silicon Devices | p. 99 |
Recent Progress of Ferroelectric Memories | p. 109 |
System-on-Chip Integration | p. 119 |
Ultra-Thin SOI Transistors for Ultimate CMOS Technology: Fundamental Properties and Application Perspectives | p. 127 |
Far-Future Trends in SOI Technology: A Guess | p. 137 |
Nanoelectronics: Some Current Aspects and Prospects | p. 147 |
Electrotextiles | p. 159 |
Semiconductor Thin Films and Thin Films Devices for Electrotextiles | p. 165 |
Electrotextiles: Concepts and Challenges | p. 185 |
Strain Energy Band Engineering Approach to AlN/GaN/InN Heterojunction Devices | p. 195 |
Semiconductor UV Sources and Detectors: Some Non-Consumer Applications | p. 215 |
Optimization of White All-Semiconductor Lamp for Solid-State Lighting Applications | p. 223 |
System Impact of Silicon Carbide Power Devices | p. 233 |
Low Frequency Noise in Gallium Nitride Field Effect Transistors | p. 243 |
Hot-Phonon Limited Electron Energy Relaxation in AlN/GaN | p. 253 |
Polar-Optical Phonon Enhancement of Harmonic Generation in Schottky Diodes | p. 263 |
Environmental Sensing of Chemical and Biological Warfare Agents in the THz Region | p. 273 |
THz Detection by Resonant 2-D Plasmons in Field Effect Devices | p. 285 |
Thermal Management in Optoelectronics | p. 295 |
The Multiple-Gate MOS-JFET Transistor | p. 305 |
Architecture and Design of an 8-Bit FLUX-1 Superconductor RSFQ Microprocessor | p. 315 |
Noise Measurement of III-V Compound Detectors for 2 [mu]m Lidar/DIAL Remote Sensing Applications | p. 325 |
Spectral Response Measurements of Short Wave Infrared Detectors (SWIR) | p. 335 |
Numerical Analysis of Random Dopant-Induced Effects in Semiconductor Devices | p. 345 |
A Simulation-Based Preview of Extremely Scaled Double-Gate CMOS Devices and Circuits | p. 357 |
Full-Chip Power-Supply Noise: The Effect of On-Chip Power-Rail Inductance | p. 367 |
Quantum Dot Superlattices in a Constant Electric Field: Localization and Bloch Oscillations | p. 377 |
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