High Performance Instrumentation and Automation

by Garrett; Patrick H.

• ISBN13: 9780849337765
• ISBN10: 0849337763
• Format: Hardcover
• Copyright: 2005-05-26
• Publisher: CRC Press

Summary

Improvements in process control, such as defined-accuracy instrumentation structures and computationally intelligent process modeling, enable advanced capabilities such as molecular manufacturing. High Performance Instrumentation and Automation demonstrates how systematizing the design of instrumentation and automation leads to higher performance through more homogeneous systems, which are frequently assisted by rule-based, fuzzy logic, and neural network process descriptions.The book illustrates generic common core process-to-control concurrent engineering linkages applied to a variety of laboratory and industry automation systems. It outlines:· Product properties translated into realizable process variables· Axiomatic decoupling of subprocess variables for improved robustness· Production planner model-driven goal state execution· In situ sensor and control structures for attenuating process disorder· Apparatus tolerance design for minimizing process variabilities· Production planner remodeling based on product features measurement for quality advancementCoverage also includes multisensor data fusion, high-performance computer I/O design guided by comprehensive error modeling, multiple sensor algorithmic error propagation, robotic axes volumetric accuracy, quantitative video digitization and reconstruction evaluation, and in situ process measurement methods.High Performance Instrumentation and Automation reflects the experience of engineer and author Patrick Garrett, including Co-Principal investigator for an Air Force intelligent manufacturing initiative, providing you with advanced performance enhancements to incorporate into your automation enterprise.

Table of Contents

Chapter 1 Thermal, mechanical, quantum, and analytical sensors	1	(24)
1.0 Introduction	1	(1)
1.1 Instrumentation error interpretation	1	(3)
1.2 Temperature sensors	4	(3)
1.3 Mechanical sensors	7	(5)
1.4 Quantum sensors	12	(4)
1.5 Analytical sensors	16	(7)
Bibliography	23	(2)
Chapter 2 Instrumentation amplifiers and parameter errors	25	(20)
2.0 Introduction	25	(1)
2.1 Device temperature characteristics	25	(1)
2.2 Differential amplifiers	26	(4)
2.3 Operational amplifiers	30	(3)
2.4 Instrumentation amplifiers	33	(7)
2.5 Amplifier parameter error evaluation	40	(2)
Bibliography	42	(3)
Chapter 3 Instrumentation filters with nominal error	45	(18)
3.0 Introduction	45	(1)
3.1 Bandlimiting instrumentation filters	45	(5)
3.2 Active filter networks	50	(6)
3.3 Filter error analysis	56	(6)
Bibliography	62	(1)
Chapter 4 Signal acquisition, conditioning, and processing	63	(20)
4.0 Introduction	63	(1)
4.1 Low-level signal acquisition :	63	(4)
4.2 Signal quality in random and coherent interference	67	(4)
4.3 DC, sinusoidal, and harmonic signal conditioning	71	(6)
4.4 Analog signal processing	77	(5)
Bibliography	82	(1)
Chapter 5 Data conversion devices and errors	83	(24)
5.0 Introduction	83	(1)
5.1 Analog multiplexers	83	(2)
5.2 Sample-holds	85	(3)
5.3 Digital-to-analog converters	88	(5)
5.4 Analog-to-digital converters	93	(12)
Bibliography	105	(2)
Chapter 6 Sampled data and recovery with intersample error	107	(24)
6.0 Introduction	107	(1)
6.1 Sampled data theory	107	(4)
6.2 Aliasing of signal and noise	111	(5)
6.3 Sampled data intersample and aperture errors	116	(5)
6.4 Output signal interpolation functions	121	(6)
6.5 Video sampling and reconstruction	127	(3)
Bibliography	130	(1)
Chapter 7 Advanced instrumentation systems and error analysis	131	(16)
7.0 Introduction	131	(1)
7.1 Integrated instrumentation design	131	(7)
7.2 Multisensor error propagation	138	(3)
7.3 Robotic axes volumetric error	141	(2)
Bibliography	143	(1)
Appendix A	144	(3)
Chapter 8 Automation systems concurrent engineering	147	(20)
8.0 Introduction	147	(1)
8.1 Concurrent engineering common core	147	(2)
8.2 Product property apparatus variables	149	(2)
8.3 Robust process axiomatic design	151	(3)
8.4 Automated production ex situ planner	154	(3)
8.5 Molecular in situ subprocess control	157	(2)
8.6 System variability tolerance analysis	159	(3)
8.7 Product features remodeling for quality maturity	162	(2)
Bibliography	164	(3)
Chapter 9 Molecular beam epitaxy semiconductor processing	167	(16)
9.0 Introduction	167	(1)
9.1 Molecular beam epitaxy concurrent engineering	167	(1)
9.2 MBE material property modeling	168	(1)
9.3 Robust process design and PID tuning	169	(6)
9.4 MBE in situ ellipsometry	175	(1)
9.5 Instrumentation and control tolerance analysis	176	(6)
Bibliography	182	(1)
Chapter 10 Aerospace composites rule-based manufacturing	183	(10)
10.0 Introduction	183	(1)
10.1 Composite manufacturing concurrent engineering	183	(2)
10.2 Composite cure properties and apparatus	185	(1)
10.3 Computational qualitative reasoning	186	(1)
10.4 Rule-based ex situ planner	186	(4)
10.5 In situ sensor fusion cure control	190	(1)
10.6 Temperature control tolerance analysis	190	(1)
Bibliography	191	(2)
Chapter 11 Fuzzy logic laser deposition superconductor production	193	(16)
11.0 Introduction	193	(1)
11.1 Superconductor processing concurrent engineering	193	(2)
11.2 Material property modeling	195	(1)
11.3 Robust axiomatic process decoupling	196	(1)
11.4 Observer remodeled ex situ planner	197	(4)
11.5 Spectrometer in situ fuzzy control	201	(2)
11.6 Process data tolerance evaluation	203	(3)
11.7 Superconductor Raman quality analysis	206	(2)
Bibliography	208	(1)
Chapter 12 Neural network directed steel annealing	209	(8)
12.0 Introduction	209	(1)
12.1 Steel annealing concurrent engineering	209	(1)
12.2 Recrystallization annealing physical properties	210	(2)
12.3 ANNEAL NET ex situ planner	212	(3)
12.4 Steel annealing in situ control	215	(1)
Bibliography	216	(1)
Chapter 13 X-Ray controlled vapor infiltration ceramic densification	217	(8)
13.0 Introduction	217	(1)
13.1 Ceramic matrix composite concurrent engineering	217	(1)
13.2 Combustor product property modeling	218	(1)
13.3 Microwave densification ex situ planner	219	(3)
13.4 X-Ray and infrared in situ control	222	(1)
Bibliography	223	(2)
Index	225