In-Situ Transmission Electron Microscopy Experiments Design and Practice

by Sharma, Renu

• ISBN13: 9783527347988
• ISBN10: 3527347984
• eBook ISBN(s): 9783527834846
• Edition: 1st
• Format: Hardcover
• Copyright: 2023-05-15
• Publisher: Wiley-VCH
• More Book Details
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Summary

In-Situ Transmission Electron Microscopy Experiments

Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide

In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and

their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals.

In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements,

incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research.

In-Situ Transmission Electron Microscopy Experiments readers will also find:

• Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis
• Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more
• Discussion of future challenges and opportunities facing this field of research

In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.

Author Biography

Dr. Khalid Hattar is a Principal Member of the Technical Staff in the Ion Beam Lab and Center for Integrated Nanotechnologies at Sandia National Laboratories in Albuquerque, New Mexico. He received a B.S. in Chemical Engineering with an emphasis in Materials Science from University of California, Santa Barbara in 2003, and a Ph.D. in Materials Science and Engineering from University of Illinois, Urbana-Champaign in 2009 under the guidance of Professor Ian M. Robertson. He specializes in determining the property-microstructure relationship for a variety of structural and functional materials through in situ electron microscopy techniques in various extreme environments, as well as tailoring local properties of materials through ion beam modification. This includes the development of the In-situ Ion Irradiation Transmission Electron Microscope that is designed to explore a range of juxtaposed conditions. He has given 74 invited presentations, published three book chapters, and over 100 research articles.
Dr. Renu Sharma is a Project Leader in the Physical Measurement Laboratory at National Institute of Standards and Technology (NIST). She received a B.S. and B.Ed. in Physics and Chemistry from Panjab University, India, and M.S. and Ph.D. degrees in Solid State Chemistry from the University of Stockholm, Sweden. She joined NIST in 2009 as a Faculty Research Associate in the Department of Chemistry and Biochemistry and the Center for Solid State Science. She is a pioneer in the development of environmental scanning transmission electron microscopy (E(S)TEM), combining atomic-scale dynamic imaging with chemical analysis to probe gas-solid reactions. She has received a Bronze Medal of Service from Department of Commerce for developing new measurement techniques. She has given over 90 invited presentations, edited one book, published 5 book chapters and over 200 research articles. At the NIST, she established an advanced E(S)TEM measurement capabilities, that combines Raman spectroscopy, cathodoluminescence with electron diffraction, electron spectroscopy, high-resolution imaging and plasmonics, applied in nanoscience research.

Table of Contents

Table of Contents

CHAPTER 1
INTRODUCTION

1.1 Scope of the Book
1.2 Review of the Chapters

CHAPTER 2
FUNDAMENTALS OF ELECTRON MICROSCOPY

2.1 Overview of Electron Optics
2.2 General functioning and applications of TEM/STEM

CHAPTER 3
IMPACT AND LIMITATIONS OF IN-SITU TECHNIQUES

3.1 Potential Benefits of Performing an In situ TEM experiment
3.2 Potential Limitations and Cautions of Performing an In situ TEM experiment

CHAPTER 4
GENERAL MICROSCOPE SELECTION AND STAGE DESIGN PHILOSOPHY

4.1 Microscope Selection
4.2 Stage Design Philosophy
4.3 Image Recording Techniques

CHAPTER 5
IN SITU DEFORMATION

5.1 Qualitative Loading
5.2 Quantitative Loading

CHAPTER 6
IN SITU HEATING

6.1 Classical Conductive Heating
6.2 MEMS Conductive Heating
6.3 Convective Heating
6.4 Radiative Heating

CHAPTER 7
IN SITU COOLING

7.1 Peltier Cooling
7.2 Cryogenic Cooling

CHAPTER 8
IN SITU CHARGED PARTICLE RADIATION

8.1 Electron Irradiation
8.2 Ion Irradiation

CHAPTER 9
IN-SITU GAS-SOLID REACTIONS

9.1 Environmental Stages
9.2 Environmental Microscopes

CHAPTER 10
IN SITU LIQUID-SOLID INTERACTIONS

10.1 Ionic Liquids and Closed Liquid Cell
10.2 Microfluidic Design

Chapter 11
IN SITU EM FIELD EFFECTS

11.1 Electrical Biasing
11.2 Dynamic Lorentz Imaging

Chapter 12
DYNAMIC AND ULTRA-FAST TEM

12.1 Dynamic TEM
12.2 Ultra-fast TEM

CHAPTER 13
COUPLING OF IN SITU TEM TECHNIQUES

13.1 Coupling within the listed approaches
13.2 Coupling to other Structure and Property

CHAPTER 14
DATA HANDLING AND PROCESSING

14.1 Data Collection
14.2 Data Processing
14.3 Data Storage

CHAPTER 15
FUTURE DIRECTION OF IN SITU TEM TECHNIQUES

15.1 Future direction in Hardware
15.2 Future Direction in Software

CHAPTER 16
Summary

Appendix A: Glossary
Appendix B: List of Suppliers
Acknowledgements
References