Interferometry XIV: Applications

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Measurement of Dynamic Processes
Twymann Green interferometry in study of AlN material as an actuation layer in MEMS
Phase-shift Fizeau interferometer in presence of vibration
Interferometric characterization of pyroelectrically activated micro-arrays of liquid lenses in lithium niobate crystals
Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy
Precision Measurements for Industry
Application of interferometry for evaluation of the effect of contact lens material on tear film quality
Recurrence quantification analysis applied to sequential speckle images of machined surface for detection of chatter in turning
Permutation entropy based speckle analysis in metal cutting
Integrated quantum efficiency, reflectance, topography and stress metrology for solar cell manufacturing
Applications of a white light interferometer for wear measurement of cylinders
High Accuracy Optical Element Measurements
Measuring the phase transfer function of a phase-shifting interferometer
The manufacturing and testing of an unrotational-symmetric SiC mirror
Fabrication and testing of a high-precision concave spherical mirror
Phase error correction in wavefront curvature sensing via phase retrieval
SIM Planet Quest Lite Interferometer Guide 2 Telescope pointing control system
Measurement Through Transmissive Media
Tomographic studies of 3D refractive index and birefringence distribution in M-O elements replicated by hot embossing technology
Transparent film profiling and analysis by interference microscopy
Micro- And Nano-Metrology
Automatic three-dimensional localization of micro-particles using digital holographic microscopy
Uncertainty consideration of the mirror-interferometer system in nanopositioning and nanomeasuring machines
Scene-based wavefront correction with spatial light modulators
Multi-wavelength interferometer for high accuracy measurement of long gauge blocks
Interferometric method for in-situ monitoring of fiber insertion in 2D fiber connectors fabricated through Deep Proton Writing
Poster Session
Accurately measuring a surface by using a computer-generated hologram
Toward automated forensic fracture matching of snap-off blade knives
A sensing system for monitoring the thickness of thin films by spectrum analysis of white-light interference
Far-infrared Fizeau interferometer for large aspheric mirror
A simple method for measuring the small displacements
Interferometric analysis of the ablation profile in refractive surgery
Interference: dark rays description
Author Index
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