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9783540745587

Into the Nano Era

by
  • ISBN13:

    9783540745587

  • ISBN10:

    3540745580

  • Format: Hardcover
  • Copyright: 2008-12-30
  • Publisher: Springer Verlag
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List Price: $249.99

Summary

"As we enter the nanotechnology era, we are also encountering the 50th anniversary of the invention of the IC. Will silicon continue to be the pre-eminent material and will Moore's Law continue unabated, albeit in a broader economic venue, in the nanotechnology era? This monograph addresses these issues through a re-examination of the scientific and technological foundations of the microelectronics era. It is proposed that, by better assessing and understanding the past five decades of this era, a firmer foundation can yet be laid for the research that will ensue and possibly provide a glimpse of opportunities in the nanotechnology era. For example, we are already seeing some potential applications in the bonding of molecular devices onto a previously formed IC chip providing vehicles for the continued growth of the Information Age and further extending opportunities for today's microelectronics porducts. There will, furthermore, no doubt be scientific advances generating opportunities and applications defining new technology initiatives in the nanotechnology era, barely perceived at present. This book will help prepare us to meet these challenges with the requisite skills to facilitate the identification and development of these future initiatives."--BOOK JACKET.

Table of Contents

Foreword: Silicon and Electronicsp. vii
Foreword: Silicon and the III-V's: Semiconductor Electronics (Electron, Hole, and Photon) Foreverp. ix
Prefacep. xiii
List of Contributorsp. xxvii
Historical Background
Silicon: Child and Progenitor of Revolutionp. 3
Referencesp. 9
The Economic Implications of Moore's Lawp. 11
Introductionp. 11
Moore's Law: A Descriptionp. 12
The History of Moore's Lawp. 12
The Microeconomics of Moore's Lawp. 23
The Macroeconomics of Moore's Lawp. 30
Moore's Law Meets Moore's Wall: What Is Likely to Happenp. 32
Conclusionp. 35
Appendix Ap. 36
Referencesp. 38
State-of-the-Art
Using Silicon to Understand Siliconp. 41
Introductionp. 41
The Electronic Structure Problemp. 42
The Empirical Pseudopotential Methodp. 42
Ab Initio Pseudopotentials and the Electronic Structure Problemp. 47
New Algorithms for the Nanoscale: Silicon Leads the Wayp. 50
Optical Properties of Silicon Quantum Dotsp. 52
Doping Silicon Nanocrystalsp. 55
The Futurep. 58
Referencesp. 58
Theory of Defects in Si: Past, Present, and Challengesp. 61
Introductionp. 61
From Empirical to First-Principlesp. 63
First-Principles Theoryp. 66
First-Principles Theory at Non-zero Temperaturesp. 70
Discussionp. 73
Referencesp. 74
Structural, Elemental, and Chemical Complex Defects in Silicon and Their Impact on Silicon Devicesp. 79
Introductionp. 79
Defect Interactions in Single-Crystalline Siliconp. 80
Precipitation Behavior, Chemical State, and Interaction of Copper with Extended Defects in Single-Crystalline and Multicrystalline Siliconp. 84
Precipitation Behavior, Chemical State, and Interaction of Iron with Extended Defects in Siliconp. 91
Pathways for Metal Contamination in Solar Cellsp. 96
Effect of Thermal Treatments on Metal Distributions and on Device Performancep. 99
Discussion: Chemical States of Metals in mc-Sip. 101
Discussion: Interactions between Metals and Structural Defectsp. 104
Discussion: Engineering of Metal-Related Nanodefects by Altering the Distributions and Chemical States of Metals in mc-Sip. 106
Summary and Conclusionsp. 108
Referencesp. 109
Surface and Interface Chemistry for Gate Stacks on Siliconp. 113
Introduction: The Silicon/Silicon Oxide Interface at the Heart of Electronicsp. 113
Current Practices and Understanding of Silicon Cleaningp. 115
Introductionp. 115
Silicon Cleans Leading to Oxidized Silicon Surfacesp. 116
Si Cleans Leading to Hydrogen-Terminated Silicon Surfacesp. 124
Microscopic Origin of Silicon Oxidationp. 136
Initial Oxidation of Hydrogen-Terminated Siliconp. 137
High-Permittivity ("High-k") Gate Stacksp. 147
Introductionp. 147
Silicon Surface Preparation and High-k Growth: The Impact of Thin Oxide Films on Nucleation and Performancep. 148
Post-Treatment of the High-k Layer: Nitridationp. 156
The pFET Threshold Voltage Issue: Oxygen Vacanciesp. 157
Threshold Voltage Control: Oxygen and Metal Ionsp. 158
Conclusionp. 161
Referencesp. 161
Enhanced Carrier Mobility for Improved CMOS Performancep. 169
Introductionp. 169
Enhanced Carrier Mobility in Si under Biaxial Tensile Strainp. 169
Devicesp. 170
Strain-Relaxed SiGe Buffer Layersp. 171
SGOI and SSOI Substratesp. 175
Defect-Free (Elastic) Strain Relaxationp. 178
Enhanced Hole Mobility via Biaxial Compressive Strainp. 181
Other Methods to Increase Carrier Mobility for Si CMOS Applicationsp. 183
Hybrid Crystal Orientationp. 183
Uniaxial Strainp. 184
Summaryp. 185
Referencesp. 186
Transistor Scaling to the Limitp. 191
Introductionp. 191
Planar Bulk MOSFET Scalingp. 193
Thin-Body Transistor Structuresp. 196
Ultra-Thin Body (UTB) MOSFETp. 197
Double-Gate (DG) MOSFETp. 199
Tri-Gate (TG) MOSFETp. 205
Back-Gated (BG) MOSFETp. 205
Fundamental Scaling Limit and Ultimate MOSFET Structurep. 207
Advanced Gate-Stack Materialsp. 209
High-k Gate Dielectricsp. 209
Metallic Gate Electrode Materialsp. 210
Performance Enhancement Approachesp. 213
Enhancement of Carrier Mobilitiesp. 213
Reduction of Parasitic Componentsp. 215
Alternative Switching Devicesp. 216
Summaryp. 216
Referencesp. 217
Future Directions
Beyond CMOS Electronics: Self-Assembled Nanostructuresp. 227
Introductionp. 227
Conventional "Top-Down" Fabricationp. 227
"Bottom-Up" Fabricationp. 228
Strain-Induced Nanostructuresp. 229
Metal-Catalyzed Nanowiresp. 235
Catalyst Nanoparticlesp. 235
Nanowire Growthp. 238
Germanium and Compound-Semiconductor Nanowiresp. 241
Doping Nanowiresp. 243
Connecting Nanowiresp. 244
Comparison of Semiconducting Nanowires and Carbon Nanotubesp. 250
Potential Applications of Metal-Catalyzed Nanowiresp. 251
Field-Effect Transistorsp. 251
Field-Effect Sensorsp. 252
Interconnectionsp. 252
Summaryp. 253
Referencesp. 254
Hybrid CMOS/Molecular Integrated Circuitsp. 257
Introductionp. 257
Top-Down Fabrication vs. Bottom-Up Assemblyp. 257
Typical Molecular Device Characteristicsp. 258
MolMOS: Integrating CMOS and Nanoelectronicsp. 259
The CMOS/Nano Interfacep. 260
CMOS/Nano Co-designp. 262
The Crossbar Array for Molecular Electronicsp. 264
Molecular Memory Structuresp. 265
Programmable Logic via the Crossbar Arrayp. 267
Signal Restoration at the Nanoscale: The Goto Pairp. 268
Hysteresis and NDR based Devices in Programmable Logicp. 270
MolMOS Architecturep. 272
The CMOS Interface & I/O Considerationsp. 272
Augmenting the PMLA with CMOSp. 272
Array Access for Programmabilityp. 273
A More Complete Picture of the Overall Architecturep. 274
Circuit Simulation of MolMOS Systemp. 276
Device Modeling for Circuit Simulationp. 276
Functional Verification of a Stand-Alone Nanoscale PMLAp. 276
Conclusions and Future Directionsp. 278
Referencesp. 279
Sublithographic Architecture: Shifting the Responsibility for Perfectionp. 281
Revising the Modelp. 281
Bottom-Up Feature Definitionp. 282
Regular Architecturesp. 283
Statistical Effects Above the Device Levelp. 283
Defect and Variation Tolerancep. 283
Differentiationp. 284
NanoPLA Architecturep. 285
Defect Tolerancep. 288
Wire Sparingp. 288
Crosspoint Defectsp. 290
Variationsp. 291
Roundupp. 291
Testing and Configurationp. 292
New Abstraction Hierarchyp. 293
Lessons from Data Storagep. 293
Abstraction Hierarchy for Computationp. 293
Conclusionsp. 295
Referencesp. 295
Quantum Computingp. 297
What Is Quantum Computing?p. 297
Historyp. 298
Fundamentalsp. 299
Quantum Algorithmsp. 301
Realizing a Quantum Computerp. 303
Physical Implementationsp. 306
Josephson Junction Circuitsp. 306
Semiconductor Quantum Dotsp. 308
Ion Trapsp. 311
Outlookp. 312
Referencesp. 312
Afterwords
Nano-Whatever: Do We Really Know Where We Are Heading? Phys. Stat. Sol. (a) 202(6), 957-964 (2005)p. 317
Introduction: "Nano-Talk = Giga-Hype?"p. 317
From Physics and Technology to New Applicationsp. 317
Kroemer's Lemma of New Technologyp. 317
Three Examplesp. 318
Lessonsp. 319
Roots of Nano-Technologyp. 320
Back to the Future: Beyond a Single Degree of Quantizationp. 320
Quantum Wiresp. 320
Quantum Dotsp. 321
More Challengesp. 322
Lithography Alternatives for the Nanoscalep. 322
"Loose" Nanoparticlesp. 322
"Other" Quantization Effectsp. 323
Charge Quantization and Coulomb Blockadep. 323
Magnetic Flux Quantizationp. 323
Spintronicsp. 324
Meta-Materialsp. 324
Research vs. Applications Re-visitedp. 325
Conclusionp. 326
Referencesp. 326
Silicon Forever! Really? Solid-State Electr. 50(4), 516-519 (2006)p. 327
Motivationp. 327
The End of Scalingp. 327
The "Beginning" of Architecturep. 328
Silicon Stands Tallp. 329
The Silicon Wartp. 330
Beyond Lithographyp. 331
Conclusionp. 332
Acknowledgements and Disclaimerp. 333
Citationsp. 333
Indexp. 335
Table of Contents provided by Ingram. All Rights Reserved.

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