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9780195071504

Introduction to Scanning Tunneling Microscopy

by
  • ISBN13:

    9780195071504

  • ISBN10:

    0195071506

  • Format: Hardcover
  • Copyright: 1993-05-20
  • Publisher: Oxford University Press

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Summary

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Table of Contents

Overview
Imaging Mechanism
Atom-Scale Tunneling
Tunneling Matrix Elements
Wavefunctions at Surfaces
Imaging Crystalline Surfaces
Imaging Atomic States
Atomic Forces and Tunneling
Tip-Sample Interactions
Instrumentation
Piezoelectric Scanner
Vibration Isolation
Electronics and Control
Coarse Positioner and SM Design
Tip Treatment
Scanning Tunneling Spectroscopy
Atomic Force Microscopy
Illustrative Examples
Table of Contents provided by Publisher. All Rights Reserved.

Supplemental Materials

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