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9780198856559

Introduction to Scanning Tunneling Microscopy Third Edition

by
  • ISBN13:

    9780198856559

  • ISBN10:

    0198856555

  • Edition: 3rd
  • Format: Hardcover
  • Copyright: 2021-05-30
  • Publisher: Oxford University Press

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Author Biography


Julian Chen, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University

C. Julian Chen received a PhD in Physics from Columbia University in 1985, and then joined the Department of Physical Sciences of IBM Watson Research Centre. In 1993, he published Introduction to Scanning Tunnelling Microscopy, and received a National Outstanding Book Award from China in 1997. From 1993 to 2003 he joined the Department of Human Language Technology of IBM Research. In 1998 he received an Outstanding Innovation Award from IBM for inventing practical recognition technology for Chinese speech. From 2004 to 2006 he was a Guest Scientist at Hamburg University. In 2007 he joined the Department of Applied Physics and Applied Mathematics at Columbia University.

Table of Contents


1. Overview
Part 1: Principles
2. Tunneling Phenomenon
3. Tunneling Matrix Elements
4. Atomic Forces
5. Atomic Forces and Tunneling
6. Nanometer-Scale Imaging
7. Atomic-Scale Imaging
8. Imaging Wavefunctions
9. Nanomechanical Eects
Part 2: Instrumentation
10. Piezoelectric Scanner
11. Vibration Isolation
12. Electronics and Control
13. Mechanical design
14. Tip Treatment
Part 3: Related Methods
15. Scanning Tunneling Spectroscopy
16. Atomic Force Microscopy
Appendix
Appendix A: Green's Functions
Appendix B: Real Spherical Harmonics
Appendix C: Spherical Modied Bessel Functions
Appendix D: Plane Groups and Invariant Functions
Appendix E: Elementary Elasticity Theory

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