Introduction to Spectroscopic Ellipsometry of Thin Film Materials Instrumentation, Data Analysis, and Applications

by Wee, Andrew T. S.; Yin, Xinmao; Tang, Chi Sin

• ISBN13: 9783527349517
• ISBN10: 3527349510
• eBook ISBN(s): 9783527833955
• Edition: 1st
• Format: Paperback
• Copyright: 2022-04-11
• Publisher: Wiley-VCH
• More Book Details
• Purchase Benefits

Summary

A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization

In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems.

The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:

• Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites
• Comprehensive explorations of two-dimensional transition metal dichalcogenides
• Practical discussions of single layer graphene systems and nickelate systems
• In-depth examinations of potential future developments and applications of spectroscopic ellipsometry

Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Author Biography

Andrew T. S. Wee is a class of 62 Professor of Physics, and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research interests are in surface and nanoscale science, scanning tunnelling microscopy (STM) and synchrotron radiation studies of the molecule-substrate interface, graphene and related 2D materials. He was a Commonwealth Fellow as well as a Rhodes Scholar at the University of Oxford, where he received his DPhil (1990). He holds a Bachelor of Arts (Honours) in Physics (1994) as well as a master degree from the University of Cambridge. He is an Associate Editor of the journal ACS Nano and serves or has served on several other journal editorial boards.

Dr. Yin Xinmao, Research Fellow in Physics department in National University of Singapore and Singapore Synchrotron Light Source (2014-present). He completed his degrees of the bachelor and PhD in Zhejiang University in 2010 and National University in 2015, respectively. His expertise is in the field of condensed matter physics and optical spectroscopy, with primary strength in studying the electronic and spin structures of materials using optical spectroscopic techniques at different energy range. He specializes in studying materials such as 2D transition metal dichalcogenides, High-Tc superconducting cuprates, and colossal magnetoresistance manganites and their interfaces. He is expert in the various optical analysis techniques (ellipsometry, reflectivity, absorption, etc.) and the synchrotron-based spectroscopy (XAS, XMCD, XRD, XPS, ARPES etc.). Using these spectroscopic techniques, the underlying physical mechanism of macroscopic and microscopic properties governing superconductivity, ferromagnetism, phase transition, as well as spin changes, plasma and exciton excitations have been studied.

Chi Sin Tang is a final-year PhD student at the NUS Graduate School of Integrative Sciences and Engineering, National University of Singapore. He holds a Bachelor of Science (Honours) in Physics (2012) as well as a post-graduate diploma in Education from Nanyang Technological University. An expert user of optical techniques such as Spectroscopic Ellipsometry and synchrotron-based spectroscopic measurements that include X-ray Absorption Spectroscopy and Photoemission Spectroscopy, his research interests mainly focus on the electronic and optical properties of low-dimensional materials such as two-dimensional transition metal dichalcogenides, unconventional oxide thin-films and the effects of interfacial interactions.

Table of Contents

1 SPECTROSCOPIC ELLIPSOMETRY: BASIC PRINCIPLES
1.1 Introduction
1.2 Polarization of Light
1.3 Features of Spectroscopic Ellipsometry
1.4 Experimental Set Up
1.5 Data Analysis

2 STRONGLY CORRELATED SYSTEMS: CUPRATES & MANGANITES
2.1 An Introduction
2.1.1 Crystal Structures
2.1.2 Arising Electronic Structures
2.1.3 Superconductivity
2.1.4 Colossal Magnetoresistance
2.2 Strong and Weak Correlations in Ambipolar cuprate thin-film systems
2.3 Charge localization in Cuprate thin film on oxide substrate
2.4 Jahn-Teller splitting energy control the phase transition in manganite thin-film systems
2.5 Plasmon and high-energy exciton excitations in cuprates thin-films

3 2D TRANSITION METAL DICHALCOGENIDES
3.1 An Introduction
3.1.1 Crystal Structures of 2D-TMDs
3.1.2 Arising Electronic Structures
3.2 Ellipsometry in Probing structural phase transition and electronic structures monolayer-MoS2
3.3 Three-Dimensional Resonant Exciton in monolayer-WSe2
3.4 Examining Interfacial Effects: High-energy excitons in Strontium Titanate and interfaces (manganite, MoS2)
3.5 Anisotropic plasmon excitations in quasi-metallic 2D-TMDs

4 GRAPHENE
4.1 An introduction
4.1.1 Crystal structure of graphene
4.1.2 Arising Electronic structures
4.2 Probing optical structures and many-body effects in Graphene
4.3 High-energy features and quasi-particle dynamics in Graphene

5 NICKELATE PEROVSKITE SYSTEMS
5.1 An Introduction
5.1.1 Electronic and Crystal Structures
5.1.2 Magnetic orders of Nickelate systems
5.2 Metal-Insulator Transition of Rare-earth Nickelates
5.3 Magnetic induction induced by Interfacial hybridization

6 OUTLOOK OF SPECTROSCOPIC ELLIPSOMETRY OF NOVEL MATERIALS
6.1 Future Development of Spectroscopic Ellipsometry
6.2 Development of Novel Materials and the Relevance of Spectroscopic Ellipsometry