Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

by Yang Leng (Hong Kong University of Science &; Technology )

• ISBN13: 9780470822999
• ISBN10: 0470822996
• Format: eBook
• Copyright: 2009-03-01
• Publisher: Wiley

Summary

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Table of Contents

Microstructure Examinations

Light microscopy

X-ray diffraction methods

Transmission electron microscopy

Scanning electron microscopy

Scanning probe microscopy

Chemical and Thermal Analysis

X-Ray Spectroscopy for Elemental Analysis

Electron Spectroscopy for Surface Analysis

Secondary Ion Mass Spectrometry for Surface Analysis

Vibrational Spectroscopy for Molecular Analysis

Thermal analysis

Table of Contents provided by Publisher. All Rights Reserved.