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9780750302357

The Measurement of Grain Boundary Geometry

by ;
  • ISBN13:

    9780750302357

  • ISBN10:

    0750302356

  • Format: Hardcover
  • Copyright: 1993-06-01
  • Publisher: CRC Press

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Summary

This book provides an overview and also a description of the latest developments in the theory of grain boundary geometry, experimental aspects of data collection and data processing. The book covers all aspects of electron optics techniques (SEM, TEM) to the study of grain boundaries in metals and alloys (and by extension to semiconductors, ceramics and minerals).

Table of Contents

Foreword
Glossary
Introductionp. 1
Significance of Grain Boundaries in Polycrystalsp. 1
Grain Boundary Structure and 'Special' Boundariesp. 2
Development of Techniques for Measurement and Analysis of Grain Boundary Geometryp. 5
Theoretical Aspects of Grain Boundary Geometry I: General Boundariesp. 8
Grain Boundary Degress of Freedomp. 9
Mathematical Characterisation of a Misorientationp. 17
Symmetry-Related Misorientationp. 24
Tilt and Twist Componentsp. 29
Theoretical Aspects of Grain Boundary Geometry II: Periodic Geometriesp. 33
The Coincidence Site Latticep. 33
Other Models of Grain Boundary Geometryp. 56
Multiple Junctions in Polycrystalsp. 59
Experimental Methodsp. 63
Kikuchi Electron Diffraction Patternsp. 65
Data Collection in the TEMp. 71
Electron Back-Scatter Diffraction in the SEMp. 79
Data Interpretation and Processingp. 90
General Procedure for Calculating a Misorientationp. 90
Diffraction Pattern Analysis to Obtain a Misorientationp. 95
Categorisation of Grain Boundary Geometryp. 104
Calculation of the Normal to the Grain Boundary Planep. 106
Data Representation and Displayp. 112
Stereogram-Based Space and 'Special' Grain Boundary Probabilitiesp. 114
Rodrigues-Frank Spacep. 123
Euler Spacep. 130
Misorientation Imaging/Mappingp. 137
Experimental Investigations to Measure Grain Boundary Geometryp. 142
Survey of Grain Boundary Geometry Investigationsp. 143
Comments on Table 7.1 and Outlook for the Futurep. 144
Appendixp. 155
Referencesp. 157
Indexp. 166
Table of Contents provided by Blackwell. All Rights Reserved.

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