Nanoscale Microwave Engineering Optical Control of Nanodevices

by Tripon-canseliet, Charlotte; Chazelas, Jean

• ISBN13: 9781848215870
• ISBN10: 1848215878
• Edition: 1st
• Format: Hardcover
• Copyright: 2014-03-31
• Publisher: Wiley-ISTE

Summary

This book targets new trends in microwave engineering by downscaling components and devices for industrial purposes such as miniaturization and function densification, in association with the new approach of activation by a confined optical remote control. It covers the fundamental groundwork of the structure, property, characterization methods and applications of 1D and 2D nanostructures, along with providing the necessary knowledge on atomic structure, how it relates to the material band-structure and how this in turn leads to the amazing properties of these structures. It thus provides new graduates, PhD students and post-doctorates with a resource equipping them with the knowledge to undertake their research.

Author Biography

Charlotte Tripon-Canseliet is Associate Professor at University Pierre and Marie Curie (UPMC), France. She has been involved in the research of microwave photonics for eight years, specifically in the design of ultrafast integrated devices. Her research interest focuses on state-of-the-art evolution of microwave photonics devices.

Jean Chazelas is Scientific Director at Thales DMS (Defence Mission Systems) Division, UK. He is involved in the creation of international joint research laboratories and in numerous European and international projects and contracts in the field of microwaves, photonics and nanotechnologies.

Table of Contents

Introduction

Chapter I - Nanotechnology based materials for ultrafast microwave applications

1.1. Carbon based Materials

1.2. Nanowire based technologies : Si, ZnO

1.3. Nanostructured materials

1.4. Metamaterials

1.5. Exotic semiconductors (quaternary)

Chapter II – EM Material characterization at nanoscale

2.1 State-of-the-Art of macroscopic material characterization techniques in microwave domain with dedicated equipment

- Transient  methods for carriers dynamics determination

- Frequency methods  for complex permittivity determination in frequency

- DC (I-V | C-V): resistivity – static permittivity

2.2 EM Environment constraints (T°, mechanical stability, multiscale access) and noise contributions in measurements

2.3 Evolution of techniques for mesoscopic nano material characterization

Chapter III - Nanotechnology based components and devices

3.1 Passive RF Components and devices

3.1.1 Simulation and modeling tools

3.1.2 State of the art

3.2 Active RF Components and devices

3.2.1 Simulation and modeling

3.2.2 State of the art

3.3 IR and Visible area -  Components and devices

3.3.1 Simulation and modeling

3.3.2 State of the art

3.4 Spintronic and spin transfer devices

3.4.1 Simulation and modeling

3.4.2 State of the art

Chapter IV - Nanotechnology based sub-systems

4.1 RF Switching and A/D conversion

4.2 RF amplification at nanoscale

4.3 RF oscillation at nanoscale

4.4 RF Antennas at nanoscale

Conclusions & Perspectives