Near-Field Microscopy and Near-Field Optics

by Courjon, Daniel

• ISBN13: 9781860942587
• ISBN10: 186094258X
• Format: Hardcover
• Copyright: 2003-04-01
• Publisher: World Scientific Pub Co Inc

Summary

Near-field optics studies the behaviour of light fields in the vicinity of matter, where light is structured in propagating and evanescent fields. Near-field optical microscopy is the straightforward application of near-field optics.This textbook provides an overview for undergraduates and anyone who has an interest in peculiar optical phenomena, and serves as a technical manual for engineers and researchers. It consists of 12 chapters dealing with the history of near-field optics, non-radiating optics, optical noise, inverse problems, theory, instrumentation and applications; there is an appendix including the basic elements of Fourier optics and Maxwell equations.

Table of Contents

Preface	p. ix
How to read this book	p. xi
History of Near-field Optics	p. 1
Notion of imaging system	p. 1
Bases of imaging	p. 4
Vision	p. 4
Image	p. 5
Far-field imaging systems	p. 6
Notion of superresolution	p. 7
Near-field imaging systems	p. 9
History of near-field microscopy	p. 12
Synge's speculation	p. 12
J. O'Keefe's letter	p. 12
E. Ash and G. Nicholls realization	p. 13
Superresolution in imaging systems	p. 13
Scanning tunnelling microscopy	p. 14
Early optical near-field microscopes	p. 14
Non-radiating Sources & Non-propagating Fields	p. 17
Introduction	p. 17
A few words of terminology	p. 18
Various non-radiating sources	p. 18
Non-radiating classical distributions	p. 18
Non-radiating sources by destructive interference	p. 21
Extension of the notion of non-radiating source	p. 23
Evanescent fields	p. 24
Evanescent field generated by total internal reflection	p. 24
Destructive-interference device	p. 25
Resonant evanescent fields	p. 26
Resonant spherical devices	p. 29
Evanescent Optics	p. 31
Theory of Fresnel evanescent waves	p. 32
Reflection and refraction laws	p. 32
Total internal reflection	p. 34
Energy flow and Poynting vector	p. 37
Goos-Hanchen and transversal shifts	p. 38
Evanescent fields generated by sub-wavelength diffraction	p. 42
Light beam propagation	p. 43
A particular case of evanescent waves: the plasmons	p. 48
Definition of a plasmon	p. 48
Theory	p. 49
Scanning plasmon optical microscopy	p. 51
Theories and Modellings	p. 57
Early works	p. 57
Recent works	p. 58
Different ways of approaching the theory of near-field optics	p. 59
Physical approach	p. 59
Model space	p. 60
Global or non-global approach	p. 60
Tip description	p. 61
Description in a non-global scheme	p. 61
Description in a global scheme	p. 68
Light-sample interaction	p. 69
Rigorous grating theory	p. 69
The reciprocal-space perturbative method (RSPM)	p. 73
Direct-space-global approaches	p. 77
Inverse Problem and Apparatus Function	p. 93
Introduction	p. 93
Inverse problem solution in band-limited far-field imaging	p. 97
Inverse propagator and reciprocity theorem	p. 98
Reciprocity theorem	p. 98
Inverse problem solution in near-field imaging	p. 100
Apparatus functions	p. 100
Impulse response	p. 101
Transfer function	p. 101
Criteria of Quality, Noise and Artifacts	p. 103
Degrees of freedom of an optical system	p. 103
Generalization of Lukosz's approach	p. 104
Far-field case	p. 105
Near-field case	p. 106
Information capacity for noisy coherent signals	p. 107
Noise in optical systems	p. 107
Optical noises	p. 108
External noises	p. 111
Artifacts	p. 112
Scanning modes in near-field microscopy	p. 112
Notion of artifact	p. 112
Comparison between the three scanning mode behaviours	p. 115
Input parameters of the simulation	p. 115
Constant distance mode	p. 117
Constant height mode	p. 118
Constant intensity mode	p. 119
Notion of resolution	p. 123
Detection	p. 123
Localization	p. 124
Resolution	p. 125
The two-point criterion	p. 126
Other estimates of resolution	p. 127
Optical transfer function OTF	p. 130
OTF in near-field optics	p. 131
Experimental OTF in near-field optics	p. 132
Contrast	p. 133
New criteria of quality	p. 136
Nano-collectors and Nano-emitters	p. 139
Precursors	p. 139
Near-field collection and emission	p. 140
Principle	p. 140
Distance of collection/emission	p. 141
Shape of nano-collectors/emitters	p. 141
Various technologies	p. 145
Bare tapers	p. 148
Shaping techniques	p. 148
Etching techniques	p. 148
Effect of parameters	p. 149
More sophisticated procedures	p. 150
High aperture angle conical tips	p. 151
Hot stretching techniques	p. 151
Advantages and drawbacks of the two techniques	p. 153
Tapered metal wire and silicon AFM tips	p. 154
Pyramidal tips	p. 155
Coated materials	p. 157
Flat nano-apertures	p. 158
Tapered nano-apertures	p. 162
Tapered/cleaved fibres	p. 164
Efficiency of tapered metal coated fibres	p. 166
Laser damages	p. 166
Realization of the aperture by other techniques	p. 167
Nano-antenna used as a near-field perturbing system	p. 170
Variant of tapered fibres	p. 171
Chemical sensors used as fluorescent tips	p. 171
Instrumentation	p. 175
Basic structure of near-field optical microscopes	p. 175
Mechanical part	p. 176
Translation stage	p. 176
Practical case	p. 179
Techniques for machining the piezo-electric tube	p. 179
Compensation of the thermal drift	p. 181
Connection of the wires on the electrodes	p. 182
Holding of the nano-collector/emitter	p. 182
Fibre as a nano-collector/emitter	p. 182
Other collector/emitters	p. 184
Anti-vibration devices	p. 184
Distance control	p. 185
Optical part	p. 192
Source	p. 192
Detector	p. 194
Usual optical and opto-electronic components	p. 195
Electronic stages	p. 195
Synchronous detection	p. 196
Distance control: the P.I.D. device	p. 196
Main Near-field Microscope Configurations	p. 201
Transmission microscopes	p. 202
Reflection microscopy	p. 204
Tunnelling microscopy	p. 206
Optical tunnelling microscopy	p. 208
Plasmon microscopy	p. 212
Hybrid techniques	p. 213
Near-field microscopy with shear-force control	p. 213
Contact near-field optical microscopy	p. 214
Near-field Image Processing	p. 215
Generalities	p. 215
Linear distortions	p. 215
Non-linear distortions	p. 216
Correction of distortions	p. 218
Correction of linear distortions	p. 218
Correction of non-linear distortions	p. 220
Correction of tip-sample sticking	p. 220
Filtering process	p. 220
Direct or local filtering	p. 220
Fourier or reciprocal filtering	p. 227
Karhunen-Loeve transform and information extraction	p. 229
Applications of Near-field Microscopy	p. 235
Introduction	p. 235
First attempts: topography measurements	p. 236
Local index variation measurement	p. 236
Light trapping	p. 242
Concept of nano-optics	p. 243
A simple case: the frustrated reflection by a sphere or a tip	p. 244
A second example: the resonant tunnelling effect	p. 244
A more sophisticated example: a sub-wavelength periodic structure	p. 245
Photonic transfer through segmented optical waveguides	p. 246
Basis of Optics	p. 249
Unit Systems	p. 249
Basic functions and operators in optics	p. 250
Reminder on vectorial calculus	p. 250
Relations connecting gradient, divergence and rotational	p. 252
Dyadic analysis	p. 252
Maxwell's equations	p. 253
Material equations	p. 254
Maxwell's equation in the dyadic scheme	p. 254
Wave equation	p. 255
There is no charges or currents ([characters not reproducible] = 0 and j = 0)	p. 255
The medium is homogeneous, ([mu] and [epsilon] space-independent)	p. 255
The medium is homogeneous and there is no charges or currents	p. 256
Case of harmonic fields	p. 256
Scalar and vector potentials	p. 256
Static regimes	p. 257
Poisson's and Laplace's equations	p. 257
Field generated by a single charge	p. 257
Flux of an electric field through a surface element	p. 258
Gauss' theorem	p. 258
Green's functions and Green's theorem	p. 260
Green's functions in classical potential theory	p. 260
Time dependent fields: the Helmholtz equation	p. 261
Green's theorem	p. 261
Green's dyadic	p. 262
Expansion of a field in term of a set of plane waves	p. 262
Basis	p. 263
Angular spectrum expansion (A.S.E.)	p. 263
Propagation of light using A.S.E.	p. 265
Analysis of the results	p. 266
Nomenclature	p. 269
List of Acronyms	p. 271
Glossary	p. 275
Index	p. 279
Author Index	p. 289
Bibliography	p. 297
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